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Title: Method for determining a histogram of variable sample rate waveforms

Abstract

A computer-implemented method comprises receiving a plurality of sampled data points, each data point including a y value and a t value; defining a plurality of bins; defining an array of elements; dividing the sampled data points into a plurality of sections; assigning a plurality of polynomial equations, one polynomial equation to each section, each polynomial equation having a waveform that fits the data points of the associated section; determining a plurality of section bin times, one section bin time for each bin in each section, each section bin time determined using the polynomial equation and indicating an amount of time that the waveform has values in the range of one of the bins; and adding the section bin time for each bin in each section to the histogram data in the array element pointed to by the number of the bin.

Inventors:
;
Issue Date:
Research Org.:
Kansas City Plant (KCP), Kansas City, MO (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1986949
Patent Number(s):
11532150
Application Number:
17/410,030
Assignee:
Honeywell Federal Manufacturing & Technologies, LLC (Kansas City, MO)
DOE Contract Number:  
NA0002839
Resource Type:
Patent
Resource Relation:
Patent File Date: 08/24/2021
Country of Publication:
United States
Language:
English

Citation Formats

Tohlen, Michael Aaron, and Morrow, Mitchell Hedges. Method for determining a histogram of variable sample rate waveforms. United States: N. p., 2022. Web.
Tohlen, Michael Aaron, & Morrow, Mitchell Hedges. Method for determining a histogram of variable sample rate waveforms. United States.
Tohlen, Michael Aaron, and Morrow, Mitchell Hedges. Tue . "Method for determining a histogram of variable sample rate waveforms". United States. https://www.osti.gov/servlets/purl/1986949.
@article{osti_1986949,
title = {Method for determining a histogram of variable sample rate waveforms},
author = {Tohlen, Michael Aaron and Morrow, Mitchell Hedges},
abstractNote = {A computer-implemented method comprises receiving a plurality of sampled data points, each data point including a y value and a t value; defining a plurality of bins; defining an array of elements; dividing the sampled data points into a plurality of sections; assigning a plurality of polynomial equations, one polynomial equation to each section, each polynomial equation having a waveform that fits the data points of the associated section; determining a plurality of section bin times, one section bin time for each bin in each section, each section bin time determined using the polynomial equation and indicating an amount of time that the waveform has values in the range of one of the bins; and adding the section bin time for each bin in each section to the histogram data in the array element pointed to by the number of the bin.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2022},
month = {12}
}