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Title: In situ data acquisition and real-time analysis system

Abstract

A testing system for evaluating the performance of an electrical/electronic UUT under dynamic operating conditions. The testing system includes a dynamic testing component (e.g., a centrifuge) for applying a stimulus to the UUT, and an iDAQ system configured to perform in situ data acquisition and real-time data analysis. The iDAQ system may also be subject to the stimulus. The iDAQ system includes a processor (e.g., an SoC) component, a power supply, a CR/I component, an IR component, and a single enclosure. The processor component may control the dynamic testing component, including varying in real-time the stimulus applied to the UUT. The processor component may include multiple input channels, and a high current/voltage subcomponent of the power supply may be configured to supply up to five hundred volts.

Inventors:
;
Issue Date:
Research Org.:
Kansas City Plant (KCP), Kansas City, MO (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1925064
Patent Number(s):
11435269
Application Number:
16/238,702
Assignee:
Honeywell Federal Manufacturing & Technologies, LLC (Kansas City, MO)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES
DOE Contract Number:  
NA0002839
Resource Type:
Patent
Resource Relation:
Patent File Date: 01/03/2019
Country of Publication:
United States
Language:
English

Citation Formats

Benyhesan, Mohammad K., and Spengemann, II, Richard W. In situ data acquisition and real-time analysis system. United States: N. p., 2022. Web.
Benyhesan, Mohammad K., & Spengemann, II, Richard W. In situ data acquisition and real-time analysis system. United States.
Benyhesan, Mohammad K., and Spengemann, II, Richard W. Tue . "In situ data acquisition and real-time analysis system". United States. https://www.osti.gov/servlets/purl/1925064.
@article{osti_1925064,
title = {In situ data acquisition and real-time analysis system},
author = {Benyhesan, Mohammad K. and Spengemann, II, Richard W.},
abstractNote = {A testing system for evaluating the performance of an electrical/electronic UUT under dynamic operating conditions. The testing system includes a dynamic testing component (e.g., a centrifuge) for applying a stimulus to the UUT, and an iDAQ system configured to perform in situ data acquisition and real-time data analysis. The iDAQ system may also be subject to the stimulus. The iDAQ system includes a processor (e.g., an SoC) component, a power supply, a CR/I component, an IR component, and a single enclosure. The processor component may control the dynamic testing component, including varying in real-time the stimulus applied to the UUT. The processor component may include multiple input channels, and a high current/voltage subcomponent of the power supply may be configured to supply up to five hundred volts.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2022},
month = {9}
}

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