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Title: Methods to deposit and etch controlled thin layers of transition metal dichalcogenides

Abstract

Transition metal dichalcogenides (TMDs) are deposited by atomic layer deposition as thin layers on a substrate. The TMDs may be grown on oxide substrates and may have a tunable TMD-oxide interface. The TMD may be etched using an atomic layer etching technique.

Inventors:
;
Issue Date:
Research Org.:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1924916
Patent Number(s):
11393681
Application Number:
16/294,797
Assignee:
UChicago Argonne, LLC (Chicago, IL)
Patent Classifications (CPCs):
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01L - SEMICONDUCTOR DEVICES
DOE Contract Number:  
AC02-06CH11357
Resource Type:
Patent
Resource Relation:
Patent File Date: 03/06/2019
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY

Citation Formats

Mane, Anil U., and Elam, Jeffrey W. Methods to deposit and etch controlled thin layers of transition metal dichalcogenides. United States: N. p., 2022. Web.
Mane, Anil U., & Elam, Jeffrey W. Methods to deposit and etch controlled thin layers of transition metal dichalcogenides. United States.
Mane, Anil U., and Elam, Jeffrey W. Tue . "Methods to deposit and etch controlled thin layers of transition metal dichalcogenides". United States. https://www.osti.gov/servlets/purl/1924916.
@article{osti_1924916,
title = {Methods to deposit and etch controlled thin layers of transition metal dichalcogenides},
author = {Mane, Anil U. and Elam, Jeffrey W.},
abstractNote = {Transition metal dichalcogenides (TMDs) are deposited by atomic layer deposition as thin layers on a substrate. The TMDs may be grown on oxide substrates and may have a tunable TMD-oxide interface. The TMD may be etched using an atomic layer etching technique.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2022},
month = {7}
}

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