Two-dimensional second harmonic dispersion interferometer
Abstract
An interferometer having a fundamental beam generator, a first second harmonic generator, a waveplate, a second second harmonic generator, a harmonic separator, and a polarizing beam splitter, mounted uniaxially, (i.e., the components are aligned along one optical axis), wherein the interferometer is adapted to change a diameter of a beam to match a diameter of a sample, and to change the diameter of the beam back to its original diameter.
- Inventors:
- Issue Date:
- Research Org.:
- US Dept. of Energy (USDOE), Washington, DC (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1892526
- Patent Number(s):
- 11221293
- Application Number:
- 17/204,815
- Assignee:
- Wessel, Frank Joseph, Irvine, CA (United States)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01B - MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- DOE Contract Number:
- SC0019789
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 03/17/2021
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Wessel, Frank Joseph, and Brandi, Fernando. Two-dimensional second harmonic dispersion interferometer. United States: N. p., 2022.
Web.
Wessel, Frank Joseph, & Brandi, Fernando. Two-dimensional second harmonic dispersion interferometer. United States.
Wessel, Frank Joseph, and Brandi, Fernando. Tue .
"Two-dimensional second harmonic dispersion interferometer". United States. https://www.osti.gov/servlets/purl/1892526.
@article{osti_1892526,
title = {Two-dimensional second harmonic dispersion interferometer},
author = {Wessel, Frank Joseph and Brandi, Fernando},
abstractNote = {An interferometer having a fundamental beam generator, a first second harmonic generator, a waveplate, a second second harmonic generator, a harmonic separator, and a polarizing beam splitter, mounted uniaxially, (i.e., the components are aligned along one optical axis), wherein the interferometer is adapted to change a diameter of a beam to match a diameter of a sample, and to change the diameter of the beam back to its original diameter.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2022},
month = {1}
}
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.
Works referenced in this record:
Nonlinear optics microscope interferometer
patent, January 1980
- Hirschberg, Joseph
- US Patent Document 4,184,737
Second-harmonic interferometers
journal, January 1980
- Hopf, F. A.; Tomita, A.; Al-Jumaily, G.
- Optics Letters, Vol. 5, Issue 9
A prototype imaging second harmonic interferometer
journal, January 1997
- Jobes, F. C.; Bretz, N. L.
- Review of Scientific Instruments, Vol. 68, Issue 1
Common path interferometer based on second harmonic generation
journal, May 1985
- Liepmann, Till W.; Hopf, Frederic A.
- Applied Optics, Vol. 24, Issue 10
Dispersion interferometer using orthogonally polarized waves
patent, June 1997
- Drachev, Vladimir P.; Babin, Sergey; Zerrouk, Abdelmounaime Faousi
- US Patent Document 5,642,195
Multilayer anti-reflective and ultraviolet blocking coating for sunglasses
patent, December 1997
- Sternbergh, James H.
- US Patent Document 5,694,240