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Title: Tuned oscillator atomic force microscopy methods and apparatus

Abstract

Techniques for operating an atomic force microscope, the atomic force microscope comprising a cantilever and configured to image a surface of a sample using a probe tip coupled to the cantilever, the techniques comprising using a controller to perform: obtaining, based on at least one intrinsic parameter of the cantilever, a first quality factor and a first free oscillation amplitude, wherein the cantilever exhibits only one stable oscillation state when oscillating at the first free oscillation amplitude and operating at the first quality factor; and controlling the cantilever to exhibit the only one stable oscillation state by controlling the cantilever to oscillate at a fixed frequency at or near a resonance frequency of the cantilever, oscillate at the first free oscillation amplitude, and operate at the first quality factor.

Inventors:
; ; ;
Issue Date:
Research Org.:
Yale Univ., New Haven, CT (United States)
Sponsoring Org.:
USDOE; National Science Foundation (NSF)
OSTI Identifier:
1860027
Patent Number(s):
11162977
Application Number:
15/538,615
Assignee:
Yale University (New Haven, CT)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01Q - SCANNING-PROBE TECHNIQUES OR APPARATUS
DOE Contract Number:  
DMR-1119826; FG02-06ER15834
Resource Type:
Patent
Resource Relation:
Patent File Date: 12/21/2015
Country of Publication:
United States
Language:
English

Citation Formats

Schwarz, Udo, Altman, Eric, Hölscher, Hendrik, and Dagdeviren, Omur Erdinc. Tuned oscillator atomic force microscopy methods and apparatus. United States: N. p., 2021. Web.
Schwarz, Udo, Altman, Eric, Hölscher, Hendrik, & Dagdeviren, Omur Erdinc. Tuned oscillator atomic force microscopy methods and apparatus. United States.
Schwarz, Udo, Altman, Eric, Hölscher, Hendrik, and Dagdeviren, Omur Erdinc. Tue . "Tuned oscillator atomic force microscopy methods and apparatus". United States. https://www.osti.gov/servlets/purl/1860027.
@article{osti_1860027,
title = {Tuned oscillator atomic force microscopy methods and apparatus},
author = {Schwarz, Udo and Altman, Eric and Hölscher, Hendrik and Dagdeviren, Omur Erdinc},
abstractNote = {Techniques for operating an atomic force microscope, the atomic force microscope comprising a cantilever and configured to image a surface of a sample using a probe tip coupled to the cantilever, the techniques comprising using a controller to perform: obtaining, based on at least one intrinsic parameter of the cantilever, a first quality factor and a first free oscillation amplitude, wherein the cantilever exhibits only one stable oscillation state when oscillating at the first free oscillation amplitude and operating at the first quality factor; and controlling the cantilever to exhibit the only one stable oscillation state by controlling the cantilever to oscillate at a fixed frequency at or near a resonance frequency of the cantilever, oscillate at the first free oscillation amplitude, and operate at the first quality factor.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2021},
month = {11}
}

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