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Title: Truncated nonlinear interferometer-based atomic force microscopes

Abstract

A truncated non-linear interferometer-based atomic force microscope (AFM) includes an input port and a non-linear amplifier that renders a probe beam and a conjugate beam. The AFM includes local oscillators having a relationship with the probe beam and the conjugate beam. The displacement of the AFM's cantilever is transduced by the probe beam, and/or the conjugate beam or their respective local oscillators. The AFM's phase-sensitive detectors detect a phase modulation between the respective local oscillators and the probe beam and the conjugate beam. The detected phase modulation corresponds to the change in phase. The AFM's circuitry measures phase signals that are indicative of the cantilever displacement. The resulting measurement signals exhibit a quantum noise reduction in either the intensity difference or phase sum quadrature.

Inventors:
; ;
Issue Date:
Research Org.:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1840445
Patent Number(s):
11119386
Application Number:
16/719,437
Assignee:
UT-Battelle, LLC (Oak Ridge, TN)
Patent Classifications (CPCs):
B - PERFORMING OPERATIONS B82 - NANOTECHNOLOGY B82Y - SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES
G - PHYSICS G01 - MEASURING G01B - MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS
DOE Contract Number:  
AC05-00OR22725
Resource Type:
Patent
Resource Relation:
Patent File Date: 12/18/2019
Country of Publication:
United States
Language:
English

Citation Formats

Pooser, Raphael C., Lawrie, Benjamin J., and Maksymovych, Petro. Truncated nonlinear interferometer-based atomic force microscopes. United States: N. p., 2021. Web.
Pooser, Raphael C., Lawrie, Benjamin J., & Maksymovych, Petro. Truncated nonlinear interferometer-based atomic force microscopes. United States.
Pooser, Raphael C., Lawrie, Benjamin J., and Maksymovych, Petro. Tue . "Truncated nonlinear interferometer-based atomic force microscopes". United States. https://www.osti.gov/servlets/purl/1840445.
@article{osti_1840445,
title = {Truncated nonlinear interferometer-based atomic force microscopes},
author = {Pooser, Raphael C. and Lawrie, Benjamin J. and Maksymovych, Petro},
abstractNote = {A truncated non-linear interferometer-based atomic force microscope (AFM) includes an input port and a non-linear amplifier that renders a probe beam and a conjugate beam. The AFM includes local oscillators having a relationship with the probe beam and the conjugate beam. The displacement of the AFM's cantilever is transduced by the probe beam, and/or the conjugate beam or their respective local oscillators. The AFM's phase-sensitive detectors detect a phase modulation between the respective local oscillators and the probe beam and the conjugate beam. The detected phase modulation corresponds to the change in phase. The AFM's circuitry measures phase signals that are indicative of the cantilever displacement. The resulting measurement signals exhibit a quantum noise reduction in either the intensity difference or phase sum quadrature.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2021},
month = {9}
}

Works referenced in this record:

Optical Displacement-Detecting Mechanism and Probe Microscope Using the Same
patent-application, February 2008