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Title: Integrated transmission electron microscope

Abstract

An integrated transmission electron microscope comprising multiple electron sources for tuned beams of ultrafast, scanning probe, and parallel illumination in varied beam energies can be alternated within sub-microseconds onto a sample with dynamic ‘transient state’ processes to acquire atomic-scale structural/chemical data with site specificity. The various electron sources and condenser optics enable high-resolution imaging, high-temporal resolution imaging, and chemical imaging, using fast-switching magnets to direct the different electron beams onto a single maneuverable objective pole piece where the sample resides. Such multimodal in situ characterization tools housed in a single microscope have the potential to revolutionize materials science.

Inventors:
;
Issue Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1840319
Patent Number(s):
11081314
Application Number:
17/035,267
Assignee:
National Technology & Engineering Solutions of Sandia, LLC (Albuquerque, NM)
Patent Classifications (CPCs):
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
DOE Contract Number:  
NA0003525
Resource Type:
Patent
Resource Relation:
Patent File Date: 09/28/2020
Country of Publication:
United States
Language:
English

Citation Formats

Jungjohann, Katherine L., and Hattar, Khalid Mikhiel. Integrated transmission electron microscope. United States: N. p., 2021. Web.
Jungjohann, Katherine L., & Hattar, Khalid Mikhiel. Integrated transmission electron microscope. United States.
Jungjohann, Katherine L., and Hattar, Khalid Mikhiel. Tue . "Integrated transmission electron microscope". United States. https://www.osti.gov/servlets/purl/1840319.
@article{osti_1840319,
title = {Integrated transmission electron microscope},
author = {Jungjohann, Katherine L. and Hattar, Khalid Mikhiel},
abstractNote = {An integrated transmission electron microscope comprising multiple electron sources for tuned beams of ultrafast, scanning probe, and parallel illumination in varied beam energies can be alternated within sub-microseconds onto a sample with dynamic ‘transient state’ processes to acquire atomic-scale structural/chemical data with site specificity. The various electron sources and condenser optics enable high-resolution imaging, high-temporal resolution imaging, and chemical imaging, using fast-switching magnets to direct the different electron beams onto a single maneuverable objective pole piece where the sample resides. Such multimodal in situ characterization tools housed in a single microscope have the potential to revolutionize materials science.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2021},
month = {8}
}

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