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Title: Circuit for providing variable waveform excitation

Abstract

A circuit for testing an electronic component, such as a transformer, includes at least two power supplies and at least two H bridge circuits. A first H bridge circuit is conductively coupled in parallel to a first power supply. A second H bridge circuit is conductively coupled in parallel to a second power supply. The second H bridge circuit includes one or more anti-series diodes for preventing current from the first power supply from passing through the second H bridge circuit to the second power supply. The first H bridge circuit and the second H bridge circuit are configured to conductively couple to the electronic component for providing a voltage with a predefined waveform to the electronic component.

Inventors:
; ;
Issue Date:
Research Org.:
North Carolina State University, Raleigh, NC (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1840265
Patent Number(s):
11063579
Application Number:
16/761,536
Assignee:
North Carolina State University (Raleigh, NC)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES
H - ELECTRICITY H02 - GENERATION H02J - CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER
DOE Contract Number:  
EE0007508
Resource Type:
Patent
Resource Relation:
Patent File Date: 11/08/2018
Country of Publication:
United States
Language:
English

Citation Formats

Beddingfield, Richard B., Bhattacharya, Subhashish, and Storelli, David. Circuit for providing variable waveform excitation. United States: N. p., 2021. Web.
Beddingfield, Richard B., Bhattacharya, Subhashish, & Storelli, David. Circuit for providing variable waveform excitation. United States.
Beddingfield, Richard B., Bhattacharya, Subhashish, and Storelli, David. Tue . "Circuit for providing variable waveform excitation". United States. https://www.osti.gov/servlets/purl/1840265.
@article{osti_1840265,
title = {Circuit for providing variable waveform excitation},
author = {Beddingfield, Richard B. and Bhattacharya, Subhashish and Storelli, David},
abstractNote = {A circuit for testing an electronic component, such as a transformer, includes at least two power supplies and at least two H bridge circuits. A first H bridge circuit is conductively coupled in parallel to a first power supply. A second H bridge circuit is conductively coupled in parallel to a second power supply. The second H bridge circuit includes one or more anti-series diodes for preventing current from the first power supply from passing through the second H bridge circuit to the second power supply. The first H bridge circuit and the second H bridge circuit are configured to conductively couple to the electronic component for providing a voltage with a predefined waveform to the electronic component.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2021},
month = {7}
}

Works referenced in this record:

H-Bridge pulse generator
patent-application, October 2010


H-Bridge circuit
patent-application, March 2010


Method and Circuit for Driving H-Bridge That Reduces Switching Noise
patent-application, November 2008


Method for controlling an H-bridge inverter
patent-application, May 2015