Multispectral impedance determination under dynamic load conditions
Abstract
Impedance testing devices, circuits, systems, and related methods are disclosed. A Device Under Test (DUT) is excited with a multispectral excitation signal for an excitation time period while the DUT is under a load condition from a load operably coupled to the DUT. A response of the DUT is sampled over a sample time period. The sample time period is configured such that it includes an in-band interval during the excitation time period and one or more out-of-band intervals outside of the in-band interval. A response of the DUT to the load condition during the in-band interval is estimated by analyzing samples of the response from the one or more out-of-band intervals. Adjusted samples are computed by subtracting the estimated load response during the in-band interval from the samples from the in-band interval. An impedance of the DUT is estimated by analyzing the adjusted samples.
- Inventors:
- Issue Date:
- Research Org.:
- Idaho National Laboratory (INL), Idaho Falls, ID (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1840234
- Patent Number(s):
- 11054481
- Application Number:
- 16/357,865
- Assignee:
- Battelle Energy Alliance, LLC (Idaho Falls, ID)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01M - PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- DOE Contract Number:
- AC07-05ID14517
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 03/19/2019
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Christophersen, Jon P., Morrison, John L., and Morrison, William H. Multispectral impedance determination under dynamic load conditions. United States: N. p., 2021.
Web.
Christophersen, Jon P., Morrison, John L., & Morrison, William H. Multispectral impedance determination under dynamic load conditions. United States.
Christophersen, Jon P., Morrison, John L., and Morrison, William H. Tue .
"Multispectral impedance determination under dynamic load conditions". United States. https://www.osti.gov/servlets/purl/1840234.
@article{osti_1840234,
title = {Multispectral impedance determination under dynamic load conditions},
author = {Christophersen, Jon P. and Morrison, John L. and Morrison, William H.},
abstractNote = {Impedance testing devices, circuits, systems, and related methods are disclosed. A Device Under Test (DUT) is excited with a multispectral excitation signal for an excitation time period while the DUT is under a load condition from a load operably coupled to the DUT. A response of the DUT is sampled over a sample time period. The sample time period is configured such that it includes an in-band interval during the excitation time period and one or more out-of-band intervals outside of the in-band interval. A response of the DUT to the load condition during the in-band interval is estimated by analyzing samples of the response from the one or more out-of-band intervals. Adjusted samples are computed by subtracting the estimated load response during the in-band interval from the samples from the in-band interval. An impedance of the DUT is estimated by analyzing the adjusted samples.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2021},
month = {7}
}
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