DOE Patents title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: On-chip spectroscopic sensors with optical fringe suppression

Abstract

An on-chip spectroscopic sensor includes a tunable diode laser. A laser driver for drives the tunable diode laser. An analyte test cavity receives a chemical sample and exposes the received chemical sample to light from the tunable diode laser. An optical detector detects light emerging from the analyte test cavity as a result of the laser exposure. A spectral analyzer determines a spectrum of the emerging light, matches and removes one or more known optical fringe patterns from the determined spectrum, and determines a composition or concentration of the chemical sample from the optical fringe pattern-removed spectrum.

Inventors:
; ; ;
Issue Date:
Research Org.:
International Business Machines Corp., Armonk, NY (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1824021
Patent Number(s):
11022542
Application Number:
16/504,100
Assignee:
International Business Machines Corporation (Armonk, NY)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01J - MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
DOE Contract Number:  
AR0000540
Resource Type:
Patent
Resource Relation:
Patent File Date: 07/05/2019
Country of Publication:
United States
Language:
English

Citation Formats

Green, William, Teng, Chu Cheyenne, Wysocki, Gerard, and Zhang, Eric Huayu. On-chip spectroscopic sensors with optical fringe suppression. United States: N. p., 2021. Web.
Green, William, Teng, Chu Cheyenne, Wysocki, Gerard, & Zhang, Eric Huayu. On-chip spectroscopic sensors with optical fringe suppression. United States.
Green, William, Teng, Chu Cheyenne, Wysocki, Gerard, and Zhang, Eric Huayu. Tue . "On-chip spectroscopic sensors with optical fringe suppression". United States. https://www.osti.gov/servlets/purl/1824021.
@article{osti_1824021,
title = {On-chip spectroscopic sensors with optical fringe suppression},
author = {Green, William and Teng, Chu Cheyenne and Wysocki, Gerard and Zhang, Eric Huayu},
abstractNote = {An on-chip spectroscopic sensor includes a tunable diode laser. A laser driver for drives the tunable diode laser. An analyte test cavity receives a chemical sample and exposes the received chemical sample to light from the tunable diode laser. An optical detector detects light emerging from the analyte test cavity as a result of the laser exposure. A spectral analyzer determines a spectrum of the emerging light, matches and removes one or more known optical fringe patterns from the determined spectrum, and determines a composition or concentration of the chemical sample from the optical fringe pattern-removed spectrum.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2021},
month = {6}
}

Works referenced in this record:

Method to reduce background noise in a spectrum
patent-application, September 2006


Method and Apparatus for Determining Properties of Fuels
patent-application, August 2010


On-chip spectroscopic sensors with optical fringe suppression
patent, March 2020


Monitoring, Detecting and Quantifying Chemical Compounds in a Sample
patent-application, March 2012


On-Chip Spectroscopic Sensors with Optical Fringe Suppression
patent-application, November 2018


Spectroscopic sensor device and electronic equipment
patent, March 2019


Apparatus and Methods for Estimating a Downhole Property
patent-application, June 2010


Methods for remote characterization of an odor
patent, April 2008