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Title: Method for real-time inspection of structural components

Abstract

A multi-mode approach for real-time inspection of structural components may be applied to rapid, wide area measurement of thickness of thick plate-like structures using full-field multi-mode response measurement and analysis. The approach may allow estimation of thickness from full-field multi-mode response to single-tone ultrasonic excitation in thick plates. The approach may utilize wavenumber information across all available wave modes in order to make wavenumber spectroscopy sensitive to changes in thickness for a broader range of nominal initial thicknesses.

Inventors:
; ;
Issue Date:
Research Org.:
Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1824020
Patent Number(s):
11022429
Application Number:
16/219,581
Assignee:
Triad National Security, LLC (Los Alamos, NM)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01B - MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS
DOE Contract Number:  
AC52-06NA25396
Resource Type:
Patent
Resource Relation:
Patent File Date: 12/13/2018
Country of Publication:
United States
Language:
English

Citation Formats

Stull, Nicholas D., Flynn, Eric Brian, and Mascarenas, Matthew David. Method for real-time inspection of structural components. United States: N. p., 2021. Web.
Stull, Nicholas D., Flynn, Eric Brian, & Mascarenas, Matthew David. Method for real-time inspection of structural components. United States.
Stull, Nicholas D., Flynn, Eric Brian, and Mascarenas, Matthew David. Tue . "Method for real-time inspection of structural components". United States. https://www.osti.gov/servlets/purl/1824020.
@article{osti_1824020,
title = {Method for real-time inspection of structural components},
author = {Stull, Nicholas D. and Flynn, Eric Brian and Mascarenas, Matthew David},
abstractNote = {A multi-mode approach for real-time inspection of structural components may be applied to rapid, wide area measurement of thickness of thick plate-like structures using full-field multi-mode response measurement and analysis. The approach may allow estimation of thickness from full-field multi-mode response to single-tone ultrasonic excitation in thick plates. The approach may utilize wavenumber information across all available wave modes in order to make wavenumber spectroscopy sensitive to changes in thickness for a broader range of nominal initial thicknesses.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2021},
month = {6}
}

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Portable Interferometric Device
patent-application, February 2015


Method and apparatus for measuring thickness of metal layer
patent-application, March 2006


Method and device for the non-invasive assessment of bones
patent-application, January 2005


Measuring Wall Thickness Loss for a Structure
patent-application, July 2014


System and method for control of paint thickness
patent-application, December 2002


Device and method for measuring thickness
patent-application, July 2006