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Title: Methods for aligning a spectrometer

Abstract

An example method for aligning a spectrometer is described herein. The spectrometer includes a radiation source, a crystal analyzer, and a detector that are all positioned on an instrument plane. The method includes rotating the crystal analyzer about an axis that is within the instrument plane and perpendicular to a rotation plane such that (i) a reciprocal lattice vector of the crystal analyzer is within the instrument plane or (ii) a component of the reciprocal lattice vector within the rotation plane is perpendicular to the instrument plane. An origin of the reciprocal lattice vector is located on the axis. The method further includes tilting the crystal analyzer or translating the detector such that the reciprocal lattice vector bisects a line segment that is bounded by the detector and the radiation source. Example spectrometers related to the example method are also disclosed.

Inventors:
;
Issue Date:
Research Org.:
Univ. of Washington, Seattle, WA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1805678
Patent Number(s):
10962490
Application Number:
16/066,500
Assignee:
University of Washington (Seattle, WA)
DOE Contract Number:  
SC0002194; SC0008580
Resource Type:
Patent
Resource Relation:
Patent File Date: 12/28/2016
Country of Publication:
United States
Language:
English

Citation Formats

Mortensen, Devon R., and Seidler, Gerald Todd. Methods for aligning a spectrometer. United States: N. p., 2021. Web.
Mortensen, Devon R., & Seidler, Gerald Todd. Methods for aligning a spectrometer. United States.
Mortensen, Devon R., and Seidler, Gerald Todd. Tue . "Methods for aligning a spectrometer". United States. https://www.osti.gov/servlets/purl/1805678.
@article{osti_1805678,
title = {Methods for aligning a spectrometer},
author = {Mortensen, Devon R. and Seidler, Gerald Todd},
abstractNote = {An example method for aligning a spectrometer is described herein. The spectrometer includes a radiation source, a crystal analyzer, and a detector that are all positioned on an instrument plane. The method includes rotating the crystal analyzer about an axis that is within the instrument plane and perpendicular to a rotation plane such that (i) a reciprocal lattice vector of the crystal analyzer is within the instrument plane or (ii) a component of the reciprocal lattice vector within the rotation plane is perpendicular to the instrument plane. An origin of the reciprocal lattice vector is located on the axis. The method further includes tilting the crystal analyzer or translating the detector such that the reciprocal lattice vector bisects a line segment that is bounded by the detector and the radiation source. Example spectrometers related to the example method are also disclosed.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2021},
month = {3}
}

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