Title: X-ray spectrometer

Abstract

An x-ray spectrometer includes: an x-ray plasma source that produces first x-rays; an x-ray optic in optical communication with the x-ray plasma source and that: receives the first x-rays from the x-ray plasma source; focuses the first x-rays to produce second x-rays; and communicates the second x-rays to a sample that produces product x-rays in response to receipt of the second x-rays and second light; and a microcalorimeter array detector in optical communication with the sample and that receives the product x-rays from the sample.

Inventors:

Ullom, Joel; O'Neil, Glen Daniel; Avila, Luis Miguel; Silverman, Kim Ernest Alexander; Swetz, Daniel; Jimenez, Ralph; Doriese, William Bertrand; Hilton, Gene; Reintsema, Carl; Schmidt, Daniel; Alpert, Bradley K.; Uhlig, Jens; Joe, Young; Fullagar, Wilfred K.; Sundstrom, Villy; Maasilta, Ilari; Fowler, Joseph A.

Issue Date:

2021-02-09

Research Org.:

National Institute of Standards and Technology (NIST), Gaithersburg, MD (United States)

Sponsoring Org.:

USDOE Office of Science (SC), Basic Energy Sciences (BES); US Dept. of Commerce

OSTI Identifier:

1805495

Patent Number(s):

10914694

Application Number:

15/865,992

Assignee:

Government of the United States of America, as represented by the Secretary of Commerce (Gaithersburg, MD)

Patent Classifications (CPCs):

G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

G - PHYSICS G01 - MEASURING G01T - MEASUREMENT OF NUCLEAR OR X-RADIATION

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G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

G01N2223/076 - X-ray fluorescence
G01N23/2076 - {for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS}
G01N23/2206 - Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement
G01N23/223 - by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

G - PHYSICS G01 - MEASURING G01T - MEASUREMENT OF NUCLEAR OR X-RADIATION

G01T1/36 - Measuring spectral distribution of X-rays or of nuclear radiation {spectrometry

H - ELECTRICITY H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR H05G - X-RAY TECHNIQUE

H05G2/003 - {being produced from a liquid or gas}
H05G2/008 - {involving a beam of energy, e.g. laser or electron beam in the process of exciting the plasma}

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DOE Contract Number:  

16480-A4001

Resource Type:

Patent

Resource Relation:

Patent File Date: 01/09/2018

Country of Publication:

United States

Language:

English