Angled slit design for computed tomographic imaging of electron beams
Abstract
Computed tomographic method and apparatus includes an electron or ion beam having a beam axis, a refractory metal disk; at least one slit in the refractory metal disk that receive the beam, wherein the slit is at an angle to the beam axis; a beam entrance opening in the slit that allows the beam to enter; an effective beam exit opening in the slit that allow the beam to exit, wherein the beam effective exit opening is smaller than the beam entrance opening; and a system for moving the beam across the refractory metal disk, wherein the beam enters the slit through the beam entrance opening and exits the slit through the effective beam exit opening; and a computed tomographic device for measuring the beam that enters and exits the slit for analyzing the beam.
- Inventors:
- Issue Date:
- Research Org.:
- Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1805371
- Patent Number(s):
- 10888284
- Application Number:
- 16/571,480
- Assignee:
- Lawrence Livermore National Security, LLC (Livermore, CA)
- Patent Classifications (CPCs):
-
A - HUMAN NECESSITIES A61 - MEDICAL OR VETERINARY SCIENCE A61B - DIAGNOSIS
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- DOE Contract Number:
- AC52-07NA27344
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 09/16/2019
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Elmer, John W., and Teruya, Alan T. Angled slit design for computed tomographic imaging of electron beams. United States: N. p., 2021.
Web.
Elmer, John W., & Teruya, Alan T. Angled slit design for computed tomographic imaging of electron beams. United States.
Elmer, John W., and Teruya, Alan T. Tue .
"Angled slit design for computed tomographic imaging of electron beams". United States. https://www.osti.gov/servlets/purl/1805371.
@article{osti_1805371,
title = {Angled slit design for computed tomographic imaging of electron beams},
author = {Elmer, John W. and Teruya, Alan T.},
abstractNote = {Computed tomographic method and apparatus includes an electron or ion beam having a beam axis, a refractory metal disk; at least one slit in the refractory metal disk that receive the beam, wherein the slit is at an angle to the beam axis; a beam entrance opening in the slit that allows the beam to enter; an effective beam exit opening in the slit that allow the beam to exit, wherein the beam effective exit opening is smaller than the beam entrance opening; and a system for moving the beam across the refractory metal disk, wherein the beam enters the slit through the beam entrance opening and exits the slit through the effective beam exit opening; and a computed tomographic device for measuring the beam that enters and exits the slit for analyzing the beam.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jan 12 00:00:00 EST 2021},
month = {Tue Jan 12 00:00:00 EST 2021}
}
Works referenced in this record:
Electron beam diagnostic system using computed tomography and an annular sensor
patent, July 2014
- Elmer, John W.; Teruya, Alan T.
- US Patent Document 8,791,426
Electron beam diagnostic system using computed tomography and an annular sensor
patent, August 2015
- Elmer, John W.; Teruya, Alan T.
- US Patent Document 9,105,448
Enhanced modified faraday cup for determination of power density distribution of electron beams
patent, October 2001
- Elmer, John W.; Teruya, Alan T.
- US Patent Document 6,300,755
Beam imaging sensor and method for using same
patent, January 2017
- McAninch, Michael D.; Root, Jeffrey J.
- US Patent Document 9,535,100