Title: System and method for in-process inspection within advanced manufacturing processes

Abstract

A system and method can include a laser Doppler vibrometer (LDV) in optical communication with a part during manufacturing and a transducer in ultrasonic communication with the part during manufacturing. The system can also include a controller connected to both the LDV and the transducer. The controller may be configured to cause the transducer to vibrate the part during manufacturing at a predetermined frequency and the LDV may be configured to measure one or more mechanical response types of the part during manufacturing based on one or more optical characteristics of a reflected beam. The controller may further be configured to determine whether a defect is present in the part during manufacturing in response to the one or more mechanical response types of the part.

Inventors:

Flynn, Eric; Koskelo, EliseAnne

Issue Date:

Tue Oct 06 00:00:00 EDT 2020

Research Org.:

Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)

Sponsoring Org.:

USDOE National Nuclear Security Administration (NNSA)

OSTI Identifier:

1771474

Patent Number(s):

10794836

Application Number:

15/854,384

Assignee:

Triad National Security, LLC (Los Alamos, NM)

Patent Classifications (CPCs):

G - PHYSICS G01 - MEASURING G01B - MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS

G - PHYSICS G01 - MEASURING G01H - MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES

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G - PHYSICS G01 - MEASURING G01B - MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS

G01B11/00 - Measuring arrangements characterised by the use of optical means
G01B9/02002 - {Frequency variation}
G01B9/02045 - {using the Doppler effect}

G - PHYSICS G01 - MEASURING G01H - MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES

G01H9/008 - {by using ultrasonic waves

G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

G01N1/286 - {involving mechanical work, e.g. chopping, disintegrating, compacting, homogenising
G01N2021/8967 - {Discriminating defects on opposite sides or at different depths of sheet or rod}
G01N21/17 - Systems in which incident light is modified in accordance with the properties of the material investigated
G01N21/8806 - {Specially adapted optical and illumination features}
G01N21/8851 - {Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
G01N2201/02 - Mechanical
G01N2201/06113 - Coherent sources

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DOE Contract Number:  

AC52-06NA25396

Resource Type:

Patent

Resource Relation:

Patent File Date: 12/26/2017

Country of Publication:

United States

Language:

English

Subject:

42 ENGINEERING