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Title: Apparatus, method and system for imaging and utilization of SEM charged particles

Abstract

A scanning electron microscope (SEM) system includes an SEM objective that emits an electron beam toward a sample, causing emission of charged particles including secondary electrons, Auger electrons, backscattered electrons, anions and cations. The SEM system includes electron optics elements that are configured to establish electric fields around the sample that accelerate charged particles toward a detector. A two-dimensional distribution of locations of incidence of the charged particles on the detector is indicative of energies of the charged particles and their emission angles from the sample. A three-dimensional spatial distribution of charged particles emitted from the sample is recovered by performing an Abel transform over the distribution on the detector. The energies and emission angles of the charged particles are then determined from the three-dimensional spatial distribution.

Inventors:
;
Issue Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1735243
Patent Number(s):
10770262
Application Number:
16/198,356
Assignee:
National Technology & Engineering Solutions of Sandia, LLC (Albuquerque, NM)
Patent Classifications (CPCs):
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
DOE Contract Number:  
NA0003525
Resource Type:
Patent
Resource Relation:
Patent File Date: 11/21/2018
Country of Publication:
United States
Language:
English

Citation Formats

Chandler, David W., and Celio, Kimberlee Chiyoko. Apparatus, method and system for imaging and utilization of SEM charged particles. United States: N. p., 2020. Web.
Chandler, David W., & Celio, Kimberlee Chiyoko. Apparatus, method and system for imaging and utilization of SEM charged particles. United States.
Chandler, David W., and Celio, Kimberlee Chiyoko. Tue . "Apparatus, method and system for imaging and utilization of SEM charged particles". United States. https://www.osti.gov/servlets/purl/1735243.
@article{osti_1735243,
title = {Apparatus, method and system for imaging and utilization of SEM charged particles},
author = {Chandler, David W. and Celio, Kimberlee Chiyoko},
abstractNote = {A scanning electron microscope (SEM) system includes an SEM objective that emits an electron beam toward a sample, causing emission of charged particles including secondary electrons, Auger electrons, backscattered electrons, anions and cations. The SEM system includes electron optics elements that are configured to establish electric fields around the sample that accelerate charged particles toward a detector. A two-dimensional distribution of locations of incidence of the charged particles on the detector is indicative of energies of the charged particles and their emission angles from the sample. A three-dimensional spatial distribution of charged particles emitted from the sample is recovered by performing an Abel transform over the distribution on the detector. The energies and emission angles of the charged particles are then determined from the three-dimensional spatial distribution.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2020},
month = {9}
}

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