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Title: Feed rate measuring method and system

Abstract

A system and method are provided for establishing the feed rate of a workpiece along a feed path with respect to a machine device. First and second sensors each having first and second sensing electrodes which are electrically isolated from the workpiece are positioned above, and in proximity to the desired surfaces of the workpiece along a feed path. An electric field is developed between the first and second sensing electrodes of each sensor and capacitance signals are developed which are indicative of the contour of the workpiece. First and second image signals representative of the contour of the workpiece along the feed path are developed by an image processor. The time delay between corresponding portions of the first and second image signals are then used to determine the feed rate based upon the separation of the first and second sensors and the amount of time between corresponding portions of the first and second image signals. 18 figs.

Inventors:
;
Issue Date:
Research Org.:
AT&T
OSTI Identifier:
170488
Patent Number(s):
5473257
Application Number:
PAN: 8-296,131
Assignee:
Sandia Corp., Albuquerque, NM (United States)
DOE Contract Number:  
AC04-76DP00789
Resource Type:
Patent
Resource Relation:
Other Information: PBD: 5 Dec 1995
Country of Publication:
United States
Language:
English
Subject:
32 ENERGY CONSERVATION, CONSUMPTION, AND UTILIZATION; MATERIALS HANDLING EQUIPMENT; DESIGN; INDUSTRIAL PLANTS; PROCESS CONTROL; MANUFACTURING; COMPUTER-AIDED MANUFACTURING

Citation Formats

Novak, J L, and Wiczer, J J. Feed rate measuring method and system. United States: N. p., 1995. Web.
Novak, J L, & Wiczer, J J. Feed rate measuring method and system. United States.
Novak, J L, and Wiczer, J J. Tue . "Feed rate measuring method and system". United States.
@article{osti_170488,
title = {Feed rate measuring method and system},
author = {Novak, J L and Wiczer, J J},
abstractNote = {A system and method are provided for establishing the feed rate of a workpiece along a feed path with respect to a machine device. First and second sensors each having first and second sensing electrodes which are electrically isolated from the workpiece are positioned above, and in proximity to the desired surfaces of the workpiece along a feed path. An electric field is developed between the first and second sensing electrodes of each sensor and capacitance signals are developed which are indicative of the contour of the workpiece. First and second image signals representative of the contour of the workpiece along the feed path are developed by an image processor. The time delay between corresponding portions of the first and second image signals are then used to determine the feed rate based upon the separation of the first and second sensors and the amount of time between corresponding portions of the first and second image signals. 18 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1995},
month = {12}
}

Patent:
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