Method of authenticating integrated circuits using optical characteristics of physically unclonable functions
Abstract
A method and apparatus for reading unique identifiers of an integrated circuit. The unique identifiers may be physically unclonable functions (PUFs), formed by high energy ions implanted into semiconductor material of the integrated circuit. The method may include electrically or optically stimulating each of the PUFs and sensing with an optical sensor optical characteristics of resulting light emitted from the PUFs. Then the method may include comparing values associated with the optical characteristics of the PUFs with groups of stored values in a circuit database. Each of the groups of stored values may be associated with optical characteristics of PUFs of a known authentic circuit. The method may then include the controller providing verification of authenticity of the integrated circuit when each of the values associated with the optical characteristics of the PUFs match the stored values of at least one of the groups in the circuit database.
- Inventors:
- Issue Date:
- Research Org.:
- Kansas City Plant (KCP), Kansas City, MO (United States)
- Sponsoring Org.:
- USDOE National Nuclear Security Administration (NNSA)
- OSTI Identifier:
- 1651059
- Patent Number(s):
- 10691787
- Application Number:
- 15/936,605
- Assignee:
- Honeywell Federal Manufacturing & Technologies, LLC (Kansas City, MO)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G - PHYSICS G06 - COMPUTING G06F - ELECTRIC DIGITAL DATA PROCESSING
- DOE Contract Number:
- NA0002839
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 03/27/2018
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 42 ENGINEERING
Citation Formats
Ewing, Daniel Jonathan. Method of authenticating integrated circuits using optical characteristics of physically unclonable functions. United States: N. p., 2020.
Web.
Ewing, Daniel Jonathan. Method of authenticating integrated circuits using optical characteristics of physically unclonable functions. United States.
Ewing, Daniel Jonathan. Tue .
"Method of authenticating integrated circuits using optical characteristics of physically unclonable functions". United States. https://www.osti.gov/servlets/purl/1651059.
@article{osti_1651059,
title = {Method of authenticating integrated circuits using optical characteristics of physically unclonable functions},
author = {Ewing, Daniel Jonathan},
abstractNote = {A method and apparatus for reading unique identifiers of an integrated circuit. The unique identifiers may be physically unclonable functions (PUFs), formed by high energy ions implanted into semiconductor material of the integrated circuit. The method may include electrically or optically stimulating each of the PUFs and sensing with an optical sensor optical characteristics of resulting light emitted from the PUFs. Then the method may include comparing values associated with the optical characteristics of the PUFs with groups of stored values in a circuit database. Each of the groups of stored values may be associated with optical characteristics of PUFs of a known authentic circuit. The method may then include the controller providing verification of authenticity of the integrated circuit when each of the values associated with the optical characteristics of the PUFs match the stored values of at least one of the groups in the circuit database.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2020},
month = {6}
}
Works referenced in this record:
Reliable Physical Unclonable Function for Device Authentication
patent-application, February 2014
- Bruley, John; Narayanan, Vijay; Pfieffer, Dirk
- US Patent Application 13/572245; 20140042442
Intrinsic Physical Layer Authentication of Integrated Circuits
patent-application, May 2013
- Cobb, William E.; Temple, Michael A.; Baldwin, Rusty O.
- US Patent Application 13/663051; 20130108145