Tunable diode laser absorption spectroscopy with corrected laser ramping nonlinearities
Abstract
A tunable diode laser absorption spectroscopy device includes a tunable diode laser. A laser driver is configured to drive the diode laser and ramp it within a particular frequency range. An analyte gas container, a reference gas container, and a fringe generating device are configured to receive the laser therethrough. An optical detector is configured to detect the laser after it has passed through the analyte gas container and/or the reference gas container, and the in-line fringe generating device. An acquisition card is configured to sample an output of the optical detector. A spectral analyzer is configured to receive output data from the acquisition card, determine a spectrum of the output data, decouple the fringe spectrum from the measured spectrum, calibrate the spectrum based on an expected ideal spectrum of both the fringe and reference gas, and determine a composition of the analyte based on the calibrated spectrum.
- Inventors:
- Issue Date:
- Research Org.:
- International Business Machines Corp., Armonk, NY (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1650994
- Patent Number(s):
- 10677726
- Application Number:
- 15/846,912
- Assignee:
- International Business Machines Corporation (Armonk, NY)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01J - MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- DOE Contract Number:
- AR0000540
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 12/19/2017
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 42 ENGINEERING; 47 OTHER INSTRUMENTATION
Citation Formats
Green, William, Teng, Chu Cheyenne, Wysocki, Gerard, Xiong, Chi, and Zhang, Eric. Tunable diode laser absorption spectroscopy with corrected laser ramping nonlinearities. United States: N. p., 2020.
Web.
Green, William, Teng, Chu Cheyenne, Wysocki, Gerard, Xiong, Chi, & Zhang, Eric. Tunable diode laser absorption spectroscopy with corrected laser ramping nonlinearities. United States.
Green, William, Teng, Chu Cheyenne, Wysocki, Gerard, Xiong, Chi, and Zhang, Eric. Tue .
"Tunable diode laser absorption spectroscopy with corrected laser ramping nonlinearities". United States. https://www.osti.gov/servlets/purl/1650994.
@article{osti_1650994,
title = {Tunable diode laser absorption spectroscopy with corrected laser ramping nonlinearities},
author = {Green, William and Teng, Chu Cheyenne and Wysocki, Gerard and Xiong, Chi and Zhang, Eric},
abstractNote = {A tunable diode laser absorption spectroscopy device includes a tunable diode laser. A laser driver is configured to drive the diode laser and ramp it within a particular frequency range. An analyte gas container, a reference gas container, and a fringe generating device are configured to receive the laser therethrough. An optical detector is configured to detect the laser after it has passed through the analyte gas container and/or the reference gas container, and the in-line fringe generating device. An acquisition card is configured to sample an output of the optical detector. A spectral analyzer is configured to receive output data from the acquisition card, determine a spectrum of the output data, decouple the fringe spectrum from the measured spectrum, calibrate the spectrum based on an expected ideal spectrum of both the fringe and reference gas, and determine a composition of the analyte based on the calibrated spectrum.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2020},
month = {6}
}
Works referenced in this record:
Gaseous Uranium Hexafluride Isotope Measurement by Diode Laser Spectroscopy
patent-application, December 2004
- Nadezhdinskii, Alexander I.; Ponurovskii, Yakov; Kadner, Steven P.
- US Patent Application 10/457646; 20040245470
Extended wavelength calibration reference
patent, July 2002
- Wildnauer, Kenneth R.
- US Patent Document 6,421,120