Systems and methods for data storage and retrieval
Abstract
A method includes directing a probe beam to a target that includes an array of data portions in a data storage medium arranged so that a beam area of the probe beam extends across a plurality of adjacent data portions, the array including a data portion subset with each data portion of the subset responsive to the probe beam to produce a response illumination, receiving the response illumination at a detector, and determining data values corresponding to the plurality of adjacent data portions based on the received response illumination. Apparatus and systems are also disclosed.
- Inventors:
- Issue Date:
- Research Org.:
- Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1650922
- Patent Number(s):
- 10656287
- Application Number:
- 16/374,358
- Assignee:
- Battelle Memorial Institute (Richland, WA)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01T - MEASUREMENT OF NUCLEAR OR X-RADIATION
G - PHYSICS G06 - COMPUTING G06F - ELECTRIC DIGITAL DATA PROCESSING
- DOE Contract Number:
- AC05-76RL01830
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 04/03/2019
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 97 MATHEMATICS AND COMPUTING
Citation Formats
Gotthold, David W., Stevens, Andrew J., Browning, Nigel D., Jensen, Eric, Canfield, Nathan L., and Joly, Alan G. Systems and methods for data storage and retrieval. United States: N. p., 2020.
Web.
Gotthold, David W., Stevens, Andrew J., Browning, Nigel D., Jensen, Eric, Canfield, Nathan L., & Joly, Alan G. Systems and methods for data storage and retrieval. United States.
Gotthold, David W., Stevens, Andrew J., Browning, Nigel D., Jensen, Eric, Canfield, Nathan L., and Joly, Alan G. Tue .
"Systems and methods for data storage and retrieval". United States. https://www.osti.gov/servlets/purl/1650922.
@article{osti_1650922,
title = {Systems and methods for data storage and retrieval},
author = {Gotthold, David W. and Stevens, Andrew J. and Browning, Nigel D. and Jensen, Eric and Canfield, Nathan L. and Joly, Alan G.},
abstractNote = {A method includes directing a probe beam to a target that includes an array of data portions in a data storage medium arranged so that a beam area of the probe beam extends across a plurality of adjacent data portions, the array including a data portion subset with each data portion of the subset responsive to the probe beam to produce a response illumination, receiving the response illumination at a detector, and determining data values corresponding to the plurality of adjacent data portions based on the received response illumination. Apparatus and systems are also disclosed.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2020},
month = {5}
}
Works referenced in this record:
Testing method for semiconductor device, testing apparatus therefor, and semiconductor device suitable for the test
patent, December 2008
- Nishiumi, Toshiya; Ando, Koki
- US Patent Document 7,465,923
Method and apparatus for compressive domain filtering and interference cancellation
patent, May 2014
- Davenport, Mark A.; Boufounos, Petros; Baraniuk, Richard G.
- US Patent Document 8,725,784
Automated adjustment of an energy filtering transmission electron microscope
patent, August 1998
- Kundmann, Michael Karl; Gubbens, Alexander Jozef; Friedman, Stuart L.
- US Patent Document 5,798,524
Mathematical image assembly in a scanning-type microscope
patent, April 2017
- Poto{hacek over (c.)}ek, Pavel; Kooijman, Cornelis Sander; Slingerland, Hendrik Nicolaas
- US Patent Document 9,620,330
Phase plate and method of fabricating same
patent, September 2014
- Iijima, Hirofumi; Konyuba, Yuji
- US Patent Document 8,829,436
Apparatuses And Methods For Three-Dimensional Imaging Of An Object
patent-application, October 2016
- Shechtman, Yoav; Moerner, William
- US Patent Application 15/096122; 20160301915
Phase Plate And Electron Microscope
patent-application, August 2014
- Tamaki, Hirokazu; Takahashi, Yoshio; Kasai, Hiroto
- US Patent Application 14/129261; 20140224988
Scanning Electron Microscope And Scanning Transmission Electron Microscope
patent-application, May 2014
- Inada, Hiromi; Nakamura, Kuniyasu
- US Patent Application 14/232526; 20140138542
Methods and apparatus to capture compressed images
patent, February 2012
- Dekel, Shai
- US Patent Document 8,125,549
Method for obtaining a scanning transmission image of a sample in a particle-optical apparatus
patent, November 2010
- Yakushevska, Alevtyna; Sourty, Erwan; Luecken, Uwe
- US Patent Document 7,825,378
Charging of a hole-free thin film phase plate
patent, July 2014
- Malac, Marek; Beleggia, Marco; Kawasaki, Masahiro
- US Patent Document 8,785,850
Element mapping unit, scanning transmission electron microscope, and element mapping method
patent, April 2011
- Kaji, Kazutoshi; Ueda, Kazuhiro; Kimoto, Koji
- US Patent Document 7,928,376
Fast electron microscopy via compressive sensing
patent, December 2014
- Larson, Kurt W.; Anderson, Hyrum; Wheeler, Jason W.
- US Patent Document 8,907,280
Detector system for use with transmission electron microscope spectroscopy
patent, December 2012
- Luecken, Uwe; Schuurmans, Frank Jeroen Pieter; Kooijman, Cornelis Sander
- US Patent Document 8,334,512
Scanning Transmission Electron Microscopy for Polymer Sequencing
patent-application, May 2013
- Own, Christopher; Andregg, William; Andregg, Michael
- US Patent Application 13/303121; 20130126729
Phase Plate
patent-application, August 2013
- Blackburn, Arthur
- US Patent Application 13/726260; 20130193322
Mathmatical Image Assembly in a Scanning-Type Microscope
patent-application, December 2015
- Potocek, Pavel; Kooijman, Cornelis Sander; Slingerland, Hendrik Nicolaas
- US Patent Application 14/743780; 20150371815
Phase contrast electron microscope
patent-application, December 2007
- Benner, Gerd; Matijevic, Marko
- US Patent Application 11/717201; 20070284528
Method and Apparatus for Compressive Imaging Device
patent-application, October 2006
- Baraniuk, Richard G.; Baron, Dror Z.; Duarte, Marco F.
- US Patent Application 11/379688; 20060239336
System for Improved Compressive Tomography and Method Therefor
patent-application, December 2015
- Brady, David Jones; Carin, Lawrence L.; Kaganovsky, Yan
- US Patent Application 14/764435; 20150351705
Electron lithography using a photocathode
patent, March 1995
- Brandes, George R.; Platzman, Philip Moss
- US Patent Document 5,395,738
Aluminum Oxide Material for Optical Data Storage
patent-application, November 2003
- Akselrod, Mark
- US Patent Application 10/309021; 20030218151
Method Of Examining A Sample In A Charged-Particle Microscope
patent-application, August 2015
- Lazic, Ivan; Bosch, Eric; Boughorbel, Faysal
- US Patent Application 14/629387; 20150243474
Incoherent transmission electron microscopy
patent, June 2014
- Own, Christopher Su-Yan; Bleloch, Andrew; Andregg, William
- US Patent Document 8,748,818
Ponderomotive phase plate for transmission electron microscopes
patent, July 2012
- Reed, Bryan W.
- US Patent Document 8,217,352
High-resolution amplitude contrast imaging
patent, August 2016
- Van Dyck, Dirk; Lucken, Uwe; Stark, Holger
- US Patent Document 9,412,558
Transmission Electron Microscope Provided with Electronic Spectroscope
patent-application, August 2008
- Terada, Shohei; Taniguchi, Yoshifumi
- US Patent Application 12/024357; 20080203296
Apparatus and method for acquiring light field data using variable modulator
patent, February 2014
- Kang, Joo-young; Ok, Hyun-wook; Lee, Seong-deok
- US Patent Document 8,648,955
Scanning Transmission Electron Microscope and Scanning Transmission Electron Microscopy
patent-application, October 2007
- Tsuneta, Ruriko; Koguchi, Masanari; Hashimoto, Takahito
- US Patent Application 11/806120; 20070228277
TEM with Aberration Corrector and Phase Plate
patent-application, August 2009
- Tiemeijer, Peter Christian; De Jong, Alan Frank
- US Patent Application 12/370542; 20090200464
Method of using a phase plate in a transmission electron microscope
patent, September 2015
- Buijsse, Bart; Danev, Radostin Stoyanov
- US Patent Document 9,129,774
Information storage media and method
patent, September 1999
- Miller, Steven D.; Endres, George W.
- US Patent Document 5,958,541
Compressive sensor array system and method
patent, November 2010
- Dudgeon, Dan E.; Laska, Jason N.; Myers, Cory S.
- US Patent Document 7,834,795
Microfabricated High-Bandpass Foucault Aperture For Electron Microscopy
patent-application, April 2013
- Glaeser, Robert; Cambie, Rossana; Jin, Jian
- US Patent Application 13/708521; 20130099115
Method of producing a stencil mask
patent, March 1995
- Hashimoto, Kazuhiko; Endo, Masayuki; Sasago, Masaru
- US Patent Document 5,401,932
Scanning interference electron microscope
patent, August 2008
- Matsumoto, Takao; Koguchi, Masanari
- US Patent Document 7,417,227
Fluorescent optical memory
patent, September 2001
- Glushko, Boris; Levich, Eugene
- US Patent Document 6,291,132
On-Chip Thin Film Zernike Phase Plate and Applications Thereof
patent-application, June 2014
- Shiue, Yunn-Shin; Kuo, Pai-Chia; Chen, Chih-Ting
- US Patent Application 14/107162; 20140166880
Electron beam drawing mask blank, electron beam drawing mask, and method of manufacturing the same
patent, November 2004
- Amemiya, Isao
- US Patent Document 6,812,473
System and method for compressive scanning electron microscopy
patent, January 2015
- Reed, Bryan W.
- US Patent Document 8,933,401
Charged Particle Microscope With Special Aperture Plate
patent-application, April 2016
- Potocek, Pavel; van Laarhoven, Franciscus; Boughorbel, Faysal
- US Patent Application 14/884520; 20160111247
Optical Data Storage System Having Combined Fluorescent Three-Dimensional Information Carrier
patent-application, May 2006
- Magnitski, Sergey; Pebalk, Dimitrij; Shubin, Vladimir
- US Patent Application 11/300255; 20060099376
Method for Compressive Sensing, Reconstruction, and Estimation of Ultra-Wideband Channels
patent-application, May 2014
- Muqaibel, Ali Hussein; Alkhodary, Mohammad Tamim
- US Patent Application 13/681340; 20140140375
Phase Contrast Imaging Using Patterned Illumination/Detector and Phase Mask
patent-application, February 2015
- Holzner, Christian; Feser, Michael
- US Patent Application 14/464954; 20150055745
TEM Phase Contrast Imaging With Image Plane Phase Grating
patent-application, January 2017
- Stevens, Andrew; Kovarik, Libor; Browning, Nigel
- US Patent Application 15/286502; 20170025247
Aberration-Correcting Dark-Field Electron Microscopy
patent-application, August 2011
- Own, Christopher Su-Yan; Dabrowski, Paul John
- US Patent Application 13/024961; 20110192976
Methods for Achieving High Resolution Microfluoroscopy
patent-application, October 2005
- Hirsch, Gregory
- US Patent Application 11/095085; 20050220266
Beam Sensing
patent-application, July 2011
- Kyele, Nicholas Roberts; Van Silfhout, Roelof Gozewijn
- US Patent Application 13/003072; 20110168903
Scanning electron microscope
patent, May 2015
- Ogashiwa, Takeshi; Sato, Mitsugu; Konno, Mitsuru
- US Patent Document 9,040,911
Transmission Electron Microscope
patent-application, September 2011
- Benner, Gerd
- US Patent Application 13/036757; 20110210249
Imaging a Sample in a TEM Equipped with a Phase Plate
patent-application, March 2014
- Buijsse, Bart; Moers, Marco Hugo Petrus; Danev, Radostin Stoyanov
- US Patent Application 14/015658; 20140061463
Phase-Shifting Mask of Method of Fabricating Same
patent-application, October 2008
- Lin, Cheng-Ming; Hsu, Boming
- US Patent Application 11/734163; 20080254376
Test Method of Mask for Electron-Beam Exposure and Method of Electron-Beam Exposure
patent-application, December 2001
- Yamashita, Hiroshi
- US Patent Application 09/870219; 20010054697
Temporal Compressive Sensing Systems
patent-application, May 2017
- Reed, Bryan
- US Patent Application 15/243235; 20170146787
Scanning interference electron microscopy
patent, March 1994
- Ichikawa, Masakazu; Yajima, Yusuke; Takeshita, Masatoshi
- US Patent Document 5,298,747
Detector system for transmission electron microscope
patent, December 2012
- Luecken, Uwe; Schoenmakers, Remco; Schuurmans, Frank Jeroen Pieter
- US Patent Document 8,338,782
Projecting type charged particle microscope and projecting type substrate inspection system
patent, October 2001
- Todokoro, Hideo; Ishitani, Tohru; Usami, Yasutsugu
- US Patent Document 6,310,341
Calibration camera with spectral depth
patent, May 2012
- Meijer, Eduard Johannes; De Graaf, Jan; Verschuuren, Marcus Antonius
- US Patent Document 8,190,007
Method and Apparatus for Observing, Detecting and Correcting Periodic Structures in a Moving Web
patent, January 1972
- Langenbeck, Peter H.
- US Patent Document 3633037
Metrology Method and Inspection Apparatus, Lithographic System and Device Manufacturing Method
patent-application, May 2012
- Smilde, Hendrik; Bleeker, Arno; Warnaar, Patrick
- US Patent Application 13/294057; 20120123581
Methods and Devices for High Throughput Crystal Structure Analysis by Electron Diffraction
patent-application, September 2011
- Nicolopoulos, Stavros; Bultreys, Daniel; Rauch, Edgard
- US Patent Application 13/127455; 20110220796
Device manufacture involving lithographic processing
patent, November 1993
- Berger, Steven; Gibson, John M.
- US Patent Document 5,258,246
Method of forming a semiconductor device utilizing lithographic mask and mask therefor
patent, September 2000
- Dauksher, William J.; Mangat, Pawitter; Huston, Roy Allen
- US Patent Document 6,124,063
Lens system for phase plate for transmission electron microscope and transmission electron microscope
patent-application, October 2002
- Hosokawa, Fumio; Nagayama, Kuniaki; Danev, Radostin
- US Patent Application 10/071881; 20020148962
Reading method and apparatus for a three-dimensional information carrier
patent, January 2006
- Glushko, Boris; Krupkin, Vladimir
- US Patent Document 6,992,965
High-speed multiframe dynamic transmission electron microscope image acquisition system with arbitrary timing
patent, October 2015
- Reed, Bryan W.; DeHope, William J.; Huete, Glenn
- US Patent Document 9,165,743
Observation apparatus and observation method using an electron beam
patent-application, January 2003
- Koguchi, Masanari; Nakamura, Kuniyasu; Umemura, Kaoru
- US Patent Application 10/183157; 20030006373
Differential phase contrast scanning transmission electron microscope
patent, April 1991
- Tsuno, Katsushige; Inoue, Masao
- US Patent Document 5,004,918
Detector System for Use with Transmission Electron Microscope Spectroscopy
patent-application, March 2012
- Luecken, Uwe; Kooijman, Cornelis; Schuurmans, Frank
- US Patent Application 13/217013; 20120049060
Apparatus and method of pattern detection based on a scanning transmission electron microscope
patent, September 1991
- Koshishiba, Hiroya; Fushimi, Satoru; Nakagawa, Yasuo
- US Patent Document 5,051,585
Systems and Methods for Data Storage and Retrieval
patent-application, November 2018
- Gotthold, David W.; Stevens, Andrew J.; Browning, Nigel D.
- US Patent Application 15/589413; 20180321390
Method, Device and System for Measuring Nanoscale Deformations
patent-application, October 2010
- Hytch, Martin; Houdellier, Florent; Hue, Florian
- US Patent Application 12/680078; 20100252735
Compressive Transmission Microscopy
patent-application, September 2016
- Stevens, Andrew J.; Kovarik, Libor; Browning, Nigel D.
- US Patent Application 15/075015; 20160276129
Sparse Sampling And Reconstruction For Electron And Scanning Probe Microscope Imaging
patent-application, March 2015
- Anderson, Hyrum; Helms, Jovana; Wheeler, Jason
- US Patent Application 14/482754; 20150069233
Compressive sampling for multimedia coding
patent, October 2013
- Tian, Jun; Cao, Dong; Yu, Hong Heather
- US Patent Document 8,553,994
Ultra-High Density Storage Device with Electron Beam Steering
patent-application, December 2002
- Marshall, Daniel R.
- US Patent Application 09/893246; 20020196725