Systems and methods for data storage and retrieval

Gotthold, David W.; Stevens, Andrew J.; Browning, Nigel D.; Jensen, Eric; Canfield, Nathan L.; Joly, Alan G.

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A - human necessities
A01 - agriculture
A21 - baking
A22 - butchering
A23 - foods or foodstuffs
A24 - tobacco
A41 - wearing apparel
A42 - headwear
A43 - footwear
A44 - haberdashery
A45 - hand or travelling articles
A46 - brushware
A47 - furniture
A61 - medical or veterinary science
A62 - life-saving
A63 - sports
A99 - subject matter not otherwise provided for in this section
B - performing operations
B01 - physical or chemical processes or apparatus in general
B02 - crushing, pulverising, or disintegrating
B03 - separation of solid materials using liquids or using pneumatic tables or jigs
B04 - centrifugal apparatus or machines for carrying-out physical or chemical processes
B05 - spraying or atomising in general
B06 - generating or transmitting mechanical vibrations in general
B07 - separating solids from solids
B08 - cleaning
B09 - disposal of solid waste
B21 - mechanical metal-working without essentially removing material
B22 - casting
B23 - machine tools
B24 - grinding
B25 - hand tools
B26 - hand cutting tools
B27 - working or preserving wood or similar material
B28 - working cement, clay, or stone
B29 - working of plastics
B30 - presses
B31 - making articles of paper, cardboard or material worked in a manner analogous to paper
B32 - layered products
B33 - additive manufacturing technology
B41 - printing
B42 - bookbinding
B43 - writing or drawing implements
B44 - decorative arts
B60 - vehicles in general
B61 - railways
B62 - land vehicles for travelling otherwise than on rails
B63 - ships or other waterborne vessels
B64 - aircraft
B65 - conveying
B66 - hoisting
B67 - opening, closing {or cleaning} bottles, jars or similar containers
B68 - saddlery
B81 - microstructural technology
B82 - nanotechnology
B99 - subject matter not otherwise provided for in this section
C - chemistry
C01 - inorganic chemistry
C02 - treatment of water, waste water, sewage, or sludge
C03 - glass
C04 - cements
C05 - fertilisers
C06 - explosives
C07 - organic chemistry
C08 - organic macromolecular compounds
C09 - dyes
C10 - petroleum, gas or coke industries
C11 - animal or vegetable oils, fats, fatty substances or waxes
C12 - biochemistry
C13 - sugar industry
C14 - skins
C21 - metallurgy of iron
C22 - metallurgy
C23 - coating metallic material
C25 - electrolytic or electrophoretic processes
C30 - crystal growth
C40 - combinatorial technology
C99 - subject matter not otherwise provided for in this section
D - textiles
D01 - natural or man-made threads or fibres
D02 - yarns
D03 - weaving
D04 - braiding
D05 - sewing
D06 - treatment of textiles or the like
D07 - ropes
D10 - indexing scheme associated with sublasses of section d, relating to textiles
D21 - paper-making
D99 - subject matter not otherwise provided for in this section
E - fixed constructions
E01 - construction of roads, railways, or bridges
E02 - hydraulic engineering
E03 - water supply
E04 - building
E05 - locks
E06 - doors, windows, shutters, or roller blinds in general
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F - mechanical engineering
F01 - machines or engines in general
F02 - combustion engines
F03 - machines or engines for liquids
F04 - positive - displacement machines for liquids
F05 - indexing schemes relating to engines or pumps in various subclasses of classes f01-f04
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F16 - engineering elements and units
F17 - storing or distributing gases or liquids
F21 - lighting
F22 - steam generation
F23 - combustion apparatus
F24 - heating
F25 - refrigeration or cooling
F26 - drying
F27 - furnaces
F28 - heat exchange in general
F41 - weapons
F42 - ammunition
F99 - subject matter not otherwise provided for in this section
G - physics
G01 - measuring
G02 - optics
G03 - photography
G04 - horology
G05 - controlling
G06 - computing
G07 - checking-devices
G08 - signalling
G09 - education
G10 - musical instruments
G11 - information storage
G12 - instrument details
G16 - information and communication technology [ict] specially adapted for specific application fields
G21 - nuclear physics
G99 - subject matter not otherwise provided for in this section
H - electricity
H01 - basic electric elements
H02 - generation
H03 - basic electronic circuitry
H04 - electric communication technique
H05 - electric techniques not otherwise provided for
H99 - subject matter not otherwise provided for in this section
Y - new / cross sectional technologies
Y02 - technologies or applications for mitigation or adaptation against climate change
Y04 - information or communication technologies having an impact on other technology areas
Y10 - technical subjects covered by former uspc

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Title: Systems and methods for data storage and retrieval

Abstract

A method includes directing a probe beam to a target that includes an array of data portions in a data storage medium arranged so that a beam area of the probe beam extends across a plurality of adjacent data portions, the array including a data portion subset with each data portion of the subset responsive to the probe beam to produce a response illumination, receiving the response illumination at a detector, and determining data values corresponding to the plurality of adjacent data portions based on the received response illumination. Apparatus and systems are also disclosed.

Inventors:: Gotthold, David W.; Stevens, Andrew J.; Browning, Nigel D.; Jensen, Eric; Canfield, Nathan L.; Joly, Alan G.

Issue Date:: Tue May 19 00:00:00 EDT 2020

Research Org.:: Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1650922

Patent Number(s):: 10656287

Application Number:: 16/374,358

Assignee:: Battelle Memorial Institute (Richland, WA)

Patent Classifications (CPCs):: G - PHYSICS G01 - MEASURING G01T - MEASUREMENT OF NUCLEAR OR X-RADIATION

G - PHYSICS G06 - COMPUTING G06F - ELECTRIC DIGITAL DATA PROCESSING

Show more

G - PHYSICS G01 - MEASURING G01T - MEASUREMENT OF NUCLEAR OR X-RADIATION
G01T1/00 - Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
G01T1/115 - Read-out devices

G - PHYSICS G06 - COMPUTING G06F - ELECTRIC DIGITAL DATA PROCESSING
G06F3/0325 - {using a plurality of light emitters or reflectors or a plurality of detectors forming a reference frame from which to derive the orientation of the object, e.g. by triangulation or on the basis of reference deformation in the picked up image}

Show less

DOE Contract Number:: AC05-76RL01830

Resource Type:: Patent

Resource Relation:: Patent File Date: 04/03/2019

Country of Publication:: United States

Language:: English

Subject:: 97 MATHEMATICS AND COMPUTING

Citation Formats


                    Gotthold, David W., Stevens, Andrew J., Browning, Nigel D., Jensen, Eric, Canfield, Nathan L., and Joly, Alan G. Systems and methods for data storage and retrieval.  United States: N. p., 2020. 
        Web.

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                    Gotthold, David W., Stevens, Andrew J., Browning, Nigel D., Jensen, Eric, Canfield, Nathan L., & Joly, Alan G. Systems and methods for data storage and retrieval.  United States.

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                    Gotthold, David W., Stevens, Andrew J., Browning, Nigel D., Jensen, Eric, Canfield, Nathan L., and Joly, Alan G. Tue .  
        "Systems and methods for data storage and retrieval".  United States.  https://www.osti.gov/servlets/purl/1650922.

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@article{osti_1650922,

  title        = {Systems and methods for data storage and retrieval},

  author       = {Gotthold, David W. and Stevens, Andrew J. and Browning, Nigel D. and Jensen, Eric and Canfield, Nathan L. and Joly, Alan G.},

  abstractNote = {A method includes directing a probe beam to a target that includes an array of data portions in a data storage medium arranged so that a beam area of the probe beam extends across a plurality of adjacent data portions, the array including a data portion subset with each data portion of the subset responsive to the probe beam to produce a response illumination, receiving the response illumination at a detector, and determining data values corresponding to the plurality of adjacent data portions based on the received response illumination. Apparatus and systems are also disclosed.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {Tue May 19 00:00:00 EDT 2020},

  month        = {Tue May 19 00:00:00 EDT 2020}

}

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Works referenced in this record:

Testing method for semiconductor device, testing apparatus therefor, and semiconductor device suitable for the test
patent, December 2008

Nishiumi, Toshiya; Ando, Koki
US Patent Document 7,465,923
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7465923

Method and apparatus for compressive domain filtering and interference cancellation
patent, May 2014

Davenport, Mark A.; Boufounos, Petros; Baraniuk, Richard G.
US Patent Document 8,725,784
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8725784

Automated adjustment of an energy filtering transmission electron microscope
patent, August 1998

Kundmann, Michael Karl; Gubbens, Alexander Jozef; Friedman, Stuart L.
US Patent Document 5,798,524
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/5798524

Mathematical image assembly in a scanning-type microscope
patent, April 2017

Poto{hacek over (c.)}ek, Pavel; Kooijman, Cornelis Sander; Slingerland, Hendrik Nicolaas
US Patent Document 9,620,330
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/9620330

Phase plate and method of fabricating same
patent, September 2014

Iijima, Hirofumi; Konyuba, Yuji
US Patent Document 8,829,436
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8829436

Apparatuses And Methods For Three-Dimensional Imaging Of An Object
patent-application, October 2016

Shechtman, Yoav; Moerner, William
US Patent Application 15/096122; 20160301915
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20160301915

Phase Plate And Electron Microscope
patent-application, August 2014

Tamaki, Hirokazu; Takahashi, Yoshio; Kasai, Hiroto
US Patent Application 14/129261; 20140224988
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20140224988

Scanning Electron Microscope And Scanning Transmission Electron Microscope
patent-application, May 2014

Inada, Hiromi; Nakamura, Kuniyasu
US Patent Application 14/232526; 20140138542
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20140138542

Methods and apparatus to capture compressed images
patent, February 2012

Dekel, Shai
US Patent Document 8,125,549
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8125549

Method for obtaining a scanning transmission image of a sample in a particle-optical apparatus
patent, November 2010

Yakushevska, Alevtyna; Sourty, Erwan; Luecken, Uwe
US Patent Document 7,825,378
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7825378

Charging of a hole-free thin film phase plate
patent, July 2014

Malac, Marek; Beleggia, Marco; Kawasaki, Masahiro
US Patent Document 8,785,850
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8785850

Element mapping unit, scanning transmission electron microscope, and element mapping method
patent, April 2011

Kaji, Kazutoshi; Ueda, Kazuhiro; Kimoto, Koji
US Patent Document 7,928,376
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7928376

Fast electron microscopy via compressive sensing
patent, December 2014

Larson, Kurt W.; Anderson, Hyrum; Wheeler, Jason W.
US Patent Document 8,907,280
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8907280

Detector system for use with transmission electron microscope spectroscopy
patent, December 2012

Luecken, Uwe; Schuurmans, Frank Jeroen Pieter; Kooijman, Cornelis Sander
US Patent Document 8,334,512
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8334512

Scanning Transmission Electron Microscopy for Polymer Sequencing
patent-application, May 2013

Own, Christopher; Andregg, William; Andregg, Michael
US Patent Application 13/303121; 20130126729
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20130126729

Phase Plate
patent-application, August 2013

Blackburn, Arthur
US Patent Application 13/726260; 20130193322
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20130193322

Mathmatical Image Assembly in a Scanning-Type Microscope
patent-application, December 2015

Potocek, Pavel; Kooijman, Cornelis Sander; Slingerland, Hendrik Nicolaas
US Patent Application 14/743780; 20150371815
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20150371815

Phase contrast electron microscope
patent-application, December 2007

Benner, Gerd; Matijevic, Marko
US Patent Application 11/717201; 20070284528
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20070284528

Method and Apparatus for Compressive Imaging Device
patent-application, October 2006

Baraniuk, Richard G.; Baron, Dror Z.; Duarte, Marco F.
US Patent Application 11/379688; 20060239336
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20060239336

System for Improved Compressive Tomography and Method Therefor
patent-application, December 2015

Brady, David Jones; Carin, Lawrence L.; Kaganovsky, Yan
US Patent Application 14/764435; 20150351705
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20150351705

Electron lithography using a photocathode
patent, March 1995

Brandes, George R.; Platzman, Philip Moss
US Patent Document 5,395,738
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/5395738

Aluminum Oxide Material for Optical Data Storage
patent-application, November 2003

Akselrod, Mark
US Patent Application 10/309021; 20030218151
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20030218151

Method Of Examining A Sample In A Charged-Particle Microscope
patent-application, August 2015

Lazic, Ivan; Bosch, Eric; Boughorbel, Faysal
US Patent Application 14/629387; 20150243474
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20150243474

Incoherent transmission electron microscopy
patent, June 2014

Own, Christopher Su-Yan; Bleloch, Andrew; Andregg, William
US Patent Document 8,748,818
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8748818

Ponderomotive phase plate for transmission electron microscopes
patent, July 2012

Reed, Bryan W.
US Patent Document 8,217,352
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8217352

High-resolution amplitude contrast imaging
patent, August 2016

Van Dyck, Dirk; Lucken, Uwe; Stark, Holger
US Patent Document 9,412,558
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/9412558

Transmission Electron Microscope Provided with Electronic Spectroscope
patent-application, August 2008

Terada, Shohei; Taniguchi, Yoshifumi
US Patent Application 12/024357; 20080203296
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20080203296

Apparatus and method for acquiring light field data using variable modulator
patent, February 2014

Kang, Joo-young; Ok, Hyun-wook; Lee, Seong-deok
US Patent Document 8,648,955
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8648955

Scanning Transmission Electron Microscope and Scanning Transmission Electron Microscopy
patent-application, October 2007

Tsuneta, Ruriko; Koguchi, Masanari; Hashimoto, Takahito
US Patent Application 11/806120; 20070228277
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20070228277

TEM with Aberration Corrector and Phase Plate
patent-application, August 2009

Tiemeijer, Peter Christian; De Jong, Alan Frank
US Patent Application 12/370542; 20090200464
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20090200464

Method of using a phase plate in a transmission electron microscope
patent, September 2015

Buijsse, Bart; Danev, Radostin Stoyanov
US Patent Document 9,129,774
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/9129774

Information storage media and method
patent, September 1999

Miller, Steven D.; Endres, George W.
US Patent Document 5,958,541
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/5958541

Compressive sensor array system and method
patent, November 2010

Dudgeon, Dan E.; Laska, Jason N.; Myers, Cory S.
US Patent Document 7,834,795
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7834795

Microfabricated High-Bandpass Foucault Aperture For Electron Microscopy
patent-application, April 2013

Glaeser, Robert; Cambie, Rossana; Jin, Jian
US Patent Application 13/708521; 20130099115
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20130099115

Method of producing a stencil mask
patent, March 1995

Hashimoto, Kazuhiko; Endo, Masayuki; Sasago, Masaru
US Patent Document 5,401,932
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/5401932

Scanning interference electron microscope
patent, August 2008

Matsumoto, Takao; Koguchi, Masanari
US Patent Document 7,417,227
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7417227

Fluorescent optical memory
patent, September 2001

Glushko, Boris; Levich, Eugene
US Patent Document 6,291,132
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6291132

On-Chip Thin Film Zernike Phase Plate and Applications Thereof
patent-application, June 2014

Shiue, Yunn-Shin; Kuo, Pai-Chia; Chen, Chih-Ting
US Patent Application 14/107162; 20140166880
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20140166880

Electron beam drawing mask blank, electron beam drawing mask, and method of manufacturing the same
patent, November 2004

Amemiya, Isao
US Patent Document 6,812,473
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6812473

System and method for compressive scanning electron microscopy
patent, January 2015

Reed, Bryan W.
US Patent Document 8,933,401
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8933401

Charged Particle Microscope With Special Aperture Plate
patent-application, April 2016

Potocek, Pavel; van Laarhoven, Franciscus; Boughorbel, Faysal
US Patent Application 14/884520; 20160111247
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20160111247

Optical Data Storage System Having Combined Fluorescent Three-Dimensional Information Carrier
patent-application, May 2006

Magnitski, Sergey; Pebalk, Dimitrij; Shubin, Vladimir
US Patent Application 11/300255; 20060099376
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20060099376

Method for Compressive Sensing, Reconstruction, and Estimation of Ultra-Wideband Channels
patent-application, May 2014

Muqaibel, Ali Hussein; Alkhodary, Mohammad Tamim
US Patent Application 13/681340; 20140140375
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20140140375

Phase Contrast Imaging Using Patterned Illumination/Detector and Phase Mask
patent-application, February 2015

Holzner, Christian; Feser, Michael
US Patent Application 14/464954; 20150055745
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20150055745

TEM Phase Contrast Imaging With Image Plane Phase Grating
patent-application, January 2017

Stevens, Andrew; Kovarik, Libor; Browning, Nigel
US Patent Application 15/286502; 20170025247
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20170025247

Aberration-Correcting Dark-Field Electron Microscopy
patent-application, August 2011

Own, Christopher Su-Yan; Dabrowski, Paul John
US Patent Application 13/024961; 20110192976
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20110192976

Methods for Achieving High Resolution Microfluoroscopy
patent-application, October 2005

Hirsch, Gregory
US Patent Application 11/095085; 20050220266
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20050220266

Beam Sensing
patent-application, July 2011

Kyele, Nicholas Roberts; Van Silfhout, Roelof Gozewijn
US Patent Application 13/003072; 20110168903
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20110168903

Scanning electron microscope
patent, May 2015

Ogashiwa, Takeshi; Sato, Mitsugu; Konno, Mitsuru
US Patent Document 9,040,911
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/9040911

Transmission Electron Microscope
patent-application, September 2011

Benner, Gerd
US Patent Application 13/036757; 20110210249
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20110210249

Imaging a Sample in a TEM Equipped with a Phase Plate
patent-application, March 2014

Buijsse, Bart; Moers, Marco Hugo Petrus; Danev, Radostin Stoyanov
US Patent Application 14/015658; 20140061463
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20140061463

Phase-Shifting Mask of Method of Fabricating Same
patent-application, October 2008

Lin, Cheng-Ming; Hsu, Boming
US Patent Application 11/734163; 20080254376
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20080254376

Test Method of Mask for Electron-Beam Exposure and Method of Electron-Beam Exposure
patent-application, December 2001

Yamashita, Hiroshi
US Patent Application 09/870219; 20010054697
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20010054697

Temporal Compressive Sensing Systems
patent-application, May 2017

Reed, Bryan
US Patent Application 15/243235; 20170146787
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20170146787

Scanning interference electron microscopy
patent, March 1994

Ichikawa, Masakazu; Yajima, Yusuke; Takeshita, Masatoshi
US Patent Document 5,298,747
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/5298747

Detector system for transmission electron microscope
patent, December 2012

Luecken, Uwe; Schoenmakers, Remco; Schuurmans, Frank Jeroen Pieter
US Patent Document 8,338,782
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8338782

Projecting type charged particle microscope and projecting type substrate inspection system
patent, October 2001

Todokoro, Hideo; Ishitani, Tohru; Usami, Yasutsugu
US Patent Document 6,310,341
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6310341

Calibration camera with spectral depth
patent, May 2012

Meijer, Eduard Johannes; De Graaf, Jan; Verschuuren, Marcus Antonius
US Patent Document 8,190,007
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8190007

Method and Apparatus for Observing, Detecting and Correcting Periodic Structures in a Moving Web
patent, January 1972

Langenbeck, Peter H.
US Patent Document 3633037
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/3633037

Metrology Method and Inspection Apparatus, Lithographic System and Device Manufacturing Method
patent-application, May 2012

Smilde, Hendrik; Bleeker, Arno; Warnaar, Patrick
US Patent Application 13/294057; 20120123581
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20120123581

Methods and Devices for High Throughput Crystal Structure Analysis by Electron Diffraction
patent-application, September 2011

Nicolopoulos, Stavros; Bultreys, Daniel; Rauch, Edgard
US Patent Application 13/127455; 20110220796
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20110220796

Device manufacture involving lithographic processing
patent, November 1993

Berger, Steven; Gibson, John M.
US Patent Document 5,258,246
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/5258246

Method of forming a semiconductor device utilizing lithographic mask and mask therefor
patent, September 2000

Dauksher, William J.; Mangat, Pawitter; Huston, Roy Allen
US Patent Document 6,124,063
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6124063

Lens system for phase plate for transmission electron microscope and transmission electron microscope
patent-application, October 2002

Hosokawa, Fumio; Nagayama, Kuniaki; Danev, Radostin
US Patent Application 10/071881; 20020148962
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20020148962

Reading method and apparatus for a three-dimensional information carrier
patent, January 2006

Glushko, Boris; Krupkin, Vladimir
US Patent Document 6,992,965
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6992965

High-speed multiframe dynamic transmission electron microscope image acquisition system with arbitrary timing
patent, October 2015

Reed, Bryan W.; DeHope, William J.; Huete, Glenn
US Patent Document 9,165,743
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/9165743

Phase plate for a TEM
patent, July 2014

Buijsse, Bart
US Patent Document 8,772,716
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8772716

Observation apparatus and observation method using an electron beam
patent-application, January 2003

Koguchi, Masanari; Nakamura, Kuniyasu; Umemura, Kaoru
US Patent Application 10/183157; 20030006373
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20030006373

Differential phase contrast scanning transmission electron microscope
patent, April 1991

Tsuno, Katsushige; Inoue, Masao
US Patent Document 5,004,918
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/5004918

Detector System for Use with Transmission Electron Microscope Spectroscopy
patent-application, March 2012

Luecken, Uwe; Kooijman, Cornelis; Schuurmans, Frank
US Patent Application 13/217013; 20120049060
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20120049060

Apparatus and method of pattern detection based on a scanning transmission electron microscope
patent, September 1991

Koshishiba, Hiroya; Fushimi, Satoru; Nakagawa, Yasuo
US Patent Document 5,051,585
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/5051585