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Title: Concentric semi-circular split profiling for computed tomographic imaging of electronic beams

Abstract

Apparatus and method for analyzing an electron beam including a circular sensor disk adapted to receive the electron beam, an inner semi-circular slit in the circular sensor disk; an outer semi-circular slit in the circular sensor disk wherein the outer semi-circular slit is spaced from the first semi-circular slit by a fixed distance; a system for sweeping the electron beam radially outward from the central axis to the inner semi-circular slit and outer second semi-circular slit; a sensor structure operatively connected to the circular sensor disk wherein the sensor structure receives the electron beam when it passes over the inner semi-circular slit and the outer semi-circular slit; and a device for measuring the electron beam that is intercepted by the inner semi-circular slit and the outer semi-circular slit.

Inventors:
;
Issue Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1650896
Patent Number(s):
10649102
Application Number:
16/123,069
Assignee:
Lawrence Livermore National Security, LLC (Livermore, CA)
Patent Classifications (CPCs):
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
G - PHYSICS G01 - MEASURING G01T - MEASUREMENT OF NUCLEAR OR X-RADIATION
DOE Contract Number:  
AC52-07NA27344
Resource Type:
Patent
Resource Relation:
Patent File Date: 09/06/2018
Country of Publication:
United States
Language:
English

Citation Formats

Elmer, John W., and Teruya, Alan T.. Concentric semi-circular split profiling for computed tomographic imaging of electronic beams. United States: N. p., 2020. Web.
Elmer, John W., & Teruya, Alan T.. Concentric semi-circular split profiling for computed tomographic imaging of electronic beams. United States.
Elmer, John W., and Teruya, Alan T.. Tue . "Concentric semi-circular split profiling for computed tomographic imaging of electronic beams". United States. https://www.osti.gov/servlets/purl/1650896.
@article{osti_1650896,
title = {Concentric semi-circular split profiling for computed tomographic imaging of electronic beams},
author = {Elmer, John W. and Teruya, Alan T.},
abstractNote = {Apparatus and method for analyzing an electron beam including a circular sensor disk adapted to receive the electron beam, an inner semi-circular slit in the circular sensor disk; an outer semi-circular slit in the circular sensor disk wherein the outer semi-circular slit is spaced from the first semi-circular slit by a fixed distance; a system for sweeping the electron beam radially outward from the central axis to the inner semi-circular slit and outer second semi-circular slit; a sensor structure operatively connected to the circular sensor disk wherein the sensor structure receives the electron beam when it passes over the inner semi-circular slit and the outer semi-circular slit; and a device for measuring the electron beam that is intercepted by the inner semi-circular slit and the outer semi-circular slit.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2020},
month = {5}
}

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Works referenced in this record:

Diagnostic system for profiling micro-beams
patent, October 2007


Electron beam diagnostic for profiling high power beams
patent, March 2008