Concentric semi-circular split profiling for computed tomographic imaging of electronic beams

Elmer, John W.; Teruya, Alan T.

Title: Concentric semi-circular split profiling for computed tomographic imaging of electronic beams

Abstract

Apparatus and method for analyzing an electron beam including a circular sensor disk adapted to receive the electron beam, an inner semi-circular slit in the circular sensor disk; an outer semi-circular slit in the circular sensor disk wherein the outer semi-circular slit is spaced from the first semi-circular slit by a fixed distance; a system for sweeping the electron beam radially outward from the central axis to the inner semi-circular slit and outer second semi-circular slit; a sensor structure operatively connected to the circular sensor disk wherein the sensor structure receives the electron beam when it passes over the inner semi-circular slit and the outer semi-circular slit; and a device for measuring the electron beam that is intercepted by the inner semi-circular slit and the outer semi-circular slit.

Inventors:: Elmer, John W.; Teruya, Alan T.

Issue Date:: 2020-05-12

Research Org.:: Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1650896

Patent Number(s):: 10649102

Application Number:: 16/123,069

Assignee:: Lawrence Livermore National Security, LLC (Livermore, CA)

Patent Classifications (CPCs):: G - PHYSICS G01 - MEASURING G01T - MEASUREMENT OF NUCLEAR OR X-RADIATION

H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS

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G - PHYSICS G01 - MEASURING G01T - MEASUREMENT OF NUCLEAR OR X-RADIATION
G01T1/2985 - {In depth localisation, e.g. using positron emitters

H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J2237/24405 - Faraday cages
H01J2237/2446 - Position sensitive detectors
H01J2237/24542 - Beam profile
H01J2237/30433 - System calibration
H01J2237/3104 - Welding
H01J37/244 - Detectors

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DOE Contract Number:: AC52-07NA27344

Resource Type:: Patent

Resource Relation:: Patent File Date: 09/06/2018

Country of Publication:: United States

Language:: English

Subject:: 42 ENGINEERING

Citation Formats


                    Elmer, John W., and Teruya, Alan T.. Concentric semi-circular split profiling for computed tomographic imaging of electronic beams.  United States: N. p., 2020. 
        Web.

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                    Elmer, John W., & Teruya, Alan T.. Concentric semi-circular split profiling for computed tomographic imaging of electronic beams.  United States.

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                    Elmer, John W., and Teruya, Alan T.. Tue .  
        "Concentric semi-circular split profiling for computed tomographic imaging of electronic beams".  United States.  https://www.osti.gov/servlets/purl/1650896.

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@article{osti_1650896,

  title        = {Concentric semi-circular split profiling for computed tomographic imaging of electronic beams},

  author       = {Elmer, John W. and Teruya, Alan T.},

  abstractNote = {Apparatus and method for analyzing an electron beam including a circular sensor disk adapted to receive the electron beam, an inner semi-circular slit in the circular sensor disk; an outer semi-circular slit in the circular sensor disk wherein the outer semi-circular slit is spaced from the first semi-circular slit by a fixed distance; a system for sweeping the electron beam radially outward from the central axis to the inner semi-circular slit and outer second semi-circular slit; a sensor structure operatively connected to the circular sensor disk wherein the sensor structure receives the electron beam when it passes over the inner semi-circular slit and the outer semi-circular slit; and a device for measuring the electron beam that is intercepted by the inner semi-circular slit and the outer semi-circular slit.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {2020},

  month        = {5}

}

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Works referenced in this record:

Electron beam diagnostic system using computed tomography and an annular sensor
patent, August 2015

Elmer, John W.; Teruya, Alan T.
US Patent Document 9,105,448
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/9105448

Electron beam diagnostic system using computed tomography and an annular sensor
patent, July 2014

Elmer, John W.; Teruya, Alan T.
US Patent Document 8,791,426
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8791426

Beam Imaging Sensor and Method for Using Same
patent-application, May 2015

McAninch, Michael D.; Root, Jeffery J.
US Patent Application 14/595593; 20150129774
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20150129774

Diagnostic system for profiling micro-beams
patent, October 2007

Elmer, John W.; Palmer, Todd; Teruya, Alan T.
US Patent Document 7,288,772
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7288772

Electron beam diagnostic for profiling high power beams
patent, March 2008

Elmer, John W.; Palmer, Todd; Teruya, Alan T.
US Patent Document 7,348,568
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7348568

Slit Disk for Modified Faraday Cup Diagnostic for Determining Power Density of Electron and Ion Beams
patent-application, February 2010

Teruya, Alan T.; Elmer, John W.; Palmer, Todd A.
US Patent Application 12/188398; 20100032562
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20100032562

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Title: Concentric semi-circular split profiling for computed tomographic imaging of electronic beams

Abstract

Citation Formats

Electron beam diagnostic system using computed tomography and an annular sensor patent, August 2015

Electron beam diagnostic system using computed tomography and an annular sensor patent, July 2014

Beam Imaging Sensor and Method for Using Same patent-application, May 2015

Diagnostic system for profiling micro-beams patent, October 2007

Electron beam diagnostic for profiling high power beams patent, March 2008

Slit Disk for Modified Faraday Cup Diagnostic for Determining Power Density of Electron and Ion Beams patent-application, February 2010

Electron beam diagnostic system using computed tomography and an annular sensor
patent, August 2015

Electron beam diagnostic system using computed tomography and an annular sensor
patent, July 2014

Beam Imaging Sensor and Method for Using Same
patent-application, May 2015

Diagnostic system for profiling micro-beams
patent, October 2007

Electron beam diagnostic for profiling high power beams
patent, March 2008

Slit Disk for Modified Faraday Cup Diagnostic for Determining Power Density of Electron and Ion Beams
patent-application, February 2010