skip to main content
DOE Patents title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Electrical meter probe contact verification system

Abstract

A system and method verifies continuity with and measures voltage across a circuit under test (in some instances simultaneously) using two or more test probes. Two or more probe continuity circuits measure continuity through the test probes by injecting a test current through and measuring a processed test current received at each of the plurality of test probes. The probe continuity circuits measure the respective processed test current rendered by the test current flowing through the test circuit at each test probe. A voltmeter measures the potential difference across the test probes.

Inventors:
; ; ;
Issue Date:
Research Org.:
=; Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1650825
Patent Number(s):
10634732
Application Number:
15/675,456
Assignee:
UT-Battelle, LLC (Oak Ridge, TN)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES
DOE Contract Number:  
AC05-00OR22725
Resource Type:
Patent
Resource Relation:
Patent File Date: 08/11/2017
Country of Publication:
United States
Language:
English

Citation Formats

Warmack, Robert J., Ericson, Milton Nance, Kisner, Roger A., and Polsky, Yarom. Electrical meter probe contact verification system. United States: N. p., 2020. Web.
Warmack, Robert J., Ericson, Milton Nance, Kisner, Roger A., & Polsky, Yarom. Electrical meter probe contact verification system. United States.
Warmack, Robert J., Ericson, Milton Nance, Kisner, Roger A., and Polsky, Yarom. Tue . "Electrical meter probe contact verification system". United States. https://www.osti.gov/servlets/purl/1650825.
@article{osti_1650825,
title = {Electrical meter probe contact verification system},
author = {Warmack, Robert J. and Ericson, Milton Nance and Kisner, Roger A. and Polsky, Yarom},
abstractNote = {A system and method verifies continuity with and measures voltage across a circuit under test (in some instances simultaneously) using two or more test probes. Two or more probe continuity circuits measure continuity through the test probes by injecting a test current through and measuring a processed test current received at each of the plurality of test probes. The probe continuity circuits measure the respective processed test current rendered by the test current flowing through the test circuit at each test probe. A voltmeter measures the potential difference across the test probes.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2020},
month = {4}
}

Patent:

Save / Share:

Works referenced in this record:

Non-invasive power supply tester
patent, August 2010


Transmission line input structure test probe
patent, March 2006