Electrical meter probe contact verification system
Abstract
A system and method verifies continuity with and measures voltage across a circuit under test (in some instances simultaneously) using two or more test probes. Two or more probe continuity circuits measure continuity through the test probes by injecting a test current through and measuring a processed test current received at each of the plurality of test probes. The probe continuity circuits measure the respective processed test current rendered by the test current flowing through the test circuit at each test probe. A voltmeter measures the potential difference across the test probes.
- Inventors:
- Issue Date:
- Research Org.:
- =; Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1650825
- Patent Number(s):
- 10634732
- Application Number:
- 15/675,456
- Assignee:
- UT-Battelle, LLC (Oak Ridge, TN)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES
- DOE Contract Number:
- AC05-00OR22725
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 08/11/2017
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 42 ENGINEERING; 47 OTHER INSTRUMENTATION
Citation Formats
Warmack, Robert J., Ericson, Milton Nance, Kisner, Roger A., and Polsky, Yarom. Electrical meter probe contact verification system. United States: N. p., 2020.
Web.
Warmack, Robert J., Ericson, Milton Nance, Kisner, Roger A., & Polsky, Yarom. Electrical meter probe contact verification system. United States.
Warmack, Robert J., Ericson, Milton Nance, Kisner, Roger A., and Polsky, Yarom. Tue .
"Electrical meter probe contact verification system". United States. https://www.osti.gov/servlets/purl/1650825.
@article{osti_1650825,
title = {Electrical meter probe contact verification system},
author = {Warmack, Robert J. and Ericson, Milton Nance and Kisner, Roger A. and Polsky, Yarom},
abstractNote = {A system and method verifies continuity with and measures voltage across a circuit under test (in some instances simultaneously) using two or more test probes. Two or more probe continuity circuits measure continuity through the test probes by injecting a test current through and measuring a processed test current received at each of the plurality of test probes. The probe continuity circuits measure the respective processed test current rendered by the test current flowing through the test circuit at each test probe. A voltmeter measures the potential difference across the test probes.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2020},
month = {4}
}
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.
Works referenced in this record:
Transmission line input structure test probe
patent, March 2006
- Jacobs, Lawrence; Campbell, Julie A.
- US Patent Document 7,019,544