Sensing analytical instrument parameters, specimen characteristics, or both from sparse datasets

Stanfill, Bryan A.; Reehl, Sarah M.; Johnson, Margaret C.; Bramer, Lisa M.; Browning, Nigel D.; Stevens, Andrew J.; Kovarik, Libor

Title: Sensing analytical instrument parameters, specimen characteristics, or both from sparse datasets

Abstract

Disclosed are methods for sensing conditions of an electron microscope system and/or a specimen analyzed thereby. Also disclosed are sensor systems and electron microscope systems able to sense system conditions, and/or conditions of the specimen being analyzed by such systems. In one embodiment, a sparse dataset can be acquired from a random sub-sampling of the specimen by an electron beam probe of the electron microscope system. Instrument parameters, specimen characteristics, or both can be estimated from the sparse dataset.

Inventors:: Stanfill, Bryan A.; Reehl, Sarah M.; Johnson, Margaret C.; Bramer, Lisa M.; Browning, Nigel D.; Stevens, Andrew J.; Kovarik, Libor

Issue Date:: 2020-01-21

Research Org.:: Pacific Northwest National Lab. (PNNL), Richland, WA (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1632476

Patent Number(s):: 10541109

Application Number:: 15/660,096

Assignee:: Battelle Memorial Institute (Richland, WA)

Patent Classifications (CPCs):: H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS

Show more

H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J2237/2814 - Measurement of surface topography
H01J2237/226 - Image reconstruction
H01J37/265 - {Controlling the tube
H01J2237/216 - Automatic focusing methods
H01J2237/282 - Determination of microscope properties
H01J37/28 - with scanning beams
H01J37/244 - Detectors
H01J2237/2817 - Pattern inspection
H01J37/06 - Electron sources
H01J2237/2826 - Calibration

Show less

DOE Contract Number:: AC05-76RL01830

Resource Type:: Patent

Resource Relation:: Patent File Date: 07/26/2017

Country of Publication:: United States

Language:: English

Subject:: 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY

Citation Formats


                    Stanfill, Bryan A., Reehl, Sarah M., Johnson, Margaret C., Bramer, Lisa M., Browning, Nigel D., Stevens, Andrew J., and Kovarik, Libor. Sensing analytical instrument parameters, specimen characteristics, or both from sparse datasets.  United States: N. p., 2020. 
        Web.

Copy to clipboard


                    Stanfill, Bryan A., Reehl, Sarah M., Johnson, Margaret C., Bramer, Lisa M., Browning, Nigel D., Stevens, Andrew J., & Kovarik, Libor. Sensing analytical instrument parameters, specimen characteristics, or both from sparse datasets.  United States.

Copy to clipboard


                    Stanfill, Bryan A., Reehl, Sarah M., Johnson, Margaret C., Bramer, Lisa M., Browning, Nigel D., Stevens, Andrew J., and Kovarik, Libor. Tue .  
        "Sensing analytical instrument parameters, specimen characteristics, or both from sparse datasets".  United States.  https://www.osti.gov/servlets/purl/1632476.

Copy to clipboard


                    
@article{osti_1632476,

  title        = {Sensing analytical instrument parameters, specimen characteristics, or both from sparse datasets},

  author       = {Stanfill, Bryan A. and Reehl, Sarah M. and Johnson, Margaret C. and Bramer, Lisa M. and Browning, Nigel D. and Stevens, Andrew J. and Kovarik, Libor},

  abstractNote = {Disclosed are methods for sensing conditions of an electron microscope system and/or a specimen analyzed thereby. Also disclosed are sensor systems and electron microscope systems able to sense system conditions, and/or conditions of the specimen being analyzed by such systems. In one embodiment, a sparse dataset can be acquired from a random sub-sampling of the specimen by an electron beam probe of the electron microscope system. Instrument parameters, specimen characteristics, or both can be estimated from the sparse dataset.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {2020},

  month        = {1}

}

Copy to clipboard

Patent:

View Patent

Save / Share:

Export Metadata

Save to My Library

Works referenced in this record:

Sparse Sampling And Reconstruction For Electron And Scanning Probe Microscope Imaging
patent-application, March 2015

Anderson, Hyrum; Helms, Jovana; Wheeler, Jason
US Patent Application 14/482754; 20150069233
URL: http://appft.uspto.gov/netacgi/nph-Parser?Sect1=PTO1&Sect2=HITOFF&d=PG01&p=1&u=%2Fnetahtml%2FPTO%2Fsrchnum.html&r=1&f=G&l=50&s1=%2220150069233%22.PGNR.&OS=DN/20150069233&RS=DN/20150069233

Ion Sources, Systems And Methods
patent-application, July 2009

Ward, Billy; Notte, John; Farkas, Louis
US Patent Application 12/364259; 20090179161
URL: http://appft.uspto.gov/netacgi/nph-Parser?Sect1=PTO1&Sect2=HITOFF&d=PG01&p=1&u=%2Fnetahtml%2FPTO%2Fsrchnum.html&r=1&f=G&l=50&s1=%2220090179161%22.PGNR.&OS=DN/20090179161&RS=DN/20090179161

Methods and systems for determining a presence of defects and a thin film characteristic of a specimen
patent, September 2006

Bultman, Gary; Levy, Ady; Brown, Kyle A.
US Patent Document 7,106,425
URL: http://patft.uspto.gov/netacgi/nph-Parser?patentnumber=7106425

Charged Particle Microscope With Special Aperture Plate
patent-application, April 2016

Potocek, Pavel; van Laarhoven, Franciscus; Boughorbel, Faysal
US Patent Application 14/884520; 20160111247
URL: http://appft.uspto.gov/netacgi/nph-Parser?Sect1=PTO1&Sect2=HITOFF&d=PG01&p=1&u=%2Fnetahtml%2FPTO%2Fsrchnum.html&r=1&f=G&l=50&s1=%2220160111247%22.PGNR.&OS=DN/20160111247&RS=DN/20160111247

Position detecting system
patent, May 1986

Ido, Satoshi; Fujinami, Minpei; Kato, Yasuo
US Patent Document 4,589,773
URL: http://patft.uspto.gov/netacgi/nph-Parser?patentnumber=4589773

Mathematical image assembly in a scanning-type microscope
patent, April 2017

Potocek, Pavel; Kooijman, Cornelis Sander; Slingerland, Hendrik Nicolaas
US Patent Document 9,620,330
URL: http://patft.uspto.gov/netacgi/nph-Parser?patentnumber=9620330

Probe system with multiple actuation locations
patent, January 2018

Humphris, Andrew
US Patent Document 9,874,582
URL: http://patft.uspto.gov/netacgi/nph-Parser?patentnumber=9874582

Similar Records in DOE Patents and OSTI.GOV collections:

Integrated sensing platform and method for improved quantitative and selective monitoring of chemical analytes in both liquid and gas phase

Patent Blair, Dianna S [Albuquerque, NM]; Frye-Mason, Gregory C [Cedar Crest, NM]; Butler, Michael A [Albuquerque, NM]

By measuring two or more physical parameters of a thin sensing film which are altered when exposed to chemicals, more effective discrimination between chemicals can be achieved. In using more than one sensor, the sensors are preferably integrated on the same substrate so that they may measure the same thin film. Even more preferably, the sensors are provided orthogonal to one another so that they may measure the same portion of the thin film. These provisions reduce problems in discrimination arising from variations in thin films.
Full Text Available
Sparse sampling methods and probe systems for analytical instruments

Patent Kovarik, Libor; Stevens, Andrew J.; Liyu, Andrey V.; ...

Sparse sampling approaches and probe systems for analytical instruments are disclosed providing for effective sub-sampling of a specimen and inpainting to reconstruct representations of actual information. The sub-sampling involves serial acquisition of contiguous measured values lying at positions along a scan path extending in a line toward a first direction and having random perturbations in a second direction. The perturbations are limited within a predetermined distance from the line. Inpainting techniques are utilized among the measured values to reconstruct a representation of actual information regarding the specimen.
Full Text Available
Multiple-frequency acoustic wave devices for chemical sensing and materials characterization in both gas and liquid phase

Patent Martin, Stephen J [Albuquerque, NM]; Ricco, Antonio J [Albuquerque, NM]

A chemical sensor (1) includes two or more pairs of interdigital electrodes (10) having different periodicities. Each pair is comprised of a first electrode (10a) and a second electrode (10b). The electrodes are patterned on a surface of a piezoelectric substrate (12). Each pair of electrodes may launch and receive various acoustic waves (AW), including a surface acoustic wave (SAW), and may also launch and receive several acoustic plate modes (APMs). The frequencies associated with each are functions of the transducer periodicity as well as the velocity of the particular AW in the chosen substrate material. An AW interaction regionmore » « less
Full Text Available
Ultrasensitive biochemical sensing device and method of sensing analytes

Patent Pinchuk, Anatoliy

Systems and methods biochemically sense a concentration of a ligand using a sensor having a substrate having a metallic nanoparticle array formed onto a surface of the substrate. A light source is incident on the surface. A matrix is deposited over the nanoparticle array and contains a protein adapted to binding the ligand. A detector detects s-polarized and p-polarized light from the reflective surface. Spacing of nanoparticles in the array and wavelength of light are selected such that plasmon resonance occurs with an isotropic point such that -s and -p polarizations of the incident light result in substantially identical surfacemore » « less
Full Text Available
Simultaneous specimen and stage cleaning device for analytical electron microscope

Patent Zaluzec, Nestor J [Bolingbrook, IL]

An improved method and apparatus are provided for cleaning both a specimen stage, a specimen and an interior of an analytical electron microscope (AEM). The apparatus for cleaning a specimen stage and specimen comprising a plasma chamber for containing a gas plasma and an air lock coupled to the plasma chamber for permitting passage of the specimen stage and specimen into the plasma chamber and maintaining an airtight chamber. The specimen stage and specimen are subjected to a reactive plasma gas that is either DC or RF excited. The apparatus can be mounted on the analytical electron microscope (AEM) formore » « less
Full Text Available

Similar Records

Title: Sensing analytical instrument parameters, specimen characteristics, or both from sparse datasets

Abstract

Citation Formats

Sparse Sampling And Reconstruction For Electron And Scanning Probe Microscope Imaging patent-application, March 2015

Ion Sources, Systems And Methods patent-application, July 2009

Methods and systems for determining a presence of defects and a thin film characteristic of a specimen patent, September 2006

Charged Particle Microscope With Special Aperture Plate patent-application, April 2016

Position detecting system patent, May 1986

Mathematical image assembly in a scanning-type microscope patent, April 2017

Probe system with multiple actuation locations patent, January 2018

Sparse Sampling And Reconstruction For Electron And Scanning Probe Microscope Imaging
patent-application, March 2015

Ion Sources, Systems And Methods
patent-application, July 2009

Methods and systems for determining a presence of defects and a thin film characteristic of a specimen
patent, September 2006

Charged Particle Microscope With Special Aperture Plate
patent-application, April 2016

Position detecting system
patent, May 1986

Mathematical image assembly in a scanning-type microscope
patent, April 2017

Probe system with multiple actuation locations
patent, January 2018