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Title: Sensing analytical instrument parameters, specimen characteristics, or both from sparse datasets

Abstract

Disclosed are methods for sensing conditions of an electron microscope system and/or a specimen analyzed thereby. Also disclosed are sensor systems and electron microscope systems able to sense system conditions, and/or conditions of the specimen being analyzed by such systems. In one embodiment, a sparse dataset can be acquired from a random sub-sampling of the specimen by an electron beam probe of the electron microscope system. Instrument parameters, specimen characteristics, or both can be estimated from the sparse dataset.

Inventors:
; ; ; ; ; ;
Issue Date:
Research Org.:
Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1632476
Patent Number(s):
10541109
Application Number:
15/660,096
Assignee:
Battelle Memorial Institute (Richland, WA)
Patent Classifications (CPCs):
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
DOE Contract Number:  
AC05-76RL01830
Resource Type:
Patent
Resource Relation:
Patent File Date: 07/26/2017
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY

Citation Formats

Stanfill, Bryan A., Reehl, Sarah M., Johnson, Margaret C., Bramer, Lisa M., Browning, Nigel D., Stevens, Andrew J., and Kovarik, Libor. Sensing analytical instrument parameters, specimen characteristics, or both from sparse datasets. United States: N. p., 2020. Web.
Stanfill, Bryan A., Reehl, Sarah M., Johnson, Margaret C., Bramer, Lisa M., Browning, Nigel D., Stevens, Andrew J., & Kovarik, Libor. Sensing analytical instrument parameters, specimen characteristics, or both from sparse datasets. United States.
Stanfill, Bryan A., Reehl, Sarah M., Johnson, Margaret C., Bramer, Lisa M., Browning, Nigel D., Stevens, Andrew J., and Kovarik, Libor. Tue . "Sensing analytical instrument parameters, specimen characteristics, or both from sparse datasets". United States. https://www.osti.gov/servlets/purl/1632476.
@article{osti_1632476,
title = {Sensing analytical instrument parameters, specimen characteristics, or both from sparse datasets},
author = {Stanfill, Bryan A. and Reehl, Sarah M. and Johnson, Margaret C. and Bramer, Lisa M. and Browning, Nigel D. and Stevens, Andrew J. and Kovarik, Libor},
abstractNote = {Disclosed are methods for sensing conditions of an electron microscope system and/or a specimen analyzed thereby. Also disclosed are sensor systems and electron microscope systems able to sense system conditions, and/or conditions of the specimen being analyzed by such systems. In one embodiment, a sparse dataset can be acquired from a random sub-sampling of the specimen by an electron beam probe of the electron microscope system. Instrument parameters, specimen characteristics, or both can be estimated from the sparse dataset.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2020},
month = {1}
}

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Works referenced in this record:

Position detecting system
patent, May 1986


Mathematical image assembly in a scanning-type microscope
patent, April 2017


Probe system with multiple actuation locations
patent, January 2018