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Title: Optical quantification of interfacial charge states

Abstract

An apparatus for probing an interface via second harmonic generation (SHG) spectroscopy is provided. The apparatus comprises a sample cell comprising a noncentrosymmetric material having a selected orientation angle with respect to a reference axis; optics configured to illuminate an interface formed between the noncentrosymmetric material and a different material, or formed between two different materials and disposed over the noncentrosymmetric material, with light having a frequency ω under conditions to generate a second harmonic generation (SHG) signal having frequency 2ω; a detector configured to detect the SHG signal, the SHG signal comprising a bulk second harmonic signal from the noncentrosymmetric material and an interfacial second harmonic signal from the interface; and a device comprising a processor and a computer-readable medium operably coupled to the processor, the computer-readable medium having computer-readable instructions stored thereon that, when executed by the processor, cause the apparatus to: illuminate the interface to generate the SHG signal and detect the SHG signal.

Inventors:
; ; ;
Issue Date:
Research Org.:
Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1600426
Patent Number(s):
10,514,585
Application Number:
16/299,383
Assignee:
Northwestern University (Evanston, IL); Battelle Memorial Institute (Columbus, OH); The Trustees of Columbia University in the City of New York (Staten Island, NY)
DOE Contract Number:  
AC05-76RL01830; CHE1057483; CHE1464916
Resource Type:
Patent
Resource Relation:
Patent File Date: 03/12/2019
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS

Citation Formats

Geiger, Franz M., Ohno, Paul E., Wang, Hong-fei, and Eisenthal, Kenneth B. Optical quantification of interfacial charge states. United States: N. p., 2019. Web.
Geiger, Franz M., Ohno, Paul E., Wang, Hong-fei, & Eisenthal, Kenneth B. Optical quantification of interfacial charge states. United States.
Geiger, Franz M., Ohno, Paul E., Wang, Hong-fei, and Eisenthal, Kenneth B. Tue . "Optical quantification of interfacial charge states". United States. https://www.osti.gov/servlets/purl/1600426.
@article{osti_1600426,
title = {Optical quantification of interfacial charge states},
author = {Geiger, Franz M. and Ohno, Paul E. and Wang, Hong-fei and Eisenthal, Kenneth B.},
abstractNote = {An apparatus for probing an interface via second harmonic generation (SHG) spectroscopy is provided. The apparatus comprises a sample cell comprising a noncentrosymmetric material having a selected orientation angle with respect to a reference axis; optics configured to illuminate an interface formed between the noncentrosymmetric material and a different material, or formed between two different materials and disposed over the noncentrosymmetric material, with light having a frequency ω under conditions to generate a second harmonic generation (SHG) signal having frequency 2ω; a detector configured to detect the SHG signal, the SHG signal comprising a bulk second harmonic signal from the noncentrosymmetric material and an interfacial second harmonic signal from the interface; and a device comprising a processor and a computer-readable medium operably coupled to the processor, the computer-readable medium having computer-readable instructions stored thereon that, when executed by the processor, cause the apparatus to: illuminate the interface to generate the SHG signal and detect the SHG signal.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2019},
month = {12}
}

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