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Title: Method of characterizing the anisotropic, complex dielectric constant for materials with small dimensions

Abstract

A dielectric-coating based technique determines the refractive index of small dimension materials. The technique utilizes a sample of the small dimension material coated with the dielectric and an uncoated sample, where reflectivity is determined for each. The real and imaginary components of the refractive index can be determined for the small-dimension material itself.

Inventors:
;
Issue Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1600280
Patent Number(s):
10,475,710
Application Number:
16/035,330
Assignee:
UChicago Argonne, LLC (Chicago, IL)
DOE Contract Number:  
AC02-06CH11357
Resource Type:
Patent
Resource Relation:
Patent File Date: 07/13/2018
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY

Citation Formats

Guo, Peijun, and Schaller, Richard D. Method of characterizing the anisotropic, complex dielectric constant for materials with small dimensions. United States: N. p., 2019. Web.
Guo, Peijun, & Schaller, Richard D. Method of characterizing the anisotropic, complex dielectric constant for materials with small dimensions. United States.
Guo, Peijun, and Schaller, Richard D. Tue . "Method of characterizing the anisotropic, complex dielectric constant for materials with small dimensions". United States. https://www.osti.gov/servlets/purl/1600280.
@article{osti_1600280,
title = {Method of characterizing the anisotropic, complex dielectric constant for materials with small dimensions},
author = {Guo, Peijun and Schaller, Richard D.},
abstractNote = {A dielectric-coating based technique determines the refractive index of small dimension materials. The technique utilizes a sample of the small dimension material coated with the dielectric and an uncoated sample, where reflectivity is determined for each. The real and imaginary components of the refractive index can be determined for the small-dimension material itself.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2019},
month = {11}
}

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