System-independent characterization of materials using dual-energy computed tomography
Abstract
A system for characterizing the material of an object scanned via a dual-energy computed tomography scanner is provided. The system generates photoelectric and Compton sinograms based on a photoelectric-Compton decomposition of low-energy and high-energy sinograms generated from the scan and based on a scanner spectral response model. The system generates a Compton volume with Compton attenuation coefficients from the Compton sinogram and a photoelectric volume with photoelectric attenuation coefficients from the photoelectric sinogram. The system generates an estimated effective atomic number for a voxel and an estimated electron density for the voxel from the Compton attenuation coefficient and photoelectric coefficient for the voxel and scanner-specific parameters. The system then characterizes the material within the voxel based on the estimated effective atomic number and estimated electron density for the voxel. This information can be used to provide a mapping of known effective atomic numbers and known electron densities to known materials.
- Inventors:
- Issue Date:
- Research Org.:
- Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1600247
- Patent Number(s):
- 10466183
- Application Number:
- 15/339,821
- Assignee:
- Lawrence Livermore National Security, LLC (Livermore, CA)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G - PHYSICS G06 - COMPUTING G06T - IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- DOE Contract Number:
- AC52-07NA27344
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 10/31/2016
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
Citation Formats
Seetho, Isaac, Aufderheide, Maurice B., Azevedo, Stephen G., Brown, William D., Champley, Kyle, Schneberk, Daniel, Roberson, G. Patrick, Kallman, Jeffrey S., Martz, Jr., Harry E., and Smith, Jerel A. System-independent characterization of materials using dual-energy computed tomography. United States: N. p., 2019.
Web.
Seetho, Isaac, Aufderheide, Maurice B., Azevedo, Stephen G., Brown, William D., Champley, Kyle, Schneberk, Daniel, Roberson, G. Patrick, Kallman, Jeffrey S., Martz, Jr., Harry E., & Smith, Jerel A. System-independent characterization of materials using dual-energy computed tomography. United States.
Seetho, Isaac, Aufderheide, Maurice B., Azevedo, Stephen G., Brown, William D., Champley, Kyle, Schneberk, Daniel, Roberson, G. Patrick, Kallman, Jeffrey S., Martz, Jr., Harry E., and Smith, Jerel A. Tue .
"System-independent characterization of materials using dual-energy computed tomography". United States. https://www.osti.gov/servlets/purl/1600247.
@article{osti_1600247,
title = {System-independent characterization of materials using dual-energy computed tomography},
author = {Seetho, Isaac and Aufderheide, Maurice B. and Azevedo, Stephen G. and Brown, William D. and Champley, Kyle and Schneberk, Daniel and Roberson, G. Patrick and Kallman, Jeffrey S. and Martz, Jr., Harry E. and Smith, Jerel A.},
abstractNote = {A system for characterizing the material of an object scanned via a dual-energy computed tomography scanner is provided. The system generates photoelectric and Compton sinograms based on a photoelectric-Compton decomposition of low-energy and high-energy sinograms generated from the scan and based on a scanner spectral response model. The system generates a Compton volume with Compton attenuation coefficients from the Compton sinogram and a photoelectric volume with photoelectric attenuation coefficients from the photoelectric sinogram. The system generates an estimated effective atomic number for a voxel and an estimated electron density for the voxel from the Compton attenuation coefficient and photoelectric coefficient for the voxel and scanner-specific parameters. The system then characterizes the material within the voxel based on the estimated effective atomic number and estimated electron density for the voxel. This information can be used to provide a mapping of known effective atomic numbers and known electron densities to known materials.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2019},
month = {11}
}
Works referenced in this record:
SpekCalc : a program to calculate photon spectra from tungsten anode x-ray tubes
journal, September 2009
- Poludniowski, G.; Landry, G.; DeBlois, F.
- Physics in Medicine and Biology, Vol. 54, Issue 19
Spectral Calibration of Spectral Computed Tomography (CT)
patent-application, March 2018
- Jin, Yannan; Fu, Geng; Edic, Peter M.
- US Patent Application 15/273043; 20180078233
Energy-selective reconstructions in X-ray computerised tomography
journal, September 1976
- Alvarez, R. E.; Macovski, A.
- Physics in Medicine and Biology, Vol. 21, Issue 5
Dual-Energy Material Identification Method and Apparatus with Undersampling
patent-application, June 2012
- Chen, Zhiqiang; Zhang, Li; Liu, Yuanyuan
- US Patent Application 13/322243; 20120148133