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Title: System-independent characterization of materials using dual-energy computed tomography

Abstract

A system for characterizing the material of an object scanned via a dual-energy computed tomography scanner is provided. The system generates photoelectric and Compton sinograms based on a photoelectric-Compton decomposition of low-energy and high-energy sinograms generated from the scan and based on a scanner spectral response model. The system generates a Compton volume with Compton attenuation coefficients from the Compton sinogram and a photoelectric volume with photoelectric attenuation coefficients from the photoelectric sinogram. The system generates an estimated effective atomic number for a voxel and an estimated electron density for the voxel from the Compton attenuation coefficient and photoelectric coefficient for the voxel and scanner-specific parameters. The system then characterizes the material within the voxel based on the estimated effective atomic number and estimated electron density for the voxel. This information can be used to provide a mapping of known effective atomic numbers and known electron densities to known materials.

Inventors:
; ; ; ; ; ; ; ; ;
Issue Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1600247
Patent Number(s):
10,466,183
Application Number:
15/339,821
Assignee:
Lawrence Livermore National Security, LLC (Livermore, CA)
DOE Contract Number:  
AC52-07NA27344
Resource Type:
Patent
Resource Relation:
Patent File Date: 10/31/2016
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY

Citation Formats

Seetho, Isaac, Aufderheide, Maurice B., Azevedo, Stephen G., Brown, William D., Champley, Kyle, Schneberk, Daniel, Roberson, G. Patrick, Kallman, Jeffrey S., Martz, Jr., Harry E., and Smith, Jerel A. System-independent characterization of materials using dual-energy computed tomography. United States: N. p., 2019. Web.
Seetho, Isaac, Aufderheide, Maurice B., Azevedo, Stephen G., Brown, William D., Champley, Kyle, Schneberk, Daniel, Roberson, G. Patrick, Kallman, Jeffrey S., Martz, Jr., Harry E., & Smith, Jerel A. System-independent characterization of materials using dual-energy computed tomography. United States.
Seetho, Isaac, Aufderheide, Maurice B., Azevedo, Stephen G., Brown, William D., Champley, Kyle, Schneberk, Daniel, Roberson, G. Patrick, Kallman, Jeffrey S., Martz, Jr., Harry E., and Smith, Jerel A. Tue . "System-independent characterization of materials using dual-energy computed tomography". United States. https://www.osti.gov/servlets/purl/1600247.
@article{osti_1600247,
title = {System-independent characterization of materials using dual-energy computed tomography},
author = {Seetho, Isaac and Aufderheide, Maurice B. and Azevedo, Stephen G. and Brown, William D. and Champley, Kyle and Schneberk, Daniel and Roberson, G. Patrick and Kallman, Jeffrey S. and Martz, Jr., Harry E. and Smith, Jerel A.},
abstractNote = {A system for characterizing the material of an object scanned via a dual-energy computed tomography scanner is provided. The system generates photoelectric and Compton sinograms based on a photoelectric-Compton decomposition of low-energy and high-energy sinograms generated from the scan and based on a scanner spectral response model. The system generates a Compton volume with Compton attenuation coefficients from the Compton sinogram and a photoelectric volume with photoelectric attenuation coefficients from the photoelectric sinogram. The system generates an estimated effective atomic number for a voxel and an estimated electron density for the voxel from the Compton attenuation coefficient and photoelectric coefficient for the voxel and scanner-specific parameters. The system then characterizes the material within the voxel based on the estimated effective atomic number and estimated electron density for the voxel. This information can be used to provide a mapping of known effective atomic numbers and known electron densities to known materials.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2019},
month = {11}
}

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