Systems, methods, and structures for compound-specific coding mass spectrometry

Title: Systems, methods, and structures for compound-specific coding mass spectrometry

Abstract

Aspects of the present disclosure describe systems, methods, and structures for compound-specific coding mass spectrometry wherein compound-specific masks/codes are positioned between an ion source and detector of a mass spectrometer.

Inventors:: Gehm, Michael E.; Glass, Jeffrey T.; Amsden, Jason J.; Parker, Charles B.

Issue Date:: 2019-09-10

Research Org.:: Duke Univ., Durham, NC (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1576351

Patent Number(s):: 10410850

Application Number:: 16/167,144

Assignee:: Duke University (Durham, NC)

Patent Classifications (CPCs):: H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS

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H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J49/067 - {Ion lenses, apertures, skimmers}
H01J49/284 - {using electrostatic and magnetic sectors with simple focusing, e.g. with parallel fields such as Aston spectrometer}
H01J49/20 - Magnetic deflection
H01J49/025 - {Detectors specially adapted to particle spectrometers

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DOE Contract Number:: AR0000546

Resource Type:: Patent

Resource Relation:: Patent File Date: 2018 Oct 22

Country of Publication:: United States

Language:: English

Citation Formats


                    Gehm, Michael E., Glass, Jeffrey T., Amsden, Jason J., and Parker, Charles B. Systems, methods, and structures for compound-specific coding mass spectrometry.  United States: N. p., 2019. 
        Web.

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                    Gehm, Michael E., Glass, Jeffrey T., Amsden, Jason J., & Parker, Charles B. Systems, methods, and structures for compound-specific coding mass spectrometry.  United States.

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                    Gehm, Michael E., Glass, Jeffrey T., Amsden, Jason J., and Parker, Charles B. Tue .  
        "Systems, methods, and structures for compound-specific coding mass spectrometry".  United States.  https://www.osti.gov/servlets/purl/1576351.

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@article{osti_1576351,

  title        = {Systems, methods, and structures for compound-specific coding mass spectrometry},

  author       = {Gehm, Michael E. and Glass, Jeffrey T. and Amsden, Jason J. and Parker, Charles B.},

  abstractNote = {Aspects of the present disclosure describe systems, methods, and structures for compound-specific coding mass spectrometry wherein compound-specific masks/codes are positioned between an ion source and detector of a mass spectrometer.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {2019},

  month        = {9}

}

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Works referenced in this record:

Method for calibrating a mass spectrometer
patent, June 2003

Weinberger, Scot R.; Gavin, Edward J.; Youngquist, Michael G.
US Patent Document 6,580,071
URL: http://patft.uspto.gov/netacgi/nph-Parser?patentnumber=6580071

Ionization chamber for reactive samples
patent, August 2003

Perkins, Patrick D.; Kernan, Jeffrey T.
US Patent Document 6,608,318
URL: http://patft.uspto.gov/netacgi/nph-Parser?patentnumber=6608318

Ion sources, systems and methods
patent, April 2009

Ward, Billy W.; Notte, IV, John A.; Farkas, III, Louis S.
US Patent Document 7,521,693
URL: http://patft.uspto.gov/netacgi/nph-Parser?patentnumber=7521693

Material deposition techniques for control of solid state aperture surface properties
patent, June 2012

Branton, Daniel; Gordon, Roy; Chen, Peng
US Patent Document 8,206,568
URL: http://patft.uspto.gov/netacgi/nph-Parser?patentnumber=8206568

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Title: Systems, methods, and structures for compound-specific coding mass spectrometry

Abstract

Citation Formats

Method for calibrating a mass spectrometer patent, June 2003

Ionization chamber for reactive samples patent, August 2003

Ion sources, systems and methods patent, April 2009

Material deposition techniques for control of solid state aperture surface properties patent, June 2012

Method for calibrating a mass spectrometer
patent, June 2003

Ionization chamber for reactive samples
patent, August 2003

Ion sources, systems and methods
patent, April 2009

Material deposition techniques for control of solid state aperture surface properties
patent, June 2012