Sparse sampling methods and probe systems for analytical instruments
Abstract
Sparse sampling approaches and probe systems for analytical instruments are disclosed providing for effective sub-sampling of a specimen and inpainting to reconstruct representations of actual information. The sub-sampling involves serial acquisition of contiguous measured values lying at positions along a scan path extending in a line toward a first direction and having random perturbations in a second direction. The perturbations are limited within a predetermined distance from the line. Inpainting techniques are utilized among the measured values to reconstruct a representation of actual information regarding the specimen.
- Inventors:
- Issue Date:
- Research Org.:
- Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1576261
- Patent Number(s):
- 10,431,419
- Application Number:
- 15/643,862
- Assignee:
- Battelle Memorial Institute (Richland, WA)
- DOE Contract Number:
- AC05-76RL01830
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2017 Jul 07
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Kovarik, Libor, Stevens, Andrew J., Liyu, Andrey V., and Browning, Nigel D. Sparse sampling methods and probe systems for analytical instruments. United States: N. p., 2019.
Web.
Kovarik, Libor, Stevens, Andrew J., Liyu, Andrey V., & Browning, Nigel D. Sparse sampling methods and probe systems for analytical instruments. United States.
Kovarik, Libor, Stevens, Andrew J., Liyu, Andrey V., and Browning, Nigel D. Tue .
"Sparse sampling methods and probe systems for analytical instruments". United States. https://www.osti.gov/servlets/purl/1576261.
@article{osti_1576261,
title = {Sparse sampling methods and probe systems for analytical instruments},
author = {Kovarik, Libor and Stevens, Andrew J. and Liyu, Andrey V. and Browning, Nigel D.},
abstractNote = {Sparse sampling approaches and probe systems for analytical instruments are disclosed providing for effective sub-sampling of a specimen and inpainting to reconstruct representations of actual information. The sub-sampling involves serial acquisition of contiguous measured values lying at positions along a scan path extending in a line toward a first direction and having random perturbations in a second direction. The perturbations are limited within a predetermined distance from the line. Inpainting techniques are utilized among the measured values to reconstruct a representation of actual information regarding the specimen.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2019},
month = {10}
}
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Works referenced in this record:
Sparse Sampling And Reconstruction For Electron And Scanning Probe Microscope Imaging
patent-application, March 2015
- Anderson, Hyrum; Helms, Jovana; Wheeler, Jason
- US Patent Application 14/482754; 20150069233