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Title: Sparse sampling methods and probe systems for analytical instruments

Abstract

Sparse sampling approaches and probe systems for analytical instruments are disclosed providing for effective sub-sampling of a specimen and inpainting to reconstruct representations of actual information. The sub-sampling involves serial acquisition of contiguous measured values lying at positions along a scan path extending in a line toward a first direction and having random perturbations in a second direction. The perturbations are limited within a predetermined distance from the line. Inpainting techniques are utilized among the measured values to reconstruct a representation of actual information regarding the specimen.

Inventors:
; ; ;
Issue Date:
Research Org.:
Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1576261
Patent Number(s):
10431419
Application Number:
15/643,862
Assignee:
Battelle Memorial Institute (Richland, WA)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01Q - SCANNING-PROBE TECHNIQUES OR APPARATUS
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
DOE Contract Number:  
AC05-76RL01830
Resource Type:
Patent
Resource Relation:
Patent File Date: 2017 Jul 07
Country of Publication:
United States
Language:
English

Citation Formats

Kovarik, Libor, Stevens, Andrew J., Liyu, Andrey V., and Browning, Nigel D. Sparse sampling methods and probe systems for analytical instruments. United States: N. p., 2019. Web.
Kovarik, Libor, Stevens, Andrew J., Liyu, Andrey V., & Browning, Nigel D. Sparse sampling methods and probe systems for analytical instruments. United States.
Kovarik, Libor, Stevens, Andrew J., Liyu, Andrey V., and Browning, Nigel D. Tue . "Sparse sampling methods and probe systems for analytical instruments". United States. https://www.osti.gov/servlets/purl/1576261.
@article{osti_1576261,
title = {Sparse sampling methods and probe systems for analytical instruments},
author = {Kovarik, Libor and Stevens, Andrew J. and Liyu, Andrey V. and Browning, Nigel D.},
abstractNote = {Sparse sampling approaches and probe systems for analytical instruments are disclosed providing for effective sub-sampling of a specimen and inpainting to reconstruct representations of actual information. The sub-sampling involves serial acquisition of contiguous measured values lying at positions along a scan path extending in a line toward a first direction and having random perturbations in a second direction. The perturbations are limited within a predetermined distance from the line. Inpainting techniques are utilized among the measured values to reconstruct a representation of actual information regarding the specimen.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2019},
month = {10}
}

Works referenced in this record:

System for locating a feature of a surface
patent, February 1999


Probe scanning method
patent, June 2003


Scan Data Collection for Better Overall Data Accuracy
patent-application, August 2006


Efficient Method for Selecting Representative Elementary Volume in Digital Representations of Porous Media
patent-application, October 2013


Sparse Sampling And Reconstruction For Electron And Scanning Probe Microscope Imaging
patent-application, March 2015


Mathmatical Image Assembly in a Scanning-Type Microscope
patent-application, December 2015


Digital Rock Physics-Based Trend Determination and Usage for Upscaling
patent-application, January 2017