In situ environmentally-isolated wear tester
Abstract
The present invention relates to an in situ testing system, which includes a wear tester and an enclosure. The wear tester is configured to apply a normal load, by way of a tip, to a surface of the test sample. Use of an enclosure allows such wear testing to be conducted in a controlled environment.
- Inventors:
- Issue Date:
- Research Org.:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Org.:
- USDOE National Nuclear Security Administration (NNSA)
- OSTI Identifier:
- 1576255
- Patent Number(s):
- 10429284
- Application Number:
- 15/659,467
- Assignee:
- National Technology & Engineering Solutions of Sandia, LLC (Albuquerque, NM)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- DOE Contract Number:
- NA0003525
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2017 Jul 25
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE
Citation Formats
Nation, Brendan L., and Argibay, Nicolas. In situ environmentally-isolated wear tester. United States: N. p., 2019.
Web.
Nation, Brendan L., & Argibay, Nicolas. In situ environmentally-isolated wear tester. United States.
Nation, Brendan L., and Argibay, Nicolas. Tue .
"In situ environmentally-isolated wear tester". United States. https://www.osti.gov/servlets/purl/1576255.
@article{osti_1576255,
title = {In situ environmentally-isolated wear tester},
author = {Nation, Brendan L. and Argibay, Nicolas},
abstractNote = {The present invention relates to an in situ testing system, which includes a wear tester and an enclosure. The wear tester is configured to apply a normal load, by way of a tip, to a surface of the test sample. Use of an enclosure allows such wear testing to be conducted in a controlled environment.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2019},
month = {10}
}
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Works referenced in this record:
Data collection method, substrate processing apparatus, and substrate processing system
patent, February 2009
- Osada, Shin
- US Patent Document 7,490,010
Scanning probe microscope apparatus for use in a scanning electron
patent, October 1995
- Ho, Huddee; West, Paul E.
- US Patent Document 5,455,420
Apparatus and Methods for Affinity Capture Tandem Mass Spectrometry
patent-application, December 2002
- Weinberger, Scot R.; Ens, Werner; Laboda, Alexander
- US Patent Application 10/095259; 20020195555
Vacuum Processing Device and Mass Analyzing Device
patent-application, January 2019
- Matsushita, Tomoyoshi
- US Patent Application 15/777352; 20190033256
Pattern Inspection Method and Pattern Inspection Apparatus
patent-application, August 2014
- Isomura, Ikunao
- US Patent Application 14/185588; 20140241611
Substrate Supporting Apparatus, Substrate Supporting Method, Semiconductor Manufacturing Apparatus and Storage Medium
patent-application, April 2009
- Kondoh, Keisuke
- US Patent Application 12/209687; 20090087932
Portable universal friction testing machine and method
patent, February 2002
- Mani, Neel K.; Roth, Vladimir; Olesky, S. J.
- US Patent Document 6,349,587
Diamond-dispersed fiber-reinforced composite for superior friction and wear properties in extreme environments and method for fabricating the same
patent, February 2017
- Street, Kenneth; Voronov, Oleg A.; Kear, Bernard H.
- US Patent Document 9,574,080
Sample holding mechanism and sample working/observing apparatus
patent, August 2009
- Hasuda, Masakatsu; Okabe, Mamoru
- US Patent Document 7,574,932