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Title: In situ environmentally-isolated wear tester

Abstract

The present invention relates to an in situ testing system, which includes a wear tester and an enclosure. The wear tester is configured to apply a normal load, by way of a tip, to a surface of the test sample. Use of an enclosure allows such wear testing to be conducted in a controlled environment.

Inventors:
;
Issue Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1576255
Patent Number(s):
10429284
Application Number:
15/659,467
Assignee:
National Technology & Engineering Solutions of Sandia, LLC (Albuquerque, NM)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
DOE Contract Number:  
NA0003525
Resource Type:
Patent
Resource Relation:
Patent File Date: 2017 Jul 25
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Nation, Brendan L., and Argibay, Nicolas. In situ environmentally-isolated wear tester. United States: N. p., 2019. Web.
Nation, Brendan L., & Argibay, Nicolas. In situ environmentally-isolated wear tester. United States.
Nation, Brendan L., and Argibay, Nicolas. Tue . "In situ environmentally-isolated wear tester". United States. https://www.osti.gov/servlets/purl/1576255.
@article{osti_1576255,
title = {In situ environmentally-isolated wear tester},
author = {Nation, Brendan L. and Argibay, Nicolas},
abstractNote = {The present invention relates to an in situ testing system, which includes a wear tester and an enclosure. The wear tester is configured to apply a normal load, by way of a tip, to a surface of the test sample. Use of an enclosure allows such wear testing to be conducted in a controlled environment.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2019},
month = {10}
}

Works referenced in this record:

Apparatus and Methods for Affinity Capture Tandem Mass Spectrometry
patent-application, December 2002


Part-inspecting system
patent, July 2001


Vacuum Processing Device and Mass Analyzing Device
patent-application, January 2019


Pattern Inspection Method and Pattern Inspection Apparatus
patent-application, August 2014


Portable universal friction testing machine and method
patent, February 2002


Sample holding mechanism and sample working/observing apparatus
patent, August 2009