Method and apparatus for wavefront sensing
Abstract
A method for performing optical wavefront sensing includes providing an amplitude transmission mask having a light input side, a light output side, and an optical transmission axis passing from the light input side to the light output side. The amplitude transmission mask is characterized by a checkerboard pattern having a square unit cell of size Λ. The method also includes directing an incident light field having a wavelength λ to be incident on the light input side and propagating the incident light field through the amplitude transmission mask. The method further includes producing a plurality of diffracted light fields on the light output side and detecting, at a detector disposed a distance L from the amplitude transmission mask, an interferogram associated with the plurality of diffracted light fields. The relation is satisfied, where n is an integer greater than zero.
- Inventors:
- Issue Date:
- Research Org.:
- Ram Photonics, LLC, San Diego, CA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1568700
- Patent Number(s):
- 10371580
- Application Number:
- 15/903,489
- Assignee:
- Ram Photonics, LLC (San Diego, CA)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01B - MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS
G - PHYSICS G01 - MEASURING G01J - MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT
- DOE Contract Number:
- FC52-08NA28302
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 02/23/2018
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
Citation Formats
Bahk, Seung-Whan. Method and apparatus for wavefront sensing. United States: N. p., 2019.
Web.
Bahk, Seung-Whan. Method and apparatus for wavefront sensing. United States.
Bahk, Seung-Whan. Tue .
"Method and apparatus for wavefront sensing". United States. https://www.osti.gov/servlets/purl/1568700.
@article{osti_1568700,
title = {Method and apparatus for wavefront sensing},
author = {Bahk, Seung-Whan},
abstractNote = {A method for performing optical wavefront sensing includes providing an amplitude transmission mask having a light input side, a light output side, and an optical transmission axis passing from the light input side to the light output side. The amplitude transmission mask is characterized by a checkerboard pattern having a square unit cell of size Λ. The method also includes directing an incident light field having a wavelength λ to be incident on the light input side and propagating the incident light field through the amplitude transmission mask. The method further includes producing a plurality of diffracted light fields on the light output side and detecting, at a detector disposed a distance L from the amplitude transmission mask, an interferogram associated with the plurality of diffracted light fields. The relation is satisfied, where n is an integer greater than zero.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Aug 06 00:00:00 EDT 2019},
month = {Tue Aug 06 00:00:00 EDT 2019}
}
Works referenced in this record:
Optical pulse measurement using shearing interferometry, especially suitable for characterizing ultrashort pulses
patent, October 2003
- Walmsley, Ian; Dorrer, Christophe
- US Patent Document 6,633,386
Complex index refraction tomography with sub λ/6-resolution
patent, January 2015
- Cotte, Yann; Pavillon, Nicolas; Depeursinge, Christian
- US Patent Document 8,937,722
Wavefront Measuring Apparatus, Wavefront Measuring Method, and Computer-Readable Medium Storing Program
patent-application, February 2013
- Kondoh, Takeshi
- US Patent Application 13/561824; 20130032727
Broadband ultrashort pulse measuring device using non-linear electronic components
patent, February 2000
- Diddams, Scott; Diels, Jean-Claude; Steffen, Prien
- US Patent Document 6,025,911
Method and apparatus for pattern analysis
patent, November 1976
- Ginsburg, Arthur P.
- US Patent Document 3,993,976
Apparatus and Method for Segmenting Edges for Optical Proximity Correction
patent-application, November 2006
- Sezginer, Abdurrahman; Yenikaya, Bayram; Huang, Hsu-Ting
- US Patent Application 11/203498; 20060248496
X-Ray Imaging Apparatus
patent-application, March 2013
- Ouchi, Chidane
- US Patent Application 13/610365; 20130070895
System and methods for wavefront measurement
patent, October 2008
- Horwitz, Larry S.
- US Patent Document 7,440,115
Simulation-Based Feed Forward Process Control
patent-application, June 2003
- Weed, J. Tracy
- US Patent Application 10/033511; 20030119216
Method and Apparatus for Wavefront Sensing
patent-application, October 2015
- Bahk, Seung-Whan
- US Patent Application 14/587392; 20150300885
Compact achromatic optical interferometer of the three-wave lateral shearing type
patent, November 2010
- Primot, Jerome; Guerineau, Nicolas; Velghe, Sabrina
- US Patent Document 7,826,066
Complex Index Refraction Tomography with Sub Lambda/6-Resolution
patent-application, March 2013
- Cotte, Yann; Pavillon, Nicolas; Depeursinge, Christian
- US Patent Application 13/637928; 20130057869
Measurement Method, Measurement Apparatus, and Method of Manufacturing Optical System
patent-application, December 2009
- Aoki, Eiji
- US Patent Application 12/471145; 20090294628
Metal Nanowire Based Bandpass Filter Arrays in the Optical Frequency Range
patent-application, June 2008
- Kim, Hong Koo; Sun, Zhijun; Jung, Yun Suk
- US Patent Application 11/345673; 20080135739
4F-Based Optical Phase Imaging System
patent-application, February 2015
- Palima, Darwin Z.; Gluckstad, Jesper
- US Patent Application 14/370661; 20150042780
Coded aperture imager comprising a coded diffractive mask
patent, April 2011
- Slinger, Christopher William
- US Patent Document 7,923,677
Method for aligning first and second objects, relative to each other, and apparatus for practicing this method
patent, July 1989
- Uchida, Norio; Ishibashi, Yoriyuki; Masuyama, Masayuki
- US Patent Document 4,848,911
Method and Apparatus for Wavefront Sensing
patent-application, February 2017
- Bahk, Seung-Whan
- US Patent Application 15/209535; 20170038261
Lensometers and Wavefront Sensors and Methods of Measuring Aberration
patent-application, May 2005
- Warden, Laurence; Ferro, John; Dreher, Andreas W.
- US Patent Application 10/971937; 20050105044
Methods and Apparatus for Determining Characteristics of Particles
patent-application, September 2010
- Trainer, Michael
- US Patent Application 12/784719; 20100225913
Method and Apparatus for Enhanced Spatial Bandwidth Wavefronts Reconstructed from Digital Interferograms or Holograms
patent-application, May 2012
- Pavillon, Nicolas; Seelamantula, Chandra Sekhar; Unser, Michael
- US Patent Application 13/266027; 20120116703
Method and Apparatus for Printing Periodic Patterns Using Multiple Lasers
patent-application, October 2014
- Solak, Harun; Clube, Francis; Dais, Christian
- US Patent Application 14/123330; 20140307242
Systems and Methods for Wavefront Analysis over Circular and Noncircular Pupils
patent-application, September 2013
- Dai, Guang-Ming; Mahajan, Virendra N.
- US Patent Application 13/871143; 20130246493
Methods and Apparatus for Determining Characteristics of Particles
patent-application, June 2014
- Trainer, Michael
- US Patent Application 14/157961; 20140152986
Optical Pulse Measurement
patent-application, February 2003
- Walmsley, Ian A.; Dorrer, Christophe
- US Patent Application 10/200982; 20030025911
Frequency transform phase shifting interferometry
patent, April 2005
- Deck, Leslie L.
- US Patent Document 6,882,432