Characterization of trace crystallinity by second harmonic generation microscopy

Simpson, Garth Jason; Schmitt, Paul David

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Title: Characterization of trace crystallinity by second harmonic generation microscopy

Abstract

A method for quantifying crystallinity within a sample using second harmonic generation microscopy is described herein. In one aspect, a method for reducing the timeframe for accelerated stability testing of amorphous solid dispersions of active pharmaceutical ingredients though identifying regions of interest to quantify crystallinity and composition is presented herein.

Inventors:: Simpson, Garth Jason; Schmitt, Paul David

Issue Date:: 2019-06-04

Research Org.:: Purdue Univ., West Lafayette, IN (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1568429

Patent Number(s):: 10309902

Application Number:: 15/514,893

Assignee:: Purdue Research Foundation (West Lafayette, IN)

Patent Classifications (CPCs):: G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

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G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N21/636 - {using an arrangement of pump beam and probe beam
G01N21/65 - Raman scattering
G01N2223/606 - texture
G01N2223/612 - biological material
G01N23/207 - Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

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DOE Contract Number:: SC0000997

Resource Type:: Patent

Resource Relation:: Patent File Date: 09/28/2015

Country of Publication:: United States

Language:: English

Citation Formats


                    Simpson, Garth Jason, and Schmitt, Paul David. Characterization of trace crystallinity by second harmonic generation microscopy.  United States: N. p., 2019. 
        Web.

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                    Simpson, Garth Jason, & Schmitt, Paul David. Characterization of trace crystallinity by second harmonic generation microscopy.  United States.

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                    Simpson, Garth Jason, and Schmitt, Paul David. Tue .  
        "Characterization of trace crystallinity by second harmonic generation microscopy".  United States.  https://www.osti.gov/servlets/purl/1568429.

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@article{osti_1568429,

  title        = {Characterization of trace crystallinity by second harmonic generation microscopy},

  author       = {Simpson, Garth Jason and Schmitt, Paul David},

  abstractNote = {A method for quantifying crystallinity within a sample using second harmonic generation microscopy is described herein. In one aspect, a method for reducing the timeframe for accelerated stability testing of amorphous solid dispersions of active pharmaceutical ingredients though identifying regions of interest to quantify crystallinity and composition is presented herein.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {2019},

  month        = {6}

}

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Works referenced in this record:

Scanning Microscope Device
patent-application, November 2010

Sasaki, Hiroshi; Nakata, Tatsuo
US Patent Application 12/784643; 20100294949
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20100294949

Methods, Systems, and Apparatus for Size-based Particle Separation
patent-application, April 2014

Ros, Alexandra; Abdallah, Bahige G.; Chao, Tzu-Chiao
US Patent Application 14/041712; 20140091012
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20140091012

Apparatus and method for high-throughput preparation, visualization and screening of compositions
patent-application, June 2003

Levinson, Douglas; McNulty, Christopher; Johnson, Alasdair Y.
US Patent Application 10/235554; 20030106492
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20030106492

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Title: Characterization of trace crystallinity by second harmonic generation microscopy

Abstract

Citation Formats

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patent-application, April 2014

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