Optical quantification of interfacial charge states

Geiger, Franz M.; Ohno, Paul E.; Wang, Hong-fei; Eisenthal, Kenneth B.

Title: Optical quantification of interfacial charge states

Abstract

Methods of generating second harmonic generation (SHG) signals from interfaces formed with, or formed over, a noncentrosymmetric material, e.g., α-quartz, are provided. The methods make use of the noncentrosymmetric material as an internal phase reference for the determination of a variety of interfacial electrostatic parameters, including interfacial potential, interfacial charge density, and the sign of the interfacial charge (i.e., net positive or net negative).

Inventors:: Geiger, Franz M.; Ohno, Paul E.; Wang, Hong-fei; Eisenthal, Kenneth B.

Issue Date:: 2019-04-30

Research Org.:: Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1568274

Patent Number(s):: 10274807

Application Number:: 15/834,250

Assignee:: Northwestern University (Evanston, IL); Battelle Memorial Institute (Columbus, OH); The Trustees of Columbia University in the City of New York (New York, NY)

Patent Classifications (CPCs):: G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

G - PHYSICS G02 - OPTICS G02F - DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING

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G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N21/636 - {using an arrangement of pump beam and probe beam
G01N21/84 - Systems specially adapted for particular applications
G01N21/8422 - {Investigating thin films, e.g. matrix isolation method}

G - PHYSICS G02 - OPTICS G02F - DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING
G02F1/35 - Non-linear optics
G02F1/3532 - {Arrangements of plural nonlinear devices for generating multi-colour light beams, e.g. arrangements of SHG, SFG, OPO devices for generating RGB light beams}
G02F1/355 - characterised by the materials used
G02F1/37 - for second-harmonic generation {
G02F1/377 - in an optical waveguide structure

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DOE Contract Number:: AC05-76RL01830; CHE1057483; CHE1464916

Resource Type:: Patent

Resource Relation:: Patent File Date: 12/07/2017

Country of Publication:: United States

Language:: English

Citation Formats


                    Geiger, Franz M., Ohno, Paul E., Wang, Hong-fei, and Eisenthal, Kenneth B.. Optical quantification of interfacial charge states.  United States: N. p., 2019. 
        Web.

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                    Geiger, Franz M., Ohno, Paul E., Wang, Hong-fei, & Eisenthal, Kenneth B.. Optical quantification of interfacial charge states.  United States.

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                    Geiger, Franz M., Ohno, Paul E., Wang, Hong-fei, and Eisenthal, Kenneth B.. Tue .  
        "Optical quantification of interfacial charge states".  United States.  https://www.osti.gov/servlets/purl/1568274.

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@article{osti_1568274,

  title        = {Optical quantification of interfacial charge states},

  author       = {Geiger, Franz M. and Ohno, Paul E. and Wang, Hong-fei and Eisenthal, Kenneth B.},

  abstractNote = {Methods of generating second harmonic generation (SHG) signals from interfaces formed with, or formed over, a noncentrosymmetric material, e.g., α-quartz, are provided. The methods make use of the noncentrosymmetric material as an internal phase reference for the determination of a variety of interfacial electrostatic parameters, including interfacial potential, interfacial charge density, and the sign of the interfacial charge (i.e., net positive or net negative).},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {2019},

  month        = {4}

}

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Works referenced in this record:

Method and Apparatus Using a Surface-Selective Nonlinear Optical Technique for Detection of Probe-Target Interactions Without Labels
patent-application, June 2005

Salafsky, Joshua S.
US Patent Application 10/970754; 20050118731
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Apparatus and methods of using second harmonic generation as a non-invasive optical probe for interface properties in layered structures
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Alles, Michael Lee; Tolk, Norman H.; Jun, Bongim
US Patent Document 7,158,284
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7158284

Device and method for measuring and imaging second harmonic and multi-photon generation scattered radiation
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Roke, Sylvie; Macias Romero, Carlos
US Patent Document 9,778,177
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/9778177

Methods for Detecting Allosteric Modulators of Protein
patent-application, October 2013

Salafsky, Joshua S.
US Patent Application 13/794277; 20130288271
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20130288271

Surface plasmon resonance microscope using common-path phase-shift interferometry
patent, March 2008

Su, Yuan Deng; Chen, Shean-Jen
US Patent Document 7,339,681
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7339681

Detection of interfaces with atomic resolution during material processing by optical second harmonic generation
patent, March 1994

Heinz, Tony F.; Selwyn, Gary S.; Singh, Syothi
US Patent Document 5,294,289
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Title: Optical quantification of interfacial charge states

Abstract

Citation Formats

Method and Apparatus Using a Surface-Selective Nonlinear Optical Technique for Detection of Probe-Target Interactions Without Labels patent-application, June 2005

Apparatus and methods of using second harmonic generation as a non-invasive optical probe for interface properties in layered structures patent, January 2007

Device and method for measuring and imaging second harmonic and multi-photon generation scattered radiation patent, October 2017

Methods for Detecting Allosteric Modulators of Protein patent-application, October 2013

Surface plasmon resonance microscope using common-path phase-shift interferometry patent, March 2008

Detection of interfaces with atomic resolution during material processing by optical second harmonic generation patent, March 1994

Method and Apparatus Using a Surface-Selective Nonlinear Optical Technique for Detection of Probe-Target Interactions Without Labels
patent-application, June 2005

Apparatus and methods of using second harmonic generation as a non-invasive optical probe for interface properties in layered structures
patent, January 2007

Device and method for measuring and imaging second harmonic and multi-photon generation scattered radiation
patent, October 2017

Methods for Detecting Allosteric Modulators of Protein
patent-application, October 2013

Surface plasmon resonance microscope using common-path phase-shift interferometry
patent, March 2008

Detection of interfaces with atomic resolution during material processing by optical second harmonic generation
patent, March 1994