Aerosol ionizer

Brechtel, Fredrick J.; Lopez-Yglesias, Xerxes

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A - human necessities
A01 - agriculture
A21 - baking
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A24 - tobacco
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Title: Aerosol ionizer

Abstract

A system and method comprising an ion production chamber having an ultra-violet light source disposed towards said chamber, a coated quartz plate between the chamber and the UV source whose coating absorbs incident UV light and ejects electrons into the chamber through the photoelectric effect, a harvest gas disposed to flow through the chamber from an inlet to an outlet, and a jet operable to introduce a sample into the harvest gas flow. In some embodiments the system includes using helium as the harvest gas. Certain embodiments include introducing a sample perpendicular to the harvest gas flow and using multiple sample introduction jets to increase mixing efficiency. In some embodiments the harvest gas and particle sample jet are one and the same. The charge sample may be coupled to a MEMS-based electrometer.

Inventors:: Brechtel, Fredrick J.; Lopez-Yglesias, Xerxes

Issue Date:: 2019-04-16

Research Org.:: Brechtel Manufacturing, Inc., Hayward, CA (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1568204

Patent Number(s):: 10261049

Application Number:: 16/032,874

Assignee:: Brechtel Manufacturing, Inc. (Hayward, CA)

Patent Classifications (CPCs):: G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES

Show more

G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N27/624 - {using a non-uniform electric field, i.e. differential mobility spectrometry [DMS] or high-field asymmetric-waveform ion-mobility spectrometry [FAIMS]}
G01N27/66 - and measuring current or voltage

G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES
G01R29/24 - Arrangements for measuring quantities of charge

H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J27/02 - Ion sources
H01J49/145 - {using chemical ionisation}
H01J49/161 - {using photoionisation, e.g. by laser}

Show less

DOE Contract Number:: SC0015069

Resource Type:: Patent

Resource Relation:: Patent File Date: 07/11/2018

Country of Publication:: United States

Language:: English

Citation Formats


                    Brechtel, Fredrick J., and Lopez-Yglesias, Xerxes. Aerosol ionizer.  United States: N. p., 2019. 
        Web.

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                    Brechtel, Fredrick J., & Lopez-Yglesias, Xerxes. Aerosol ionizer.  United States.

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                    Brechtel, Fredrick J., and Lopez-Yglesias, Xerxes. Tue .  
        "Aerosol ionizer".  United States.  https://www.osti.gov/servlets/purl/1568204.

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@article{osti_1568204,

  title        = {Aerosol ionizer},

  author       = {Brechtel, Fredrick J. and Lopez-Yglesias, Xerxes},

  abstractNote = {A system and method comprising an ion production chamber having an ultra-violet light source disposed towards said chamber, a coated quartz plate between the chamber and the UV source whose coating absorbs incident UV light and ejects electrons into the chamber through the photoelectric effect, a harvest gas disposed to flow through the chamber from an inlet to an outlet, and a jet operable to introduce a sample into the harvest gas flow. In some embodiments the system includes using helium as the harvest gas. Certain embodiments include introducing a sample perpendicular to the harvest gas flow and using multiple sample introduction jets to increase mixing efficiency. In some embodiments the harvest gas and particle sample jet are one and the same. The charge sample may be coupled to a MEMS-based electrometer.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {2019},

  month        = {4}

}

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Works referenced in this record:

Sampling and analysis of airborne particulate matter by glow discharge atomic emission and mass spectrometries
patent, June 2004

Marcus, R. Kenneth
US Patent Document 6,750,449
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Electron attachment apparatus and method
patent, December 1987

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Method and apparatus for providing flow-stabilized microdischarges in metal capillaries
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Corona ionization device and method
patent, September 2016

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Hollow electrode plasma excitation source
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Photoelectron generating plate, negative particle generating device and charge removing device and equipment using such device
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Aerosol ionizer
patent, September 2017

Brechtel, Fredrick J.; Lopez-Yglesias, Xerxes
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Remote reagent ion generator
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Aerosol Ionizer
patent-application, December 2017

Brechtel, Fredrick J.; Lopez-Yglesias, Xerxes
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Similar Records

Title: Aerosol ionizer

Abstract

Citation Formats

Sampling and analysis of airborne particulate matter by glow discharge atomic emission and mass spectrometries patent, June 2004

Electron attachment apparatus and method patent, December 1987

Method and apparatus for providing flow-stabilized microdischarges in metal capillaries patent, March 2004

Corona ionization device and method patent, September 2016

Ionization of desorbed molecules patent, March 2009

Hollow electrode plasma excitation source patent, April 1992

Photoelectron generating plate, negative particle generating device and charge removing device and equipment using such device patent, November 2010

Plasma ion implantation systems and methods using solid source of dopant material patent, February 2008

UV-LED ionization source and process for low energy photoemission ionization patent, January 2013

Aerosol ionizer patent, September 2017

Remote reagent ion generator patent, August 2009

Source for plasma of large transverse section and constituting an ion accelerator patent, June 1980

Discharge Ionization Detector patent-application, November 2016

Dual-channel photo-ionization detector that eliminates the effect of ultraviolet intensity on concentration measurements patent, November 2001

Aerosol Ionizer patent-application, December 2017

Method for charging particles suspended in gases patent, March 1986

Method and apparatus for ionizing gases using UV radiation and electrons and identifying said gases patent, June 2014

Microplasma-based sample ionizing device and methods of use thereof patent, October 2010

Combined ambient desorption and ionization source for mass spectrometry patent, December 2008

Non-radioactive ion source using high energy electrons patent, April 2015

Sampling and analysis of airborne particulate matter by glow discharge atomic emission and mass spectrometries
patent, June 2004

Electron attachment apparatus and method
patent, December 1987

Method and apparatus for providing flow-stabilized microdischarges in metal capillaries
patent, March 2004

Corona ionization device and method
patent, September 2016

Ionization of desorbed molecules
patent, March 2009

Hollow electrode plasma excitation source
patent, April 1992

Photoelectron generating plate, negative particle generating device and charge removing device and equipment using such device
patent, November 2010

Plasma ion implantation systems and methods using solid source of dopant material
patent, February 2008

UV-LED ionization source and process for low energy photoemission ionization
patent, January 2013

Aerosol ionizer
patent, September 2017

Remote reagent ion generator
patent, August 2009

Source for plasma of large transverse section and constituting an ion accelerator
patent, June 1980

Discharge Ionization Detector
patent-application, November 2016

Dual-channel photo-ionization detector that eliminates the effect of ultraviolet intensity on concentration measurements
patent, November 2001

Aerosol Ionizer
patent-application, December 2017

Method for charging particles suspended in gases
patent, March 1986

Method and apparatus for ionizing gases using UV radiation and electrons and identifying said gases
patent, June 2014

Microplasma-based sample ionizing device and methods of use thereof
patent, October 2010

Combined ambient desorption and ionization source for mass spectrometry
patent, December 2008

Non-radioactive ion source using high energy electrons
patent, April 2015