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Title: Aerosol ionizer

Abstract

A system and method comprising an ion production chamber having an ultra-violet light source disposed towards said chamber, a coated quartz plate between the chamber and the UV source whose coating absorbs incident UV light and ejects electrons into the chamber through the photoelectric effect, a harvest gas disposed to flow through the chamber from an inlet to an outlet, and a jet operable to introduce a sample into the harvest gas flow. In some embodiments the system includes using helium as the harvest gas. Certain embodiments include introducing a sample perpendicular to the harvest gas flow and using multiple sample introduction jets to increase mixing efficiency. In some embodiments the harvest gas and particle sample jet are one and the same. The charge sample may be coupled to a MEMS-based electrometer.

Inventors:
;
Issue Date:
Research Org.:
Brechtel Manufacturing, Inc., Hayward, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1568204
Patent Number(s):
10261049
Application Number:
16/032,874
Assignee:
Brechtel Manufacturing, Inc. (Hayward, CA)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
DOE Contract Number:  
SC0015069
Resource Type:
Patent
Resource Relation:
Patent File Date: 07/11/2018
Country of Publication:
United States
Language:
English

Citation Formats

Brechtel, Fredrick J., and Lopez-Yglesias, Xerxes. Aerosol ionizer. United States: N. p., 2019. Web.
Brechtel, Fredrick J., & Lopez-Yglesias, Xerxes. Aerosol ionizer. United States.
Brechtel, Fredrick J., and Lopez-Yglesias, Xerxes. Tue . "Aerosol ionizer". United States. https://www.osti.gov/servlets/purl/1568204.
@article{osti_1568204,
title = {Aerosol ionizer},
author = {Brechtel, Fredrick J. and Lopez-Yglesias, Xerxes},
abstractNote = {A system and method comprising an ion production chamber having an ultra-violet light source disposed towards said chamber, a coated quartz plate between the chamber and the UV source whose coating absorbs incident UV light and ejects electrons into the chamber through the photoelectric effect, a harvest gas disposed to flow through the chamber from an inlet to an outlet, and a jet operable to introduce a sample into the harvest gas flow. In some embodiments the system includes using helium as the harvest gas. Certain embodiments include introducing a sample perpendicular to the harvest gas flow and using multiple sample introduction jets to increase mixing efficiency. In some embodiments the harvest gas and particle sample jet are one and the same. The charge sample may be coupled to a MEMS-based electrometer.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2019},
month = {4}
}

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