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Title: Optimized sub-sampling in an electron microscope

Abstract

Disclosed are methods for optimized sub-sampling in an electron microscope. With regard at least to utilization of electron dose budgets, of time for acquisition of measurements, and of computing/processing capabilities, very high efficiencies can be achieved by informing and/or adapting subsequent sub-sampling measurements according to one or more earlier-acquired sparse datasets and/or according to analyzes thereof.

Inventors:
; ; ;
Issue Date:
Research Org.:
Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1568184
Patent Number(s):
10,256,072
Application Number:
15/666,159
Assignee:
Battelle Memorial Institute (Richland, WA)
DOE Contract Number:  
AC05-76RL01830
Resource Type:
Patent
Resource Relation:
Patent File Date: 08/01/2017
Country of Publication:
United States
Language:
English

Citation Formats

Stevens, Andrew J., Kovarik, Libor, Liyu, Andrey V., and Browning, Nigel D. Optimized sub-sampling in an electron microscope. United States: N. p., 2019. Web.
Stevens, Andrew J., Kovarik, Libor, Liyu, Andrey V., & Browning, Nigel D. Optimized sub-sampling in an electron microscope. United States.
Stevens, Andrew J., Kovarik, Libor, Liyu, Andrey V., and Browning, Nigel D. Tue . "Optimized sub-sampling in an electron microscope". United States. https://www.osti.gov/servlets/purl/1568184.
@article{osti_1568184,
title = {Optimized sub-sampling in an electron microscope},
author = {Stevens, Andrew J. and Kovarik, Libor and Liyu, Andrey V. and Browning, Nigel D.},
abstractNote = {Disclosed are methods for optimized sub-sampling in an electron microscope. With regard at least to utilization of electron dose budgets, of time for acquisition of measurements, and of computing/processing capabilities, very high efficiencies can be achieved by informing and/or adapting subsequent sub-sampling measurements according to one or more earlier-acquired sparse datasets and/or according to analyzes thereof.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2019},
month = {4}
}

Patent:

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