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Title: Optimized sub-sampling in an electron microscope

Abstract

Disclosed are methods for optimized sub-sampling in an electron microscope. With regard at least to utilization of electron dose budgets, of time for acquisition of measurements, and of computing/processing capabilities, very high efficiencies can be achieved by informing and/or adapting subsequent sub-sampling measurements according to one or more earlier-acquired sparse datasets and/or according to analyzes thereof.

Inventors:
; ; ;
Issue Date:
Research Org.:
Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1568184
Patent Number(s):
10256072
Application Number:
15/666,159
Assignee:
Battelle Memorial Institute (Richland, WA)
Patent Classifications (CPCs):
G - PHYSICS G06 - COMPUTING G06T - IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
DOE Contract Number:  
AC05-76RL01830
Resource Type:
Patent
Resource Relation:
Patent File Date: 08/01/2017
Country of Publication:
United States
Language:
English

Citation Formats

Stevens, Andrew J., Kovarik, Libor, Liyu, Andrey V., and Browning, Nigel D. Optimized sub-sampling in an electron microscope. United States: N. p., 2019. Web.
Stevens, Andrew J., Kovarik, Libor, Liyu, Andrey V., & Browning, Nigel D. Optimized sub-sampling in an electron microscope. United States.
Stevens, Andrew J., Kovarik, Libor, Liyu, Andrey V., and Browning, Nigel D. Tue . "Optimized sub-sampling in an electron microscope". United States. https://www.osti.gov/servlets/purl/1568184.
@article{osti_1568184,
title = {Optimized sub-sampling in an electron microscope},
author = {Stevens, Andrew J. and Kovarik, Libor and Liyu, Andrey V. and Browning, Nigel D.},
abstractNote = {Disclosed are methods for optimized sub-sampling in an electron microscope. With regard at least to utilization of electron dose budgets, of time for acquisition of measurements, and of computing/processing capabilities, very high efficiencies can be achieved by informing and/or adapting subsequent sub-sampling measurements according to one or more earlier-acquired sparse datasets and/or according to analyzes thereof.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Apr 09 00:00:00 EDT 2019},
month = {Tue Apr 09 00:00:00 EDT 2019}
}

Works referenced in this record:

Mathematical image assembly in a scanning-type microscope
patent, April 2017


Efficient Method for Selecting Representative Elementary Volume in Digital Representations of Porous Media
patent-application, October 2013


Mathmatical Image Assembly in a Scanning-Type Microscope
patent-application, December 2015


Digital Rock Physics-Based Trend Determination and Usage for Upscaling
patent-application, January 2017


Sparse Sampling And Reconstruction For Electron And Scanning Probe Microscope Imaging
patent-application, March 2015