Test circuits for integrated circuit counterfeit detection

Helinski, Ryan; Pierson, Lyndon G.; Cole, Edward I.; Thai, Tan Q.

Title: Test circuits for integrated circuit counterfeit detection

Abstract

Described herein are various technologies pertaining to identifying counterfeit integrated circuits (ICs) by way of allowing the origin of fabrication to be verified. An IC comprises a main circuit and a test circuit that is independent of the main circuit. The test circuit comprises at least one ring oscillator (RO) signal that, when energized, is configured to output a signal that is indicative of a semiconductor fabrication facility where the IC was manufactured.

Inventors:: Helinski, Ryan; Pierson, Lyndon G.; Cole, Edward I.; Thai, Tan Q.

Issue Date:: 2019-04-09

Research Org.:: Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1568176

Patent Number(s):: 10254334

Application Number:: 16/044,007

Assignee:: National Technology & Engineering Solutions of Sandia, LLC (Albuquerque, NM)

Patent Classifications (CPCs):: G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES

H - ELECTRICITY H03 - BASIC ELECTRONIC CIRCUITRY H03K - PULSE TECHNIQUE

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G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES
G01R31/2856 - {Internal circuit aspects, e.g. built-in test features
G01R31/2884 - {using dedicated test connectors, test elements or test circuits on the IC under test
G01R31/2894 - {Aspects of quality control [QC]
G01R31/31703 - {Comparison aspects, e.g. signature analysis, comparators
G01R31/31708 - {Analysis of signal quality

H - ELECTRICITY H03 - BASIC ELECTRONIC CIRCUITRY H03K - PULSE TECHNIQUE
H03K19/003 - Modifications for increasing the reliability {for protection}

H - ELECTRICITY H04 - ELECTRIC COMMUNICATION TECHNIQUE H04L - TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
H04L9/3247 - {involving digital signatures}
H04L9/3255 - {using group based signatures, e.g. ring or threshold signatures}

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DOE Contract Number:: AC04-94AL85000

Resource Type:: Patent

Resource Relation:: Patent File Date: 07/24/2018

Country of Publication:: United States

Language:: English

Citation Formats


                    Helinski, Ryan, Pierson, Lyndon G., Cole, Edward I., and Thai, Tan Q.. Test circuits for integrated circuit counterfeit detection.  United States: N. p., 2019. 
        Web.

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                    Helinski, Ryan, Pierson, Lyndon G., Cole, Edward I., & Thai, Tan Q.. Test circuits for integrated circuit counterfeit detection.  United States.

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                    Helinski, Ryan, Pierson, Lyndon G., Cole, Edward I., and Thai, Tan Q.. Tue .  
        "Test circuits for integrated circuit counterfeit detection".  United States.  https://www.osti.gov/servlets/purl/1568176.

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@article{osti_1568176,

  title        = {Test circuits for integrated circuit counterfeit detection},

  author       = {Helinski, Ryan and Pierson, Lyndon G. and Cole, Edward I. and Thai, Tan Q.},

  abstractNote = {Described herein are various technologies pertaining to identifying counterfeit integrated circuits (ICs) by way of allowing the origin of fabrication to be verified. An IC comprises a main circuit and a test circuit that is independent of the main circuit. The test circuit comprises at least one ring oscillator (RO) signal that, when energized, is configured to output a signal that is indicative of a semiconductor fabrication facility where the IC was manufactured.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {2019},

  month        = {4}

}

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Works referenced in this record:

Tamper-Protected Hardware and Method for Using Same
patent-application, April 2014

Kreft, Heinz
US Patent Application 14/004651; 20140108786
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20140108786

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Title: Test circuits for integrated circuit counterfeit detection

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