Test circuits for integrated circuit counterfeit detection
Abstract
Described herein are various technologies pertaining to identifying counterfeit integrated circuits (ICs) by way of allowing the origin of fabrication to be verified. An IC comprises a main circuit and a test circuit that is independent of the main circuit. The test circuit comprises at least one ring oscillator (RO) signal that, when energized, is configured to output a signal that is indicative of a semiconductor fabrication facility where the IC was manufactured.
- Inventors:
- Issue Date:
- Research Org.:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1568176
- Patent Number(s):
- 10254334
- Application Number:
- 16/044,007
- Assignee:
- National Technology & Engineering Solutions of Sandia, LLC (Albuquerque, NM)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES
H - ELECTRICITY H03 - BASIC ELECTRONIC CIRCUITRY H03K - PULSE TECHNIQUE
- DOE Contract Number:
- AC04-94AL85000
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 07/24/2018
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Helinski, Ryan, Pierson, Lyndon G., Cole, Edward I., and Thai, Tan Q.. Test circuits for integrated circuit counterfeit detection. United States: N. p., 2019.
Web.
Helinski, Ryan, Pierson, Lyndon G., Cole, Edward I., & Thai, Tan Q.. Test circuits for integrated circuit counterfeit detection. United States.
Helinski, Ryan, Pierson, Lyndon G., Cole, Edward I., and Thai, Tan Q.. Tue .
"Test circuits for integrated circuit counterfeit detection". United States. https://www.osti.gov/servlets/purl/1568176.
@article{osti_1568176,
title = {Test circuits for integrated circuit counterfeit detection},
author = {Helinski, Ryan and Pierson, Lyndon G. and Cole, Edward I. and Thai, Tan Q.},
abstractNote = {Described herein are various technologies pertaining to identifying counterfeit integrated circuits (ICs) by way of allowing the origin of fabrication to be verified. An IC comprises a main circuit and a test circuit that is independent of the main circuit. The test circuit comprises at least one ring oscillator (RO) signal that, when energized, is configured to output a signal that is indicative of a semiconductor fabrication facility where the IC was manufactured.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2019},
month = {4}
}
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