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Title: Full-field surface roughness

Abstract

The various embodiments presented herein relate to utilizing light in conjunction with an optical Fourier transform to examine and quantify roughness of a surface. The surface includes a plurality of flaked particles. The surface is illuminated with a light beam, wherein light reflected from the surface passes through an f-theta lens and is collected at a light sensitive array (LSA). The LSA comprises light sensitive pixels. For an arrangement where the flakes are conformal with the surface, a low degree of light scattering occurs at the surface. For a surface comprising tipped and/or tilted flakes, a correlating degree of scattering of the incident light beam occurs. The surface roughness is quantified based upon the distribution of angular reflections of the scattered light represented in an image formed through use of the LSA.

Inventors:
; ;
Issue Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1568173
Patent Number(s):
10254112
Application Number:
14/927,037
Assignee:
National Technology & Engineering Solutions of Sandia, LLC (Albuquerque, NM)
Patent Classifications (CPCs):
G - PHYSICS G06 - COMPUTING G06T - IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
G - PHYSICS G01 - MEASURING G01B - MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Patent
Resource Relation:
Patent File Date: 10/29/2015
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Kemme, Shanalyn A., Jones, Adam, and Burns, George. Full-field surface roughness. United States: N. p., 2019. Web.
Kemme, Shanalyn A., Jones, Adam, & Burns, George. Full-field surface roughness. United States.
Kemme, Shanalyn A., Jones, Adam, and Burns, George. Tue . "Full-field surface roughness". United States. https://www.osti.gov/servlets/purl/1568173.
@article{osti_1568173,
title = {Full-field surface roughness},
author = {Kemme, Shanalyn A. and Jones, Adam and Burns, George},
abstractNote = {The various embodiments presented herein relate to utilizing light in conjunction with an optical Fourier transform to examine and quantify roughness of a surface. The surface includes a plurality of flaked particles. The surface is illuminated with a light beam, wherein light reflected from the surface passes through an f-theta lens and is collected at a light sensitive array (LSA). The LSA comprises light sensitive pixels. For an arrangement where the flakes are conformal with the surface, a low degree of light scattering occurs at the surface. For a surface comprising tipped and/or tilted flakes, a correlating degree of scattering of the incident light beam occurs. The surface roughness is quantified based upon the distribution of angular reflections of the scattered light represented in an image formed through use of the LSA.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2019},
month = {4}
}

Patent:

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