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Title: Error-correction coding for hot-swapping semiconductor devices

Abstract

A memory read operation is directed at a group of semiconductor devices from which a first semiconductor device has been removed. An error in data for the memory read operation is detected based on error-correction coding (ECC). The error is caused at least in part by the first semiconductor device having been removed. ECC is used to determine corrected data for the memory read operation.

Inventors:
Issue Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1531955
Patent Number(s):
9484113
Application Number:
14/253,638
Assignee:
Advanced Micro Devices, Inc. (Sunnyvale, CA)
Patent Classifications (CPCs):
G - PHYSICS G06 - COMPUTING G06F - ELECTRIC DIGITAL DATA PROCESSING
G - PHYSICS G11 - INFORMATION STORAGE G11C - STATIC STORES
DOE Contract Number:  
AC52-07NA27344
Resource Type:
Patent
Resource Relation:
Patent File Date: 2014-04-15
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING; 97 MATHEMATICS AND COMPUTING

Citation Formats

Roberts, David A. Error-correction coding for hot-swapping semiconductor devices. United States: N. p., 2016. Web.
Roberts, David A. Error-correction coding for hot-swapping semiconductor devices. United States.
Roberts, David A. Tue . "Error-correction coding for hot-swapping semiconductor devices". United States. https://www.osti.gov/servlets/purl/1531955.
@article{osti_1531955,
title = {Error-correction coding for hot-swapping semiconductor devices},
author = {Roberts, David A.},
abstractNote = {A memory read operation is directed at a group of semiconductor devices from which a first semiconductor device has been removed. An error in data for the memory read operation is detected based on error-correction coding (ECC). The error is caused at least in part by the first semiconductor device having been removed. ECC is used to determine corrected data for the memory read operation.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2016},
month = {11}
}

Works referenced in this record:

Maintaining Error Statistics Concurrently Across Multiple Memory Ranks
patent-application, May 2009


Transaction generator for initialization, rebuild, and verify of memory
patent, December 2006


Low cost and high RAS mirrored memory
patent, October 2007


Methods and Apparatus of Stacking Drams
patent-application, January 2010