Identifying new semiconductor detector materials by D.C. ionization conductivity

Title: Identifying new semiconductor detector materials by D.C. ionization conductivity

Abstract

Herein is described a method for identifying semiconductor radiation detector materials based on the mobility of internally generated electrons and holes. It was designed for the early stages of exploration, when samples are not available as single crystals, but as crystalline powders. Samples are confined under pressure in an electric field and the increase in current resulting from exposure to a high-intensity source of ionization current (e.g., 60Co gamma rays) is measured. A pressure cell device is described herein to carry out the method. For known semiconductors, the d.c. ionization current depends on voltage according to the Hecht equation, and for known insulators the d.c. ionization current is below detection limits. This shows that the method can identify semiconductors in spite of significant carrier trapping. Using this method and pressure cell, it was determined that new materials BiOI, PbIF, BiPbO2Cl, BiPbO2Br, BiPbO2I, Bi2GdO4Cl, Pb3O2I2, and Pb5O4I2 are semiconductors.

Inventors:: Derenzo, Stephen E.; Bourret-Courchesne, Edith; Porter-Chapman, Yetta D.; James, Floyd J.; Klintenberg, Mattias K.; Wang, Jie

Issue Date:: 2012-11-06

Research Org.:: Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1531767

Patent Number(s):: 8,304,748

Application Number:: 12/091,045

Assignee:: The Regents of the University of California (Oakland, CA)

DOE Contract Number:: AC02-05CH11231; R01 EB00339

Resource Type:: Patent

Resource Relation:: Patent File Date: 2006-10-19

Country of Publication:: United States

Language:: English

Subject:: 36 MATERIALS SCIENCE

Citation Formats


                    Derenzo, Stephen E., Bourret-Courchesne, Edith, Porter-Chapman, Yetta D., James, Floyd J., Klintenberg, Mattias K., and Wang, Jie. Identifying new semiconductor detector materials by D.C. ionization conductivity.  United States: N. p., 2012. 
        Web.

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                    Derenzo, Stephen E., Bourret-Courchesne, Edith, Porter-Chapman, Yetta D., James, Floyd J., Klintenberg, Mattias K., & Wang, Jie. Identifying new semiconductor detector materials by D.C. ionization conductivity.  United States.

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                    Derenzo, Stephen E., Bourret-Courchesne, Edith, Porter-Chapman, Yetta D., James, Floyd J., Klintenberg, Mattias K., and Wang, Jie. Tue .  
        "Identifying new semiconductor detector materials by D.C. ionization conductivity".  United States.  https://www.osti.gov/servlets/purl/1531767.

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@article{osti_1531767,

  title        = {Identifying new semiconductor detector materials by D.C. ionization conductivity},

  author       = {Derenzo, Stephen E. and Bourret-Courchesne, Edith and Porter-Chapman, Yetta D. and James, Floyd J. and Klintenberg, Mattias K. and Wang, Jie},

  abstractNote = {Herein is described a method for identifying semiconductor radiation detector materials based on the mobility of internally generated electrons and holes. It was designed for the early stages of exploration, when samples are not available as single crystals, but as crystalline powders. Samples are confined under pressure in an electric field and the increase in current resulting from exposure to a high-intensity source of ionization current (e.g., 60Co gamma rays) is measured. A pressure cell device is described herein to carry out the method. For known semiconductors, the d.c. ionization current depends on voltage according to the Hecht equation, and for known insulators the d.c. ionization current is below detection limits. This shows that the method can identify semiconductors in spite of significant carrier trapping. Using this method and pressure cell, it was determined that new materials BiOI, PbIF, BiPbO2Cl, BiPbO2Br, BiPbO2I, Bi2GdO4Cl, Pb3O2I2, and Pb5O4I2 are semiconductors.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {2012},

  month        = {11}

}

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Works referenced in this record:

Methods and apparatus for material deposition using primer
patent, October 1999

Hayashi, Shinichiro; McMillan, Larry D.; Azuma, Masamichi
US Patent Document 5,972,428
URL: http://patft.uspto.gov/netacgi/nph-Parser?patentnumber=5972428

Flash compression process for making photovoltaic cells
patent, July 1986

Dinh, Khanh
US Patent Document 4,602,422
URL: http://patft.uspto.gov/netacgi/nph-Parser?patentnumber=4602422

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Title: Identifying new semiconductor detector materials by D.C. ionization conductivity

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Citation Formats

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patent, October 1999

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