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Title: High-resolution, active-optic X-ray fluorescence analyzer

Abstract

Active optics apparatus and method for aligning active optics are provided for a high-resolution, active optic fluorescence analyzer combining a large acceptance solid angle with wide energy tunability. A plurality of rows of correctors selectively controlled to bend an elongated strip of single crystal material like Si (400) into substantially any precisely defined shape. A pair of pushers engages opposite ends of the silicon crystal strip exert only a force along the long axis of the crystal strip, and does not induce additional bending moments which would result in a torsion of the crystal.

Inventors:
; ;
Issue Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1531726
Patent Number(s):
8130902
Application Number:
11/831,518
Assignee:
UChicago Argonne, LLC (Chicago, IL)
Patent Classifications (CPCs):
G - PHYSICS G21 - NUCLEAR PHYSICS G21K - TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR
DOE Contract Number:  
AC02-06CH11357; W-31-109-ENG-38
Resource Type:
Patent
Resource Relation:
Patent File Date: 2007-07-31
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS

Citation Formats

Adams, Bernhard W., Attenkofer, Klaus, and Schmidt, Oliver A. High-resolution, active-optic X-ray fluorescence analyzer. United States: N. p., 2012. Web.
Adams, Bernhard W., Attenkofer, Klaus, & Schmidt, Oliver A. High-resolution, active-optic X-ray fluorescence analyzer. United States.
Adams, Bernhard W., Attenkofer, Klaus, and Schmidt, Oliver A. Tue . "High-resolution, active-optic X-ray fluorescence analyzer". United States. https://www.osti.gov/servlets/purl/1531726.
@article{osti_1531726,
title = {High-resolution, active-optic X-ray fluorescence analyzer},
author = {Adams, Bernhard W. and Attenkofer, Klaus and Schmidt, Oliver A.},
abstractNote = {Active optics apparatus and method for aligning active optics are provided for a high-resolution, active optic fluorescence analyzer combining a large acceptance solid angle with wide energy tunability. A plurality of rows of correctors selectively controlled to bend an elongated strip of single crystal material like Si (400) into substantially any precisely defined shape. A pair of pushers engages opposite ends of the silicon crystal strip exert only a force along the long axis of the crystal strip, and does not induce additional bending moments which would result in a torsion of the crystal.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2012},
month = {3}
}

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