Polarized pulsed front-end beam source for electron microscope
Abstract
A method and an electron source are provided for generating polarized electrons for an electron microscope. The electron source includes a photoemissive cathode and a low-power drive laser. The geometry of the photoemissive cathode uses a generally planar emission surface, which is imaged to approximately 1/100 its initial size via electrostatic focusing elements. The virtual emitter, or image spot, then is used as an electron source by a conventional microscope column.
- Inventors:
- Issue Date:
- Research Org.:
- Argonne National Laboratory (ANL), Argonne, IL (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1531595
- Patent Number(s):
- 7573053
- Application Number:
- 11/625,454
- Assignee:
- UChicago Argonne, LLC (Chicago, IL)
- Patent Classifications (CPCs):
-
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- DOE Contract Number:
- AC02-06CH11357; W-31-109-ENG-38
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2007-01-22
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Lewellen, John W., and Noonan, John. Polarized pulsed front-end beam source for electron microscope. United States: N. p., 2009.
Web.
Lewellen, John W., & Noonan, John. Polarized pulsed front-end beam source for electron microscope. United States.
Lewellen, John W., and Noonan, John. Tue .
"Polarized pulsed front-end beam source for electron microscope". United States. https://www.osti.gov/servlets/purl/1531595.
@article{osti_1531595,
title = {Polarized pulsed front-end beam source for electron microscope},
author = {Lewellen, John W. and Noonan, John},
abstractNote = {A method and an electron source are provided for generating polarized electrons for an electron microscope. The electron source includes a photoemissive cathode and a low-power drive laser. The geometry of the photoemissive cathode uses a generally planar emission surface, which is imaged to approximately 1/100 its initial size via electrostatic focusing elements. The virtual emitter, or image spot, then is used as an electron source by a conventional microscope column.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2009},
month = {8}
}
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Works referenced in this record:
Method and apparatus for depositing ceramic films by vacuum arc deposition
patent, December 2002
- Klepper, C. Christopher; Niemel, John; Hazelton, Robert C.
- US Patent Document 6,495,002
Laser stimulated high current density photoelectron generator and method of manufacture
patent, July 1984
- Oettinger, Peter E.; Lee, Chunghsin
- US Patent Document 4,460,831
Source of spin polarized electrons
patent, July 1976
- Pierce, Daniel T.; Meier, Felix Andrea; Siegmann, Hans-Christoph
- US Patent Document 3,968,376
Imaging electron-optical apparatus
patent, November 1993
- Engel, Wilfried
- US Patent Document 5,266,809
Apparatus and method for particle analysis
patent, October 1989
- Preikschat, Fritz K.; Preikschat, Ekhard
- US Patent Document 4,871,251
Electron sources utilizing patterned negative electron affinity photocathodes
patent, August 1999
- Schneider, James E.; Costello, Kenneth A.; McCord, Mark A.
- US Patent Document 5,932,966
Photoelectron linear accelerator for producing a low emittance polarized electron beam
patent-application, April 2004
- Yu, David U. L.; Clendenin, James E.; Kirby, Robert E.
- US Patent Application 10/261831; 20040061456
Method of operating an electron beam measuring device
patent, August 1991
- Feuerbaum, Hans-Peter; Frosien, Jürgen
- US Patent Document 5,041,724
Secondary emission electron gun using external primaries
patent-application, February 2006
- Srinivasan-Rao, Triveni; Ben-Zvi, Ilan; Kewisch, Jorg
- US Patent Application 10/917309; 20060033417