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Title: Polarized pulsed front-end beam source for electron microscope

Abstract

A method and an electron source are provided for generating polarized electrons for an electron microscope. The electron source includes a photoemissive cathode and a low-power drive laser. The geometry of the photoemissive cathode uses a generally planar emission surface, which is imaged to approximately 1/100 its initial size via electrostatic focusing elements. The virtual emitter, or image spot, then is used as an electron source by a conventional microscope column.

Inventors:
;
Issue Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1531595
Patent Number(s):
7,573,053
Application Number:
11/625,454
Assignee:
UChicago Argonne, LLC (Chicago, IL)
DOE Contract Number:  
AC02-06CH11357; W-31-109-ENG-38
Resource Type:
Patent
Resource Relation:
Patent File Date: 2007-01-22
Country of Publication:
United States
Language:
English

Citation Formats

Lewellen, John W., and Noonan, John. Polarized pulsed front-end beam source for electron microscope. United States: N. p., 2009. Web.
Lewellen, John W., & Noonan, John. Polarized pulsed front-end beam source for electron microscope. United States.
Lewellen, John W., and Noonan, John. Tue . "Polarized pulsed front-end beam source for electron microscope". United States. https://www.osti.gov/servlets/purl/1531595.
@article{osti_1531595,
title = {Polarized pulsed front-end beam source for electron microscope},
author = {Lewellen, John W. and Noonan, John},
abstractNote = {A method and an electron source are provided for generating polarized electrons for an electron microscope. The electron source includes a photoemissive cathode and a low-power drive laser. The geometry of the photoemissive cathode uses a generally planar emission surface, which is imaged to approximately 1/100 its initial size via electrostatic focusing elements. The virtual emitter, or image spot, then is used as an electron source by a conventional microscope column.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2009},
month = {8}
}

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Works referenced in this record:

Method and apparatus for depositing ceramic films by vacuum arc deposition
patent, December 2002


Source of spin polarized electrons
patent, July 1976


Imaging electron-optical apparatus
patent, November 1993


Apparatus and method for particle analysis
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Electron sources utilizing patterned negative electron affinity photocathodes
patent, August 1999


Method of operating an electron beam measuring device
patent, August 1991