skip to main content
DOE Patents title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Integrated electron beam tip and sample heating device for a scanning tunneling microscope

Abstract

An electron beam heating device with the temperature up to 2200 K is provided for heating a sample and a tip for a scanning tunneling microscope (STM). The electron beam heating device includes a base stage for mating respectively with an electron beam sample heating carrier and an electron beam tip heating carrier, both carriers include a filament. The integration of the filament into the transferable electron beam sample heating carrier and electron beam tip heating carrier enables filament exchange without venting the vacuum system. A fixed distance between the sample and the filament enables reproducible sample temperature control and the filament is mounted at a back of the sample, allowing optical access for temperature measurement, and allowing sample preparation processes without changing positions of the sample or the filament. Once the tip is loaded, a fixed relative position between the tip and the filament enables reproducible control of heating. A tip holder includes an electrically isolated post connected to the tip, enabling a separate electrical potential to be applied to the tip.

Inventors:
; ;
Issue Date:
Research Org.:
UChicago Argonne, LLC, Chicago, IL (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1531565
Patent Number(s):
7,427,755
Application Number:
11/443,714
Assignee:
UChicago Argonne, LLC (Chicago, IL)
DOE Contract Number:  
W-31-109-ENG-38
Resource Type:
Patent
Resource Relation:
Patent File Date: 2006-05-31
Country of Publication:
United States
Language:
English

Citation Formats

Ding, Haifeng, Li, Dong-Qi, and Pearson, John E. Integrated electron beam tip and sample heating device for a scanning tunneling microscope. United States: N. p., 2008. Web.
Ding, Haifeng, Li, Dong-Qi, & Pearson, John E. Integrated electron beam tip and sample heating device for a scanning tunneling microscope. United States.
Ding, Haifeng, Li, Dong-Qi, and Pearson, John E. Tue . "Integrated electron beam tip and sample heating device for a scanning tunneling microscope". United States. https://www.osti.gov/servlets/purl/1531565.
@article{osti_1531565,
title = {Integrated electron beam tip and sample heating device for a scanning tunneling microscope},
author = {Ding, Haifeng and Li, Dong-Qi and Pearson, John E.},
abstractNote = {An electron beam heating device with the temperature up to 2200 K is provided for heating a sample and a tip for a scanning tunneling microscope (STM). The electron beam heating device includes a base stage for mating respectively with an electron beam sample heating carrier and an electron beam tip heating carrier, both carriers include a filament. The integration of the filament into the transferable electron beam sample heating carrier and electron beam tip heating carrier enables filament exchange without venting the vacuum system. A fixed distance between the sample and the filament enables reproducible sample temperature control and the filament is mounted at a back of the sample, allowing optical access for temperature measurement, and allowing sample preparation processes without changing positions of the sample or the filament. Once the tip is loaded, a fixed relative position between the tip and the filament enables reproducible control of heating. A tip holder includes an electrically isolated post connected to the tip, enabling a separate electrical potential to be applied to the tip.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2008},
month = {9}
}

Patent:

Save / Share:

Works referenced in this record:

Scanning tunneling microscope
patent, July 1990


Surface analyzing and processing apparatus
patent, August 1995


System for analyzing surfaces of samples
patent, April 1996


Hot stage for scanning probe microscope
patent, March 1998


High-repetition rate position sensitive atom probe
patent, October 1991


System for analyzing surfaces of samples
patent, April 1997


Heated stage for a scanning probe microscope
patent, October 1998


    Works referencing / citing this record: