Dark-field laser-scattering microscope for analyzing single macromolecules

Wu, Sheng; Tang, Yongchun

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Title: Dark-field laser-scattering microscope for analyzing single macromolecules

Abstract

To further isolate the scattered light 112 of a specific particle from the scattered light of a different particle, a pin hole device 116 can be used. The pin hole device 116 prevents unfocused light from other particles from entering the second plane 118, thus isolating a desired, focused image of one particle 110 of the sample 106. In one embodiment, the pin hole 116 has a size of several microns. At the second plane 118, a traditional imaging detection device 120 detects the defocused light. The position of the second image plane 118 is chosen for good angular resolution of the scattered light 112, and at the same time gives enough light for the imaging detection device 120 to obtain a sufficient reading.

Inventors:: Wu, Sheng; Tang, Yongchun

Issue Date:: 2008-04-29

Research Org.:: California Institute of Technology (CalTech), Pasadena, CA (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1531554

Patent Number(s):: 7365835

Application Number:: 11/004,492

Assignee:: California Institute of Technology (Pasadena, CA)

Patent Classifications (CPCs):: G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

G - PHYSICS G02 - OPTICS G02B - OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS

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G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N15/1475 - {using image analysis for extracting features of the particle}
G01N2015/1497 - {Particle shape}

G - PHYSICS G02 - OPTICS G02B - OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
G02B21/16 - adapted for ultra-violet illumination {

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Resource Type:: Patent

Resource Relation:: Patent File Date: 2004-12-02

Country of Publication:: United States

Language:: English

Citation Formats


                    Wu, Sheng, and Tang, Yongchun. Dark-field laser-scattering microscope for analyzing single macromolecules.  United States: N. p., 2008. 
        Web.

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                    Wu, Sheng, & Tang, Yongchun. Dark-field laser-scattering microscope for analyzing single macromolecules.  United States.

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                    Wu, Sheng, and Tang, Yongchun. Tue .  
        "Dark-field laser-scattering microscope for analyzing single macromolecules".  United States.  https://www.osti.gov/servlets/purl/1531554.

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@article{osti_1531554,

  title        = {Dark-field laser-scattering microscope for analyzing single macromolecules},

  author       = {Wu, Sheng and Tang, Yongchun},

  abstractNote = {To further isolate the scattered light 112 of a specific particle from the scattered light of a different particle, a pin hole device 116 can be used. The pin hole device 116 prevents unfocused light from other particles from entering the second plane 118, thus isolating a desired, focused image of one particle 110 of the sample 106. In one embodiment, the pin hole 116 has a size of several microns. At the second plane 118, a traditional imaging detection device 120 detects the defocused light. The position of the second image plane 118 is chosen for good angular resolution of the scattered light 112, and at the same time gives enough light for the imaging detection device 120 to obtain a sufficient reading.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {2008},

  month        = {4}

}

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Works referencing / citing this record:

Adjusting sample holder orientation for symmetric incident beam and scattered beam geometry to compensate for refraction index related distortions
patent, December 2016

Moitzi, Christian
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Modavis, Robert Adam; Wu, Qi; Caracci, Stephen J.
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Similar Records

Title: Dark-field laser-scattering microscope for analyzing single macromolecules

Abstract

Citation Formats

In situ small particle diagnostics patent, July 1987

In situ particle size measuring device patent, January 1990

Microplate reader patent, January 2007

Method for determining the size of a spherical or elipsoidal molecule patent-application, November 2002

Method and apparatus for particle size analysis patent, October 1991

System for measuring the size distribution of particles dispersed in a fluid patent, June 1987

Method and apparatus for determining polymer molecular weight distribution parameters patent, October 1988

Apparatus and method for the detection and classification of articles using flow cytometry techniques patent, April 1987

Apparatus for simultaneously measuring large and small particle size distribution patent, February 1993

Particle size analysis utilizing polarization intensity differential scattering patent, April 1992

Particle diameter measuring device patent, June 1986

Apparatus and method for determining the size distribution of particles by light scattering patent, November 1996

Method and apparatus for characterizing microparticles and measuring their response to their environment patent, September 1985

Simultaneous Multiple Measurements in Laser Photometers patent, November 1974

Optical device and method for multi-angle laser light scatter patent, November 2003

Increased throughput analysis of small compounds using multiple temporally spaced injections patent, March 2003

Component, apparatus, and method for analyzing molecules patent, February 2006

Method and apparatus for determining absolute particle size, surface area and volume normalized fluorescence using forward angle light scatter intensity in flow cytometry patent, July 1996

Method of Measuring the Concentration and/or Size of Suspended Particles by Forward Scattering of Light patent, February 1972

Method and apparatus for scanning and evaluating matter patent, November 1999

Adjusting sample holder orientation for symmetric incident beam and scattered beam geometry to compensate for refraction index related distortions patent, December 2016

Optical interrogation system and method for using same patent, June 2010

In situ small particle diagnostics
patent, July 1987

In situ particle size measuring device
patent, January 1990

Microplate reader
patent, January 2007

Method for determining the size of a spherical or elipsoidal molecule
patent-application, November 2002

Method and apparatus for particle size analysis
patent, October 1991

System for measuring the size distribution of particles dispersed in a fluid
patent, June 1987

Method and apparatus for determining polymer molecular weight distribution parameters
patent, October 1988

Apparatus and method for the detection and classification of articles using flow cytometry techniques
patent, April 1987

Apparatus for simultaneously measuring large and small particle size distribution
patent, February 1993

Particle size analysis utilizing polarization intensity differential scattering
patent, April 1992

Particle diameter measuring device
patent, June 1986

Apparatus and method for determining the size distribution of particles by light scattering
patent, November 1996

Method and apparatus for characterizing microparticles and measuring their response to their environment
patent, September 1985

Simultaneous Multiple Measurements in Laser Photometers
patent, November 1974

Optical device and method for multi-angle laser light scatter
patent, November 2003

Increased throughput analysis of small compounds using multiple temporally spaced injections
patent, March 2003

Component, apparatus, and method for analyzing molecules
patent, February 2006

Method and apparatus for determining absolute particle size, surface area and volume normalized fluorescence using forward angle light scatter intensity in flow cytometry
patent, July 1996

Method of Measuring the Concentration and/or Size of Suspended Particles by Forward Scattering of Light
patent, February 1972

Method and apparatus for scanning and evaluating matter
patent, November 1999

Adjusting sample holder orientation for symmetric incident beam and scattered beam geometry to compensate for refraction index related distortions
patent, December 2016

Optical interrogation system and method for using same
patent, June 2010