Single metal nanoparticle scattering interferometer

Title: Single metal nanoparticle scattering interferometer

Abstract

An interferometer and a method for generating scattered light interference are provided. A beam splitter is provided by a single metal nanoparticle to split an incoming excitation light. Scattered light from the single metal nanoparticle and its mirror image shows interference in both spatial and spectral domains. A mirror modifies the spatial distribution of elastic light scattering of the single metal nanoparticle. A large spectral width of the scattered light enables a distance measurement without scanning the mirror.

Inventors:: Eah, Sang -Kee; Lin, Xiao -Min; Wiederrecht, Gary

Issue Date:: 2007-07-31

Research Org.:: UChicago Argonne LLC, Chicago, IL (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1531536

Patent Number(s):: 7,251,040

Application Number:: 11/040,914

Assignee:: UChicago Argonne, LLC (Chicago, IL)

DOE Contract Number:: W-31-109-ENG-38

Resource Type:: Patent

Resource Relation:: Patent File Date: 2005-01-21

Country of Publication:: United States

Language:: English

Citation Formats


                    Eah, Sang -Kee, Lin, Xiao -Min, and Wiederrecht, Gary. Single metal nanoparticle scattering interferometer.  United States: N. p., 2007. 
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                    Eah, Sang -Kee, Lin, Xiao -Min, & Wiederrecht, Gary. Single metal nanoparticle scattering interferometer.  United States.

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                    Eah, Sang -Kee, Lin, Xiao -Min, and Wiederrecht, Gary. Tue .  
        "Single metal nanoparticle scattering interferometer".  United States.  https://www.osti.gov/servlets/purl/1531536.

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@article{osti_1531536,

  title        = {Single metal nanoparticle scattering interferometer},

  author       = {Eah, Sang -Kee and Lin, Xiao -Min and Wiederrecht, Gary},

  abstractNote = {An interferometer and a method for generating scattered light interference are provided. A beam splitter is provided by a single metal nanoparticle to split an incoming excitation light. Scattered light from the single metal nanoparticle and its mirror image shows interference in both spatial and spectral domains. A mirror modifies the spatial distribution of elastic light scattering of the single metal nanoparticle. A large spectral width of the scattered light enables a distance measurement without scanning the mirror.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {2007},

  month        = {7}

}

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Inspection method and apparatus for inspecting a particle, if any, on a substrate having a pattern
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High resolution structured illumination microscopy
patent, September 2014

Liu, Zhaowei
US Patent Document 8,836,948
URL: http://patft.uspto.gov/netacgi/nph-Parser?patentnumber=8836948

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Similar Records

Title: Single metal nanoparticle scattering interferometer

Abstract

Citation Formats

Inspection method and apparatus for inspecting a particle, if any, on a substrate having a pattern patent, January 1996

Highly directional optical system and optical sectional image forming apparatus employing the same patent, July 1993

Interferometer for determining the position of displacement travel of a movable measuring mirror or the like patent, October 1994

Optical fiber interferometer with PZT scanning of interferometer arm optical length patent, February 1999

Imaging platform for nanoparticle detection applied to SPR biomolecular interaction analysis patent, June 2006

Fiber optic strain and impact sensor system for composite materials patent, December 1991

High resolution structured illumination microscopy patent, September 2014

Inspection method and apparatus for inspecting a particle, if any, on a substrate having a pattern
patent, January 1996

Highly directional optical system and optical sectional image forming apparatus employing the same
patent, July 1993

Interferometer for determining the position of displacement travel of a movable measuring mirror or the like
patent, October 1994

Optical fiber interferometer with PZT scanning of interferometer arm optical length
patent, February 1999

Imaging platform for nanoparticle detection applied to SPR biomolecular interaction analysis
patent, June 2006

Fiber optic strain and impact sensor system for composite materials
patent, December 1991

High resolution structured illumination microscopy
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