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Title: Single metal nanoparticle scattering interferometer

Abstract

An interferometer and a method for generating scattered light interference are provided. A beam splitter is provided by a single metal nanoparticle to split an incoming excitation light. Scattered light from the single metal nanoparticle and its mirror image shows interference in both spatial and spectral domains. A mirror modifies the spatial distribution of elastic light scattering of the single metal nanoparticle. A large spectral width of the scattered light enables a distance measurement without scanning the mirror.

Inventors:
; ;
Issue Date:
Research Org.:
UChicago Argonne LLC, Chicago, IL (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1531536
Patent Number(s):
7,251,040
Application Number:
11/040,914
Assignee:
UChicago Argonne, LLC (Chicago, IL)
DOE Contract Number:  
W-31-109-ENG-38
Resource Type:
Patent
Resource Relation:
Patent File Date: 2005-01-21
Country of Publication:
United States
Language:
English

Citation Formats

Eah, Sang -Kee, Lin, Xiao -Min, and Wiederrecht, Gary. Single metal nanoparticle scattering interferometer. United States: N. p., 2007. Web.
Eah, Sang -Kee, Lin, Xiao -Min, & Wiederrecht, Gary. Single metal nanoparticle scattering interferometer. United States.
Eah, Sang -Kee, Lin, Xiao -Min, and Wiederrecht, Gary. Tue . "Single metal nanoparticle scattering interferometer". United States. https://www.osti.gov/servlets/purl/1531536.
@article{osti_1531536,
title = {Single metal nanoparticle scattering interferometer},
author = {Eah, Sang -Kee and Lin, Xiao -Min and Wiederrecht, Gary},
abstractNote = {An interferometer and a method for generating scattered light interference are provided. A beam splitter is provided by a single metal nanoparticle to split an incoming excitation light. Scattered light from the single metal nanoparticle and its mirror image shows interference in both spatial and spectral domains. A mirror modifies the spatial distribution of elastic light scattering of the single metal nanoparticle. A large spectral width of the scattered light enables a distance measurement without scanning the mirror.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2007},
month = {7}
}

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Works referenced in this record:

Inspection method and apparatus for inspecting a particle, if any, on a substrate having a pattern
patent, January 1996


Optical fiber interferometer with PZT scanning of interferometer arm optical length
patent, February 1999


Imaging platform for nanoparticle detection applied to SPR biomolecular interaction analysis
patent, June 2006


Fiber optic strain and impact sensor system for composite materials
patent, December 1991


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