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Title: Method and apparatus for detecting normal cracks using infrared thermal imaging

Abstract

A method and infrared thermal imaging apparatus detects normal and angled cracks on or beneath a sample surface using infrared thermal imaging where the crack plane is perpendicular or angled to an imaged surface of the sample. A constant heating source is used for heating a section of the sample to produce a lateral heat transfer through the sample. An infrared camera is positioned near one side of the sample for receiving thermal image data resulting from the lateral heat transfer through the sample. A data acquisition and processing computer is used for acquiring and differentiation processing thermal image data from the infrared camera for generating two-dimensional first derivative and second derivative images to detect the normal and angled cracks.

Inventors:
;
Issue Date:
Research Org.:
Univ. of Chicago, IL (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1531475
Patent Number(s):
6730912
Application Number:
10/232,176
Assignee:
The University of Chicago (Chicago, IL)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
DOE Contract Number:  
W-31-109-ENG-38
Resource Type:
Patent
Resource Relation:
Patent File Date: 2002-08-30
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Sun, Jiangang G., and Erdman, Scott M. Method and apparatus for detecting normal cracks using infrared thermal imaging. United States: N. p., 2004. Web.
Sun, Jiangang G., & Erdman, Scott M. Method and apparatus for detecting normal cracks using infrared thermal imaging. United States.
Sun, Jiangang G., and Erdman, Scott M. Tue . "Method and apparatus for detecting normal cracks using infrared thermal imaging". United States. https://www.osti.gov/servlets/purl/1531475.
@article{osti_1531475,
title = {Method and apparatus for detecting normal cracks using infrared thermal imaging},
author = {Sun, Jiangang G. and Erdman, Scott M.},
abstractNote = {A method and infrared thermal imaging apparatus detects normal and angled cracks on or beneath a sample surface using infrared thermal imaging where the crack plane is perpendicular or angled to an imaged surface of the sample. A constant heating source is used for heating a section of the sample to produce a lateral heat transfer through the sample. An infrared camera is positioned near one side of the sample for receiving thermal image data resulting from the lateral heat transfer through the sample. A data acquisition and processing computer is used for acquiring and differentiation processing thermal image data from the infrared camera for generating two-dimensional first derivative and second derivative images to detect the normal and angled cracks.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue May 04 00:00:00 EDT 2004},
month = {Tue May 04 00:00:00 EDT 2004}
}

Works referenced in this record:

Automated real-time detection of defects during machining of ceramics
patent, November 1997


Coating tolerant thermography
patent, February 1998


Flash Method of Determining Thermal Diffusivity, Heat Capacity, and Thermal Conductivity
journal, September 1961


Early-Time Pulse-Echo Thermal Wave Imaging
book, January 1996


Pulse phase infrared thermography
journal, March 1996


Crack sizing
patent, May 1989


Nondestructive testing: transient depth thermography
patent, January 1998


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    Device for contactlessly testing passive routing substrates
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    Air-coupled acoustic thermography for in-situ evaluation
    patent, December 2010