Method for determining defect depth using thermal imaging

Sun, Jiangang

Advanced Search OptionsAdvanced Search queries use a traditional Term Search. For more info, see our FAQ.

All Fields:

Patent Title:

Abstract:

Assignee:

Inventor(s):

Patent Number:

Patent Classification (CPC):

All Classifications
A - human necessities
A01 - agriculture
A21 - baking
A22 - butchering
A23 - foods or foodstuffs
A24 - tobacco
A41 - wearing apparel
A42 - headwear
A43 - footwear
A44 - haberdashery
A45 - hand or travelling articles
A46 - brushware
A47 - furniture
A61 - medical or veterinary science
A62 - life-saving
A63 - sports
A99 - subject matter not otherwise provided for in this section
B - performing operations
B01 - physical or chemical processes or apparatus in general
B02 - crushing, pulverising, or disintegrating
B03 - separation of solid materials using liquids or using pneumatic tables or jigs
B04 - centrifugal apparatus or machines for carrying-out physical or chemical processes
B05 - spraying or atomising in general
B06 - generating or transmitting mechanical vibrations in general
B07 - separating solids from solids
B08 - cleaning
B09 - disposal of solid waste
B21 - mechanical metal-working without essentially removing material
B22 - casting
B23 - machine tools
B24 - grinding
B25 - hand tools
B26 - hand cutting tools
B27 - working or preserving wood or similar material
B28 - working cement, clay, or stone
B29 - working of plastics
B30 - presses
B31 - making articles of paper, cardboard or material worked in a manner analogous to paper
B32 - layered products
B33 - additive manufacturing technology
B41 - printing
B42 - bookbinding
B43 - writing or drawing implements
B44 - decorative arts
B60 - vehicles in general
B61 - railways
B62 - land vehicles for travelling otherwise than on rails
B63 - ships or other waterborne vessels
B64 - aircraft
B65 - conveying
B66 - hoisting
B67 - opening, closing {or cleaning} bottles, jars or similar containers
B68 - saddlery
B81 - microstructural technology
B82 - nanotechnology
B99 - subject matter not otherwise provided for in this section
C - chemistry
C01 - inorganic chemistry
C02 - treatment of water, waste water, sewage, or sludge
C03 - glass
C04 - cements
C05 - fertilisers
C06 - explosives
C07 - organic chemistry
C08 - organic macromolecular compounds
C09 - dyes
C10 - petroleum, gas or coke industries
C11 - animal or vegetable oils, fats, fatty substances or waxes
C12 - biochemistry
C13 - sugar industry
C14 - skins
C21 - metallurgy of iron
C22 - metallurgy
C23 - coating metallic material
C25 - electrolytic or electrophoretic processes
C30 - crystal growth
C40 - combinatorial technology
C99 - subject matter not otherwise provided for in this section
D - textiles
D01 - natural or man-made threads or fibres
D02 - yarns
D03 - weaving
D04 - braiding
D05 - sewing
D06 - treatment of textiles or the like
D07 - ropes
D10 - indexing scheme associated with sublasses of section d, relating to textiles
D21 - paper-making
D99 - subject matter not otherwise provided for in this section
E - fixed constructions
E01 - construction of roads, railways, or bridges
E02 - hydraulic engineering
E03 - water supply
E04 - building
E05 - locks
E06 - doors, windows, shutters, or roller blinds in general
E21 - earth drilling
E99 - subject matter not otherwise provided for in this section
F - mechanical engineering
F01 - machines or engines in general
F02 - combustion engines
F03 - machines or engines for liquids
F04 - positive - displacement machines for liquids
F05 - indexing schemes relating to engines or pumps in various subclasses of classes f01-f04
F15 - fluid-pressure actuators
F16 - engineering elements and units
F17 - storing or distributing gases or liquids
F21 - lighting
F22 - steam generation
F23 - combustion apparatus
F24 - heating
F25 - refrigeration or cooling
F26 - drying
F27 - furnaces
F28 - heat exchange in general
F41 - weapons
F42 - ammunition
F99 - subject matter not otherwise provided for in this section
G - physics
G01 - measuring
G02 - optics
G03 - photography
G04 - horology
G05 - controlling
G06 - computing
G07 - checking-devices
G08 - signalling
G09 - education
G10 - musical instruments
G11 - information storage
G12 - instrument details
G16 - information and communication technology [ict] specially adapted for specific application fields
G21 - nuclear physics
G99 - subject matter not otherwise provided for in this section
H - electricity
H01 - basic electric elements
H02 - generation
H03 - basic electronic circuitry
H04 - electric communication technique
H05 - electric techniques not otherwise provided for
H99 - subject matter not otherwise provided for in this section
Y - new / cross sectional technologies
Y02 - technologies or applications for mitigation or adaptation against climate change
Y04 - information or communication technologies having an impact on other technology areas
Y10 - technical subjects covered by former uspc

More Options ...

Title: Method for determining defect depth using thermal imaging

Abstract

A method and apparatus are provided for determining the thickness of a sample and defect depth using thermal imaging in a variety of plastic, ceramic, metal and other products. A pair of flash lamps is positioned at a first side of the sample. An infrared camera is positioned near the first side of the sample. A data acquisition and processing computer is coupled to the flash lamps for triggering the flash lamps. The data acquisition and processing computer is coupled to the infrared camera for acquiring and processing thermal image data. The thermal image data are processed using a theoretical solution to analyze the thermal image data to determine the thickness of a sample and defect depth.

Inventors:: Sun, Jiangang

Issue Date:: 2003-04-01

Research Org.:: Univ. of Chicago, IL (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1531452

Patent Number(s):: 6542849

Application Number:: 09/766,214

Assignee:: The University of Chicago (Chicago, IL)

Patent Classifications (CPCs):: G - PHYSICS G01 - MEASURING G01B - MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS

Show more

G - PHYSICS G01 - MEASURING G01B - MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS
G01B11/06 - for measuring thickness, e.g. of sheet material
G01B11/22 - for measuring depth

Show less

DOE Contract Number:: W-31-109-ENG-38

Resource Type:: Patent

Resource Relation:: Patent File Date: 2001-01-19

Country of Publication:: United States

Language:: English

Subject:: 36 MATERIALS SCIENCE

Citation Formats


                    Sun, Jiangang. Method for determining defect depth using thermal imaging.  United States: N. p., 2003. 
        Web.

Copy to clipboard


                    Sun, Jiangang. Method for determining defect depth using thermal imaging.  United States.

Copy to clipboard


                    Sun, Jiangang. Tue .  
        "Method for determining defect depth using thermal imaging".  United States.  https://www.osti.gov/servlets/purl/1531452.

Copy to clipboard


                    
@article{osti_1531452,

  title        = {Method for determining defect depth using thermal imaging},

  author       = {Sun, Jiangang},

  abstractNote = {A method and apparatus are provided for determining the thickness of a sample and defect depth using thermal imaging in a variety of plastic, ceramic, metal and other products. A pair of flash lamps is positioned at a first side of the sample. An infrared camera is positioned near the first side of the sample. A data acquisition and processing computer is coupled to the flash lamps for triggering the flash lamps. The data acquisition and processing computer is coupled to the infrared camera for acquiring and processing thermal image data. The thermal image data are processed using a theoretical solution to analyze the thermal image data to determine the thickness of a sample and defect depth.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {2003},

  month        = {4}

}

Copy to clipboard

Patent:

Save / Share:

Export Metadata

Save to My Library

Works referenced in this record:

Automated real-time detection of defects during machining of ceramics
patent, November 1997

Ellingson, William A.; Sun, Jiangang
US Patent Document 5,689,332
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/5689332

Flash Method of Determining Thermal Diffusivity, Heat Capacity, and Thermal Conductivity
journal, September 1961

Parker, W. J.; Jenkins, R. J.; Butler, C. P.
Journal of Applied Physics, Vol. 32, Issue 9
https://doi.org/10.1063/1.1728417

Pulse phase infrared thermography
journal, March 1996

Maldague, X.; Marinetti, S.
Journal of Applied Physics, Vol. 79, Issue 5
https://doi.org/10.1063/1.362662

Nondestructive testing: transient depth thermography
patent, January 1998

Ringermacher, Harry Israel; Archacki, Jr., Raymond J.; Veronesi, William A.
US Patent Document 5,711,603
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/5711603

Optical method and apparatus for detection of defects and microstructural changes in ceramics and ceramic coatings
patent, September 2001

Ellingson, William A.; Todd, Judith A.; Sun, Jiangang
US Patent Document 6,285,449
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6285449

Early-Time Pulse-Echo Thermal Wave Imaging
book, January 1996

Han, Xiaoyan; Favro, L. D.; Kuo, P. K.
Review of Progress in Quantitative Nondestructive Evaluation, p. 519-524
https://doi.org/10.1007/978-1-4613-0383-1_66

Crack sizing
patent, May 1989

Reynolds, William; Milne, James M.
US Patent Document 4,826,326
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/4826326

Works referencing / citing this record:

Method and apparatus for thermographic nondestructive evaluation of an object
patent, June 2009

Tralshawala, Nilesh; Howard, Donald Robert; Ringermacher, Harry Israel
US Patent Document 7,549,789
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7549789

Transient defect detection algorithm
patent, September 2009

Foes, Scott R.; Yazdi, Hamid
US Patent Document 7,591,583
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7591583

Method for producing a mirror substrate blank of titanium-doped silica glass for EUV lithography, and system for determining the position of defects in a blank
patent, July 2018

Becker, Klaus
US Patent Document 10,016,872
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/10016872

Method and apparatus for detecting defects in a material in a liquid bath
patent, March 2005

Struckhoff, Andrew D.; Mosser, Eric S.; Shaw, William E.
US Patent Document 6,870,610
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6870610

Material analysis
patent, March 2006

Bates, Daniel
US Patent Document 7,018,094
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7018094

Synchronized electronic shutter system and method for thermal nondestructive evaluation
patent, March 2004

Zalameda, Joseph N.; Winfree, William P.
US Patent Document 6,712,502
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6712502

Methods and systems for measurement and estimation of normalized contrast in infrared thermography
patent, October 2017

Koshti, Ajay M.
US Patent Document 9,787,913
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/9787913

Optical filter for flash lamps in pulsed thermal imaging
patent, May 2009

Sun, Jiangang
US Patent Document 7,538,938
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7538938

Methods and systems for measurement and estimation of normalized contrast in infrared thermography
patent, June 2015

Koshti, Ajay M.
US Patent Document 9,066,028
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/9066028

Thermal imaging method and apparatus for evaluating coatings
patent, April 2014

Ringermacher, Harry Israel; Howard, Donald Robert; Knight, Bryon Edward
US Patent Document 8,692,887
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8692887

Thermal imaging method and apparatus
patent, September 2008

Ouyang, Zhong; Smith, Kevin D.
US Patent Document 7,419,298
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7419298

Method for thermal tomography of thermal effusivity from pulsed thermal imaging
patent, April 2008

Sun, Jiangang
US Patent Document 7,365,330
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7365330

Method for analyzing multi-layer materials from one-sided pulsed thermal imaging
patent, August 2010

Sun, Jiangang
US Patent Document 7,769,201
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7769201

Lamp assembly for a thermographic nondestructive evaluation system
patent, November 2016

Howard, Donald Robert; Ringermacher, Harry Israel; Faidi, Waseem Ibrahim
US Patent Document 9,500,611
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/9500611

Method for measuring thickness by pulsed infrared thermal wave technology
patent, October 2016

Zeng, Zhi; Wang, Xun; Tao, Ning
US Patent Document 9,464,891
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/9464891

Automatic detection of coating flaws
patent, August 2011

Brinz, Thomas; Lewis, Jane; Tiefenbacher, Markus
US Patent Document 8,000,515
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8000515

Methods and systems for characterization of an anomaly using infrared flash thermography
patent, November 2013

Koshti, Ajay M.
US Patent Document 8,577,120
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8577120

Method and apparatus for determining structural damage depth, and method and apparatus for determining structural damage treatment
patent, May 2014

Akashi, Yukio; Hashimoto, Kazuaki; Hayashi, Shogo
US Patent Document 8,725,430
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8725430

Similar Records in DOE Patents and OSTI.GOV collections:

Method for implementing depth deconvolution algorithm for enhanced thermal tomography 3D imaging

Patent Sun, Jiangang

A computer-implemented method, apparatus, and computer program product implement enhanced thermal tomography three-dimensional (3D) thermal effusivity imaging. Experimental thermal imaging data is acquired. A response function is derived and a convolution formulation is constructed from the experimental thermal imaging data. A deconvolution solution procedure is implemented that includes constructing a matrix solution equation with a damping parameter, and solving the matrix solution equation with a selected number of iterations to construct a plurality of effusivity images. Using the novel depth deconvolution algorithm with experimental data acquired from a one-sided pulsed thermal-imaging system provides greater sensitivity for internal sample features substantiallymore » « less
Full Text Available
System and method for controlling depth of imaging in tissues using fluorescence microscopy under ultraviolet excitation following staining with fluorescing agents

Patent Levenson, Richard; Demos, Stavros

A method is disclosed for analyzing a thin tissue sample and adapted to be supported on a slide. The tissue sample may be placed on a slide and exposed to one or more different exogenous fluorophores excitable in a range of about 300 nm-200 nm, and having a useful emission band from about 350 nm-900 nm, and including one or more fluorescent dyes or fluorescently labeled molecular probes that accumulate in tissue or cellular components. The fluorophores may be excited with a first wavelength of UV light between about 200 nm-290 nm. An optical system collects emissions from the fluorophoresmore » « less
Full Text Available
System and method for controlling depth of imaging in tissues using fluorescence microscopy under ultraviolet excitation following staining with fluorescing agents

Patent Demos, Stavros; Levenson, Richard

The present disclosure relates to a method for analyzing tissue specimens. In one implementation the method involves obtaining a tissue sample and exposing the sample to one or more fluorophores as contrast agents to enhance contrast of subcellular compartments of the tissue sample. The tissue sample is illuminated by an ultraviolet (UV) light having a wavelength between about 200 nm to about 400 nm, with the wavelength being selected to result in penetration to only a specified depth below a surface of the tissue sample. Inter-image operations between images acquired under different imaging parameters allow for improvement of the imagemore » « less
Full Text Available
Method and system for determining depth distribution of radiation-emitting material located in a source medium and radiation detector system for use therein

Patent Benke, Roland R [Helotes, TX]; Kearfott, Kimberlee J [Ann Arbor, MI]; McGregor, Douglas S [Ann Arbor, MI]

A method, system and a radiation detector system for use therein are provided for determining the depth distribution of radiation-emitting material distributed in a source medium, such as a contaminated field, without the need to take samples, such as extensive soil samples, to determine the depth distribution. The system includes a portable detector assembly with an x-ray or gamma-ray detector having a detector axis for detecting the emitted radiation. The radiation may be naturally-emitted by the material, such as gamma-ray-emitting radionuclides, or emitted when the material is struck by other radiation. The assembly also includes a hollow collimator in whichmore » « less
Full Text Available
Method and system for determining depth distribution of radiation-emitting material located in a source medium and radiation detector system for use therein

Patent Benke, Roland R.; Kearfott, Kimberlee J.; McGregor, Douglas S.

A radiation detector system includes detectors having different properties (sensitivity, energy resolution) which are combined so that excellent spectral information may be obtained along with good determinations of the radiation field as a function of position.
Full Text Available

Similar Records

Title: Method for determining defect depth using thermal imaging

Abstract

Citation Formats

Automated real-time detection of defects during machining of ceramics patent, November 1997

Flash Method of Determining Thermal Diffusivity, Heat Capacity, and Thermal Conductivity journal, September 1961

Pulse phase infrared thermography journal, March 1996

Nondestructive testing: transient depth thermography patent, January 1998

Optical method and apparatus for detection of defects and microstructural changes in ceramics and ceramic coatings patent, September 2001

Early-Time Pulse-Echo Thermal Wave Imaging book, January 1996

Crack sizing patent, May 1989

Method and apparatus for thermographic nondestructive evaluation of an object patent, June 2009

Transient defect detection algorithm patent, September 2009

Method for producing a mirror substrate blank of titanium-doped silica glass for EUV lithography, and system for determining the position of defects in a blank patent, July 2018

Method and apparatus for detecting defects in a material in a liquid bath patent, March 2005

Material analysis patent, March 2006

Synchronized electronic shutter system and method for thermal nondestructive evaluation patent, March 2004

Methods and systems for measurement and estimation of normalized contrast in infrared thermography patent, October 2017

Optical filter for flash lamps in pulsed thermal imaging patent, May 2009

Methods and systems for measurement and estimation of normalized contrast in infrared thermography patent, June 2015

Thermal imaging method and apparatus for evaluating coatings patent, April 2014

Thermal imaging method and apparatus patent, September 2008

Method for thermal tomography of thermal effusivity from pulsed thermal imaging patent, April 2008

Method for analyzing multi-layer materials from one-sided pulsed thermal imaging patent, August 2010

Lamp assembly for a thermographic nondestructive evaluation system patent, November 2016

Method for measuring thickness by pulsed infrared thermal wave technology patent, October 2016

Automatic detection of coating flaws patent, August 2011

Methods and systems for characterization of an anomaly using infrared flash thermography patent, November 2013

Method and apparatus for determining structural damage depth, and method and apparatus for determining structural damage treatment patent, May 2014

Automated real-time detection of defects during machining of ceramics
patent, November 1997

Flash Method of Determining Thermal Diffusivity, Heat Capacity, and Thermal Conductivity
journal, September 1961

Pulse phase infrared thermography
journal, March 1996

Nondestructive testing: transient depth thermography
patent, January 1998

Optical method and apparatus for detection of defects and microstructural changes in ceramics and ceramic coatings
patent, September 2001

Early-Time Pulse-Echo Thermal Wave Imaging
book, January 1996

Crack sizing
patent, May 1989

Method and apparatus for thermographic nondestructive evaluation of an object
patent, June 2009

Transient defect detection algorithm
patent, September 2009

Method for producing a mirror substrate blank of titanium-doped silica glass for EUV lithography, and system for determining the position of defects in a blank
patent, July 2018

Method and apparatus for detecting defects in a material in a liquid bath
patent, March 2005

Material analysis
patent, March 2006

Synchronized electronic shutter system and method for thermal nondestructive evaluation
patent, March 2004

Methods and systems for measurement and estimation of normalized contrast in infrared thermography
patent, October 2017

Optical filter for flash lamps in pulsed thermal imaging
patent, May 2009

Methods and systems for measurement and estimation of normalized contrast in infrared thermography
patent, June 2015

Thermal imaging method and apparatus for evaluating coatings
patent, April 2014

Thermal imaging method and apparatus
patent, September 2008

Method for thermal tomography of thermal effusivity from pulsed thermal imaging
patent, April 2008

Method for analyzing multi-layer materials from one-sided pulsed thermal imaging
patent, August 2010

Lamp assembly for a thermographic nondestructive evaluation system
patent, November 2016

Method for measuring thickness by pulsed infrared thermal wave technology
patent, October 2016

Automatic detection of coating flaws
patent, August 2011

Methods and systems for characterization of an anomaly using infrared flash thermography
patent, November 2013

Method and apparatus for determining structural damage depth, and method and apparatus for determining structural damage treatment
patent, May 2014