Compressive transmission microscopy

Stevens, Andrew J.; Kovarik, Libor; Browning, Nigel D.; Liyu, Andrey V.; Yuan, Xin; Carin, Lawrence

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Title: Compressive transmission microscopy

Abstract

Transmission microscopy imaging systems include a mask and/or other modulator situated to encode image beams, e.g., by deflecting the image beam with respect to the mask and/or sensor. The beam is modulated/masked either before or after transmission through a sample to induce a spatially and/or temporally encoded signal by modifying any of the beam/image components including the phase/coherence, intensity, or position of the beam at the sensor. For example, a mask can be placed/translated through the beam so that several masked beams are received by a sensor during a single sensor integration time. Images associated with multiple mask displacements are then used to reconstruct a video sequence using a compressive sensing method. Another example of masked modulation involves a mechanism for phase-retrieval, whereby the beam is modulated by a set of different masks in the image plane and each masked image is recorded in the diffraction plane.

Inventors:: Stevens, Andrew J.; Kovarik, Libor; Browning, Nigel D.; Liyu, Andrey V.; Yuan, Xin; Carin, Lawrence

Issue Date:: 2019-03-05

Research Org.:: Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1525019

Patent Number(s):: 10224175

Application Number:: 15/075,015

Assignee:: Battelle Memorial Institute (Richland, WA)

Patent Classifications (CPCs):: G - PHYSICS G03 - PHOTOGRAPHY G03F - PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES

H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS

Show more

G - PHYSICS G03 - PHOTOGRAPHY G03F - PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES
G03F7/20 - Exposure
G03F7/30 - Imagewise removal using liquid means

H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J2237/0451 - with fixed aperture
H01J2237/0453 - multiple apertures
H01J2237/226 - Image reconstruction
H01J2237/24455 - Transmitted particle detectors
H01J2237/2802 - Transmission microscopes
H01J37/222 - {Image processing arrangements associated with the tube
H01J37/244 - Detectors
H01J37/26 - Electron or ion microscopes

Show less

DOE Contract Number:: AC05-76RL01830; FG02-03ER46057

Resource Type:: Patent

Resource Relation:: Patent File Date: 2016-03-18

Country of Publication:: United States

Language:: English

Subject:: 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; 42 ENGINEERING

Citation Formats


                    Stevens, Andrew J., Kovarik, Libor, Browning, Nigel D., Liyu, Andrey V., Yuan, Xin, and Carin, Lawrence. Compressive transmission microscopy.  United States: N. p., 2019. 
        Web.

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                    Stevens, Andrew J., Kovarik, Libor, Browning, Nigel D., Liyu, Andrey V., Yuan, Xin, & Carin, Lawrence. Compressive transmission microscopy.  United States.

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                    Stevens, Andrew J., Kovarik, Libor, Browning, Nigel D., Liyu, Andrey V., Yuan, Xin, and Carin, Lawrence. Tue .  
        "Compressive transmission microscopy".  United States.  https://www.osti.gov/servlets/purl/1525019.

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@article{osti_1525019,

  title        = {Compressive transmission microscopy},

  author       = {Stevens, Andrew J. and Kovarik, Libor and Browning, Nigel D. and Liyu, Andrey V. and Yuan, Xin and Carin, Lawrence},

  abstractNote = {Transmission microscopy imaging systems include a mask and/or other modulator situated to encode image beams, e.g., by deflecting the image beam with respect to the mask and/or sensor. The beam is modulated/masked either before or after transmission through a sample to induce a spatially and/or temporally encoded signal by modifying any of the beam/image components including the phase/coherence, intensity, or position of the beam at the sensor. For example, a mask can be placed/translated through the beam so that several masked beams are received by a sensor during a single sensor integration time. Images associated with multiple mask displacements are then used to reconstruct a video sequence using a compressive sensing method. Another example of masked modulation involves a mechanism for phase-retrieval, whereby the beam is modulated by a set of different masks in the image plane and each masked image is recorded in the diffraction plane.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {2019},

  month        = {3}

}

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