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Title: High accuracy absorbance spectrophotometers

Abstract

Spectrophotometers and spectroscopy processes are described that can provide for in-line calibration at every spectral acquisition as well as for continuous response correction during sample processing. The spectrophotometers include multiple polychromatic light sources that include characteristic emission spectra for use as an internal wavelength drift calibration system that is independent of environmental factors. Correction functions provided by the internal calibration process can be applied continuously and across an entire sample spectrum. The intensity response of each spectrometer in a spectrophotometer can also be monitored and continuously corrected for stray light, dark current, readout noise, etc.

Inventors:
; ; ; ;
Issue Date:
Research Org.:
Savannah River Site (SRS), Aiken, SC (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1497080
Patent Number(s):
10,151,633
Application Number:
15/428,639
Assignee:
Savannah River Nuclear Solutions, LLC (Aiken, SC) SRS
DOE Contract Number:  
AC09-08SR22470; AC09-96SR18500
Resource Type:
Patent
Resource Relation:
Patent File Date: 2019 Feb 09
Country of Publication:
United States
Language:
English

Citation Formats

O'Rourke, Patrick E., Lascola, Robert J., Immel, David, Kyser, III, Edward A., and Plummer, Jean R. High accuracy absorbance spectrophotometers. United States: N. p., 2018. Web.
O'Rourke, Patrick E., Lascola, Robert J., Immel, David, Kyser, III, Edward A., & Plummer, Jean R. High accuracy absorbance spectrophotometers. United States.
O'Rourke, Patrick E., Lascola, Robert J., Immel, David, Kyser, III, Edward A., and Plummer, Jean R. Tue . "High accuracy absorbance spectrophotometers". United States. https://www.osti.gov/servlets/purl/1497080.
@article{osti_1497080,
title = {High accuracy absorbance spectrophotometers},
author = {O'Rourke, Patrick E. and Lascola, Robert J. and Immel, David and Kyser, III, Edward A. and Plummer, Jean R.},
abstractNote = {Spectrophotometers and spectroscopy processes are described that can provide for in-line calibration at every spectral acquisition as well as for continuous response correction during sample processing. The spectrophotometers include multiple polychromatic light sources that include characteristic emission spectra for use as an internal wavelength drift calibration system that is independent of environmental factors. Correction functions provided by the internal calibration process can be applied continuously and across an entire sample spectrum. The intensity response of each spectrometer in a spectrophotometer can also be monitored and continuously corrected for stray light, dark current, readout noise, etc.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2018},
month = {12}
}

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