Defect screening method for electronic circuits and circuit components using power spectrum anaylysis

Tangyunyong, Paiboon; Beutler, Joshua; Cole, Edward I.; Loubriel, Guillermo M.

Title: Defect screening method for electronic circuits and circuit components using power spectrum anaylysis

Abstract

A method involving the non-destructive testing of a sample electrical or electronic device is provided. The method includes measuring a power spectrum of the device and performing a Principal Component Analysis on the power spectrum, thereby to obtain a set of principal components of the power spectrum. The method further includes selecting a subset consisting of some of the principal components, and comparing the subset to stored reference data that include representations in terms of principal components of one or more reference populations of devices. Based at least partly on the comparison, the sample device is classified relative to the reference populations.

Inventors:: Tangyunyong, Paiboon; Beutler, Joshua; Cole, Jr., Edward I.; Loubriel, Guillermo M.

Issue Date:: 2018-12-04

Research Org.:: Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1496616

Patent Number(s):: 10145894

Application Number:: 14/882,710

Assignee:: National Technology & Engineering Solutions of Sandia, LLC (Albuquerque, NM)

Patent Classifications (CPCs):: G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES

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G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES
G01R27/28 - Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks {using network analysers} Measuring transient response
G01R31/2851 - {Testing of integrated circuits [IC]
G01R31/31718 - {Logistic aspects, e.g. binning, selection, sorting of devices under test, tester/handler interaction networks, Test management software, e.g. software for test statistics or test evaluation, yield analysis
G01R31/31721 - {Power aspects, e.g. power supplies for test circuits, power saving during test
G01R23/16 - Spectrum analysis

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DOE Contract Number:: AC04-94AL85000

Resource Type:: Patent

Resource Relation:: Patent File Date: 2015 Oct 14

Country of Publication:: United States

Language:: English

Citation Formats


                    Tangyunyong, Paiboon, Beutler, Joshua, Cole, Jr., Edward I., and Loubriel, Guillermo M. Defect screening method for electronic circuits and circuit components using power spectrum anaylysis.  United States: N. p., 2018. 
        Web.

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                    Tangyunyong, Paiboon, Beutler, Joshua, Cole, Jr., Edward I., & Loubriel, Guillermo M. Defect screening method for electronic circuits and circuit components using power spectrum anaylysis.  United States.

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                    Tangyunyong, Paiboon, Beutler, Joshua, Cole, Jr., Edward I., and Loubriel, Guillermo M. Tue .  
        "Defect screening method for electronic circuits and circuit components using power spectrum anaylysis".  United States.  https://www.osti.gov/servlets/purl/1496616.

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@article{osti_1496616,

  title        = {Defect screening method for electronic circuits and circuit components using power spectrum anaylysis},

  author       = {Tangyunyong, Paiboon and Beutler, Joshua and Cole, Jr., Edward I. and Loubriel, Guillermo M.},

  abstractNote = {A method involving the non-destructive testing of a sample electrical or electronic device is provided. The method includes measuring a power spectrum of the device and performing a Principal Component Analysis on the power spectrum, thereby to obtain a set of principal components of the power spectrum. The method further includes selecting a subset consisting of some of the principal components, and comparing the subset to stored reference data that include representations in terms of principal components of one or more reference populations of devices. Based at least partly on the comparison, the sample device is classified relative to the reference populations.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {2018},

  month        = {12}

}

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Works referenced in this record:

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SoftVis '08 Proceedings of the 4th ACM symposium on Software visualization, p. 19-28
https://doi.org/10.1145/1409720.1409724

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Title: Defect screening method for electronic circuits and circuit components using power spectrum anaylysis

Abstract

Citation Formats

MosaiCode: Visualizing large scale software: A tool demonstration conference, September 2011

Algorithm explorer: visualizing algorithms in a 3D multimedia environment journal, March 2007

Exploiting UML dynamic object modeling for the visualization of C++ programs conference, January 2005

Visualization of exception handling constructs to support program understanding conference, January 2008

MosaiCode: Visualizing large scale software: A tool demonstration
conference, September 2011

Algorithm explorer: visualizing algorithms in a 3D multimedia environment
journal, March 2007

Exploiting UML dynamic object modeling for the visualization of C++ programs
conference, January 2005

Visualization of exception handling constructs to support program understanding
conference, January 2008