Defect screening method for electronic circuits and circuit components using power spectrum anaylysis
Abstract
A method involving the non-destructive testing of a sample electrical or electronic device is provided. The method includes measuring a power spectrum of the device and performing a Principal Component Analysis on the power spectrum, thereby to obtain a set of principal components of the power spectrum. The method further includes selecting a subset consisting of some of the principal components, and comparing the subset to stored reference data that include representations in terms of principal components of one or more reference populations of devices. Based at least partly on the comparison, the sample device is classified relative to the reference populations.
- Inventors:
- Issue Date:
- Research Org.:
- Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1496616
- Patent Number(s):
- 10145894
- Application Number:
- 14/882,710
- Assignee:
- National Technology & Engineering Solutions of Sandia, LLC (Albuquerque, NM)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES
- DOE Contract Number:
- AC04-94AL85000
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2015 Oct 14
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Tangyunyong, Paiboon, Beutler, Joshua, Cole, Jr., Edward I., and Loubriel, Guillermo M. Defect screening method for electronic circuits and circuit components using power spectrum anaylysis. United States: N. p., 2018.
Web.
Tangyunyong, Paiboon, Beutler, Joshua, Cole, Jr., Edward I., & Loubriel, Guillermo M. Defect screening method for electronic circuits and circuit components using power spectrum anaylysis. United States.
Tangyunyong, Paiboon, Beutler, Joshua, Cole, Jr., Edward I., and Loubriel, Guillermo M. Tue .
"Defect screening method for electronic circuits and circuit components using power spectrum anaylysis". United States. https://www.osti.gov/servlets/purl/1496616.
@article{osti_1496616,
title = {Defect screening method for electronic circuits and circuit components using power spectrum anaylysis},
author = {Tangyunyong, Paiboon and Beutler, Joshua and Cole, Jr., Edward I. and Loubriel, Guillermo M.},
abstractNote = {A method involving the non-destructive testing of a sample electrical or electronic device is provided. The method includes measuring a power spectrum of the device and performing a Principal Component Analysis on the power spectrum, thereby to obtain a set of principal components of the power spectrum. The method further includes selecting a subset consisting of some of the principal components, and comparing the subset to stored reference data that include representations in terms of principal components of one or more reference populations of devices. Based at least partly on the comparison, the sample device is classified relative to the reference populations.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2018},
month = {12}
}
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