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Title: Defect screening method for electronic circuits and circuit components using power spectrum anaylysis

Abstract

A method involving the non-destructive testing of a sample electrical or electronic device is provided. The method includes measuring a power spectrum of the device and performing a Principal Component Analysis on the power spectrum, thereby to obtain a set of principal components of the power spectrum. The method further includes selecting a subset consisting of some of the principal components, and comparing the subset to stored reference data that include representations in terms of principal components of one or more reference populations of devices. Based at least partly on the comparison, the sample device is classified relative to the reference populations.

Inventors:
; ; ;
Issue Date:
Research Org.:
Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1496616
Patent Number(s):
10,145,894
Application Number:
14/882,710
Assignee:
National Technology & Engineering Solutions of Sandia, LLC (Albuquerque, NM) SNL
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Patent
Resource Relation:
Patent File Date: 2015 Oct 14
Country of Publication:
United States
Language:
English

Citation Formats

Tangyunyong, Paiboon, Beutler, Joshua, Cole, Jr., Edward I., and Loubriel, Guillermo M. Defect screening method for electronic circuits and circuit components using power spectrum anaylysis. United States: N. p., 2018. Web.
Tangyunyong, Paiboon, Beutler, Joshua, Cole, Jr., Edward I., & Loubriel, Guillermo M. Defect screening method for electronic circuits and circuit components using power spectrum anaylysis. United States.
Tangyunyong, Paiboon, Beutler, Joshua, Cole, Jr., Edward I., and Loubriel, Guillermo M. Tue . "Defect screening method for electronic circuits and circuit components using power spectrum anaylysis". United States. https://www.osti.gov/servlets/purl/1496616.
@article{osti_1496616,
title = {Defect screening method for electronic circuits and circuit components using power spectrum anaylysis},
author = {Tangyunyong, Paiboon and Beutler, Joshua and Cole, Jr., Edward I. and Loubriel, Guillermo M.},
abstractNote = {A method involving the non-destructive testing of a sample electrical or electronic device is provided. The method includes measuring a power spectrum of the device and performing a Principal Component Analysis on the power spectrum, thereby to obtain a set of principal components of the power spectrum. The method further includes selecting a subset consisting of some of the principal components, and comparing the subset to stored reference data that include representations in terms of principal components of one or more reference populations of devices. Based at least partly on the comparison, the sample device is classified relative to the reference populations.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2018},
month = {12}
}

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