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Title: Linear fitting of multi-threshold counting data

Abstract

The present disclosure provides a system and method for efficiently mining multi-threshold measurements acquired using photon counting pixel-array detectors for spectral imaging and diffraction analyses. Images of X-ray intensity as a function of X-ray energy were recorded on a 6 megapixel X-ray photon counting array detector through linear fitting of the measured counts recorded as a function of counting threshold. An analytical model is disclosed for describing the probability density of detected voltage, utilizing fractional photon counting to account for edge/corner effects from voltage plumes that spread across multiple pixels. Three-parameter fits to the model were independently performed for each pixel in the array for X-ray scattering images acquired for 13.5 keV and 15.0 keV X-ray energies. From the established pixel responses, multi-threshold composite images produced from the sum of 13.5 keV and 15.0 keV data can be analytically separated to recover the monochromatic images through simple linear fitting.

Inventors:
; ;
Issue Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1496604
Patent Number(s):
10,145,968
Application Number:
14/708,335
Assignee:
Purdue Research Foundation, West Lafayette, IN
DOE Contract Number:  
AC02-06CH11357
Resource Type:
Patent
Resource Relation:
Patent File Date: 2015 May 11
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Simpson, Garth Jason, Muir, Ryan Douglas, and Pogranichniy, Nicholas Roman. Linear fitting of multi-threshold counting data. United States: N. p., 2018. Web.
Simpson, Garth Jason, Muir, Ryan Douglas, & Pogranichniy, Nicholas Roman. Linear fitting of multi-threshold counting data. United States.
Simpson, Garth Jason, Muir, Ryan Douglas, and Pogranichniy, Nicholas Roman. Tue . "Linear fitting of multi-threshold counting data". United States. https://www.osti.gov/servlets/purl/1496604.
@article{osti_1496604,
title = {Linear fitting of multi-threshold counting data},
author = {Simpson, Garth Jason and Muir, Ryan Douglas and Pogranichniy, Nicholas Roman},
abstractNote = {The present disclosure provides a system and method for efficiently mining multi-threshold measurements acquired using photon counting pixel-array detectors for spectral imaging and diffraction analyses. Images of X-ray intensity as a function of X-ray energy were recorded on a 6 megapixel X-ray photon counting array detector through linear fitting of the measured counts recorded as a function of counting threshold. An analytical model is disclosed for describing the probability density of detected voltage, utilizing fractional photon counting to account for edge/corner effects from voltage plumes that spread across multiple pixels. Three-parameter fits to the model were independently performed for each pixel in the array for X-ray scattering images acquired for 13.5 keV and 15.0 keV X-ray energies. From the established pixel responses, multi-threshold composite images produced from the sum of 13.5 keV and 15.0 keV data can be analytically separated to recover the monochromatic images through simple linear fitting.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2018},
month = {12}
}

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