skip to main content
DOE Patents title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Linear fitting of multi-threshold counting data

Abstract

The present disclosure provides a system and method for efficiently mining multi-threshold measurements acquired using photon counting pixel-array detectors for spectral imaging and diffraction analyses. Images of X-ray intensity as a function of X-ray energy were recorded on a 6 megapixel X-ray photon counting array detector through linear fitting of the measured counts recorded as a function of counting threshold. An analytical model is disclosed for describing the probability density of detected voltage, utilizing fractional photon counting to account for edge/corner effects from voltage plumes that spread across multiple pixels. Three-parameter fits to the model were independently performed for each pixel in the array for X-ray scattering images acquired for 13.5 keV and 15.0 keV X-ray energies. From the established pixel responses, multi-threshold composite images produced from the sum of 13.5 keV and 15.0 keV data can be analytically separated to recover the monochromatic images through simple linear fitting.

Inventors:
; ;
Issue Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1496604
Patent Number(s):
10,145,968
Application Number:
14/708,335
Assignee:
Purdue Research Foundation, West Lafayette, IN ANL
DOE Contract Number:  
AC02-06CH11357
Resource Type:
Patent
Resource Relation:
Patent File Date: 2015 May 11
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Simpson, Garth Jason, Muir, Ryan Douglas, and Pogranichniy, Nicholas Roman. Linear fitting of multi-threshold counting data. United States: N. p., 2018. Web.
Simpson, Garth Jason, Muir, Ryan Douglas, & Pogranichniy, Nicholas Roman. Linear fitting of multi-threshold counting data. United States.
Simpson, Garth Jason, Muir, Ryan Douglas, and Pogranichniy, Nicholas Roman. Tue . "Linear fitting of multi-threshold counting data". United States. https://www.osti.gov/servlets/purl/1496604.
@article{osti_1496604,
title = {Linear fitting of multi-threshold counting data},
author = {Simpson, Garth Jason and Muir, Ryan Douglas and Pogranichniy, Nicholas Roman},
abstractNote = {The present disclosure provides a system and method for efficiently mining multi-threshold measurements acquired using photon counting pixel-array detectors for spectral imaging and diffraction analyses. Images of X-ray intensity as a function of X-ray energy were recorded on a 6 megapixel X-ray photon counting array detector through linear fitting of the measured counts recorded as a function of counting threshold. An analytical model is disclosed for describing the probability density of detected voltage, utilizing fractional photon counting to account for edge/corner effects from voltage plumes that spread across multiple pixels. Three-parameter fits to the model were independently performed for each pixel in the array for X-ray scattering images acquired for 13.5 keV and 15.0 keV X-ray energies. From the established pixel responses, multi-threshold composite images produced from the sum of 13.5 keV and 15.0 keV data can be analytically separated to recover the monochromatic images through simple linear fitting.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2018},
month = {12}
}

Patent:

Save / Share:

Works referenced in this record:

Optimal material discrimination using spectral x-ray imaging
journal, August 2011


Data processing and image reconstruction methods for pixel detectors
journal, June 2007

  • Jakubek, Jan
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 576, Issue 1, p. 223-234
  • DOI: 10.1016/j.nima.2007.01.157

Energy resolution of a photon-counting silicon strip detector
journal, January 2010

  • Fredenberg, Erik; Lundqvist, Mats; Cederström, Björn
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 613, Issue 1, p. 156-162
  • DOI: 10.1016/j.nima.2009.10.152

Bio-medical X-ray imaging with spectroscopic pixel detectors
journal, June 2008

  • Butler, A. P. H.; Anderson, N. G.; Tipples, R.
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 591, Issue 1, p. 141-146
  • DOI: 10.1016/j.nima.2008.03.039

Improved count rate corrections for highest data quality with PILATUS detectors
journal, March 2012

  • Trueb, P.; Sobott, B. A.; Schnyder, R.
  • Journal of Synchrotron Radiation, Vol. 19, Issue 3, p. 347-351
  • DOI: 10.1107/S0909049512003950

How can journal impact factors be normalized across fields of science? An assessment in terms of percentile ranks and fractional counts
journal, December 2012

  • Leydesdorff, Loet; Zhou, Ping; Bornmann, Lutz
  • Journal of the American Society for Information Science and Technology, Vol. 64, Issue 1, p. 96-107
  • DOI: 10.1002/asi.22765

Charge sharing in silicon pixel detectors
journal, July 2002

  • Mathieson, K.; Passmore, M. S.; Seller, P.
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 487, Issue 1-2, p. 113-122
  • DOI: 10.1016/S0168-9002(02)00954-3