TEM phase contrast imaging with image plane phase grating
Abstract
Transmission microscopy imaging systems include a mask and/or other modulator situated to encode image beams, e.g., by deflecting the image beam with respect to the mask and/or sensor. The beam is modulated/masked either before or after transmission through a sample to induce a spatially and/or temporally encoded signal by modifying any of the beam/image components including the phase/coherence, intensity, or position of the beam at the sensor. For example, a mask can be placed/translated through the beam so that several masked beams are received by a sensor during a single sensor integration time. Images associated with multiple mask displacements are then used to reconstruct a video sequence using a compressive sensing method. Another example of masked modulation involves a mechanism for phase-retrieval, whereby the beam is modulated by a set of different masks in the image plane and each masked image is recorded in the diffraction plane.
- Inventors:
- Issue Date:
- Research Org.:
- Battelle Memorial Institute, Richland, WA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1493307
- Patent Number(s):
- 10170274
- Application Number:
- 15/286,502
- Assignee:
- Battelle Memorial Institute (Richland, WA)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01T - MEASUREMENT OF NUCLEAR OR X-RADIATION
G - PHYSICS G03 - PHOTOGRAPHY G03F - PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES
- DOE Contract Number:
- FG02-03ER46057
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2016 Oct 05
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION
Citation Formats
Stevens, Andrew J., Kovarik, Libor, and Browning, Nigel D. TEM phase contrast imaging with image plane phase grating. United States: N. p., 2019.
Web.
Stevens, Andrew J., Kovarik, Libor, & Browning, Nigel D. TEM phase contrast imaging with image plane phase grating. United States.
Stevens, Andrew J., Kovarik, Libor, and Browning, Nigel D. Tue .
"TEM phase contrast imaging with image plane phase grating". United States. https://www.osti.gov/servlets/purl/1493307.
@article{osti_1493307,
title = {TEM phase contrast imaging with image plane phase grating},
author = {Stevens, Andrew J. and Kovarik, Libor and Browning, Nigel D.},
abstractNote = {Transmission microscopy imaging systems include a mask and/or other modulator situated to encode image beams, e.g., by deflecting the image beam with respect to the mask and/or sensor. The beam is modulated/masked either before or after transmission through a sample to induce a spatially and/or temporally encoded signal by modifying any of the beam/image components including the phase/coherence, intensity, or position of the beam at the sensor. For example, a mask can be placed/translated through the beam so that several masked beams are received by a sensor during a single sensor integration time. Images associated with multiple mask displacements are then used to reconstruct a video sequence using a compressive sensing method. Another example of masked modulation involves a mechanism for phase-retrieval, whereby the beam is modulated by a set of different masks in the image plane and each masked image is recorded in the diffraction plane.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2019},
month = {1}
}
Works referenced in this record:
Secondary electron emission due to primary and backscattered electrons
journal, September 1972
- Kanaya, K.; Kawakatsu, H.
- Journal of Physics D: Applied Physics, Vol. 5, Issue 9
Generalized Alternating Projection for Weighted-$\ell_{2,1}$ Minimization with Applications to Model-Based Compressive Sensing
journal, January 2014
- Liao, Xuejun; Li, Hui; Carin, Lawrence
- SIAM Journal on Imaging Sciences, Vol. 7, Issue 2, p. 797-823
Phase plate and method of fabricating same
patent, September 2014
- Iijima, Hirofumi; Konyuba, Yuji
- US Patent Document 8,829,436
Methods and apparatus to capture compressed images
patent, February 2012
- Dekel, Shai
- US Patent Document 8,125,549
Compressed sensing
journal, April 2006
- Donoho, D. L.
- IEEE Transactions on Information Theory, Vol. 52, Issue 4
Scanning Transmission Electron Microscopy for Polymer Sequencing
patent-application, May 2013
- Own, Christopher; Andregg, William; Andregg, Michael
- US Patent Application 13/303121; 20130126729
Phase-Shifting Mask of Method of Fabricating Same
patent-application, October 2008
- Lin, Cheng-Ming; Hsu, Boming
- US Patent Application 11/734163; 20080254376
Charged Particle Microscope With Special Aperture Plate
patent-application, April 2016
- Potocek, Pavel; van Laarhoven, Franciscus; Boughorbel, Faysal
- US Patent Application 14/884520; 20160111247
Compressive Sensing on Manifolds Using a Nonparametric Mixture of Factor Analyzers: Algorithm and Performance Bounds
journal, December 2010
- Chen, Minhua; Silva, Jorge; Paisley, John
- IEEE Transactions on Signal Processing, Vol. 58, Issue 12, p. 6140-6155
Calibration camera with spectral depth
patent, May 2012
- Meijer, Eduard Johannes; De Graaf, Jan; Verschuuren, Marcus Antonius
- US Patent Document 8,190,007
Coded aperture compressive temporal imaging
journal, January 2013
- Llull, Patrick; Liao, Xuejun; Yuan, Xin
- Optics Express, Vol. 21, Issue 9, p. 10526-10545
Observation apparatus and observation method using an electron beam
patent-application, January 2003
- Koguchi, Masanari; Nakamura, Kuniyasu; Umemura, Kaoru
- US Patent Application 10/183157; 20030006373
Testing method for semiconductor device, testing apparatus therefor, and semiconductor device suitable for the test
patent, December 2008
- Nishiumi, Toshiya; Ando, Koki
- US Patent Document 7,465,923
Scanning electron microscope
patent, May 2015
- Ogashiwa, Takeshi; Sato, Mitsugu; Konno, Mitsuru
- US Patent Document 9,040,911
Penetration and energy-loss theory of electrons in solid targets
journal, January 1972
- Kanaya, K.; Okayama, S.
- Journal of Physics D: Applied Physics, Vol. 5, Issue 1
Markov Chain Sampling Methods for Dirichlet Process Mixture Models
journal, June 2000
- Neal, Radford M.
- Journal of Computational and Graphical Statistics, Vol. 9, Issue 2
Einstein's Proposal of the Photon Concept—a Translation of the Annalen der Physik Paper of 1905
journal, May 1965
- Arons, A. B.; Peppard, M. B.
- American Journal of Physics, Vol. 33, Issue 5, p. 367-374
Microfabricated High-Bandpass Foucault Aperture For Electron Microscopy
patent-application, April 2013
- Glaeser, Robert; Cambie, Rossana; Jin, Jian
- US Patent Application 13/708521; 20130099115
Low-Cost Compressive Sensing for Color Video and Depth
conference, September 2014
- Yuan, Xin; Llull, Patrick; Liao, Xuejun
- 2014 IEEE Conference on Computer Vision and Pattern Recognition, p. 3318-3325
Method and Apparatus for Compressive Imaging Device
patent-application, October 2006
- Baraniuk, Richard G.; Baron, Dror Z.; Duarte, Marco F.
- US Patent Application 11/379688; 20060239336
System and method for compressive scanning electron microscopy
patent, January 2015
- Reed, Bryan W.
- US Patent Document 8,933,401
Sparse Sampling And Reconstruction For Electron And Scanning Probe Microscope Imaging
patent-application, March 2015
- Anderson, Hyrum; Helms, Jovana; Wheeler, Jason
- US Patent Application 14/482754; 20150069233
Electron tomography based on a total variation minimization reconstruction technique
journal, February 2012
- Goris, B.; Van den Broek, W.; Batenburg, K. J.
- Ultramicroscopy, Vol. 113
Mathmatical Image Assembly in a Scanning-Type Microscope
patent-application, December 2015
- Potocek, Pavel; Kooijman, Cornelis Sander; Slingerland, Hendrik Nicolaas
- US Patent Application 14/743780; 20150371815
Compressive sensor array system and method
patent, November 2010
- Dudgeon, Dan E.; Laska, Jason N.; Myers, Cory S.
- US Patent Document 7,834,795
Face recognition using Laplacianfaces
journal, March 2005
- Xiaofei He,
- IEEE Transactions on Pattern Analysis and Machine Intelligence, Vol. 27, Issue 3
Apparatuses And Methods For Three-Dimensional Imaging Of An Object
patent-application, October 2016
- Shechtman, Yoav; Moerner, William
- US Patent Application 15/096122; 20160301915
Analysis of Ni nanoparticle gas phase sintering
journal, January 2007
- Tsyganov, Sergej; Kästner, Jochen; Rellinghaus, Bernd
- Physical Review B, Vol. 75, Issue 4, Article No. 045421
Compressive Transmission Microscopy
patent-application, September 2016
- Stevens, Andrew J.; Kovarik, Libor; Browning, Nigel D.
- US Patent Application 15/075015; 20160276129
Photoluminescence from colour centres generated in lithium fluoride thin films and crystals by extreme-ultraviolet irradiation
journal, October 2010
- Nichelatti, E.; Almaviva, S.; Bonfigli, F.
- Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Vol. 268, Issue 19, p. 3035-3039
Comparison of optimal performance at 300keV of three direct electron detectors for use in low dose electron microscopy
journal, December 2014
- McMullan, G.; Faruqi, A. R.; Clare, D.
- Ultramicroscopy, Vol. 147
Scanning interference electron microscope
patent, August 2008
- Matsumoto, Takao; Koguchi, Masanari
- US Patent Document 7,417,227
Methods for Achieving High Resolution Microfluoroscopy
patent-application, October 2005
- Hirsch, Gregory
- US Patent Application 11/095085; 20050220266
Method of using a phase plate in a transmission electron microscope
patent, September 2015
- Buijsse, Bart; Danev, Radostin Stoyanov
- US Patent Document 9,129,774
Quantitative Measurement of the Surface Self-Diffusion on Au Nanoparticles by Aberration-Corrected Transmission Electron Microscopy
journal, February 2012
- Surrey, A.; Pohl, D.; Schultz, L.
- Nano Letters, Vol. 12, Issue 12, p. 6071-6077
Super-resolution in optical data storage
journal, December 1999
- Brand, Ulrich; Hester, Gerard; Grochmalicki, Jan
- Journal of Optics A: Pure and Applied Optics, Vol. 1, Issue S, p. 794-800
Adaptive temporal compressive sensing for video
conference, February 2013
- Yuan, Xin; Yang, Jianbo; Llull, Patrick
- 2013 IEEE International Conference on Image Processing, p. 14-18
Gaussian mixture model for video compressive sensing
conference, September 2013
- Yang, Jianbo; Yuan, Xin; Liao, Xuejun
- 2013 20th IEEE International Conference on Image Processing (ICIP), 2013 IEEE International Conference on Image Processing
High-resolution amplitude contrast imaging
patent, August 2016
- Van Dyck, Dirk; Lucken, Uwe; Stark, Holger
- US Patent Document 9,412,558
Test Method of Mask for Electron-Beam Exposure and Method of Electron-Beam Exposure
patent-application, December 2001
- Yamashita, Hiroshi
- US Patent Application 09/870219; 20010054697
Ăśber einen die Erzeugung und Verwandlung des Lichtes betreffenden heuristischen Gesichtspunkt [AdP 17, 132 (1905)]
journal, February 2005
- Einstein, A.
- Annalen der Physik, Vol. 14, Issue S1
Fast electron microscopy via compressive sensing
patent, December 2014
- Larson, Kurt W.; Anderson, Hyrum; Wheeler, Jason W.
- US Patent Document 8,907,280
Scanning Electron Microscope And Scanning Transmission Electron Microscope
patent-application, May 2014
- Inada, Hiromi; Nakamura, Kuniyasu
- US Patent Application 14/232526; 20140138542
Imaging a Sample in a TEM Equipped with a Phase Plate
patent-application, March 2014
- Buijsse, Bart; Moers, Marco Hugo Petrus; Danev, Radostin Stoyanov
- US Patent Application 14/015658; 20140061463
Scanning interference electron microscopy
patent, March 1994
- Ichikawa, Masakazu; Yajima, Yusuke; Takeshita, Masatoshi
- US Patent Document 5,298,747
Aberration-Correcting Dark-Field Electron Microscopy
patent-application, August 2011
- Own, Christopher Su-Yan; Dabrowski, Paul John
- US Patent Application 13/024961; 20110192976
Electron lithography using a photocathode
patent, March 1995
- Brandes, George R.; Platzman, Philip Moss
- US Patent Document 5,395,738
Ultra high-density optical data storage: information retrieval an order of magnitude beyond the Rayleigh limit
journal, December 2002
- Kraemer, Darren; Siwick, Bradley J.; Miller, R. J. Dwayne
- Chemical Physics, Vol. 285, Issue 1, p. 73-83
Differential phase contrast scanning transmission electron microscope
patent, April 1991
- Tsuno, Katsushige; Inoue, Masao
- US Patent Document 5,004,918
Device manufacture involving lithographic processing
patent, November 1993
- Berger, Steven; Gibson, John M.
- US Patent Document 5,258,246
Phase Contrast Imaging Using Patterned Illumination/Detector and Phase Mask
patent-application, February 2015
- Holzner, Christian; Feser, Michael
- US Patent Application 14/464954; 20150055745
Projecting type charged particle microscope and projecting type substrate inspection system
patent, October 2001
- Todokoro, Hideo; Ishitani, Tohru; Usami, Yasutsugu
- US Patent Document 6,310,341
Detector system for use with transmission electron microscope spectroscopy
patent, December 2012
- Luecken, Uwe; Schuurmans, Frank Jeroen Pieter; Kooijman, Cornelis Sander
- US Patent Document 8,334,512
On-Chip Thin Film Zernike Phase Plate and Applications Thereof
patent-application, June 2014
- Shiue, Yunn-Shin; Kuo, Pai-Chia; Chen, Chih-Ting
- US Patent Application 14/107162; 20140166880
Element mapping unit, scanning transmission electron microscope, and element mapping method
patent, April 2011
- Kaji, Kazutoshi; Ueda, Kazuhiro; Kimoto, Koji
- US Patent Document 7,928,376
Transmission Electron Microscope Provided with Electronic Spectroscope
patent-application, August 2008
- Terada, Shohei; Taniguchi, Yoshifumi
- US Patent Application 12/024357; 20080203296
In Situ Observation of the Electrochemical Lithiation of a Single SnO2 Nanowire Electrode
journal, December 2010
- Huang, J. Y.; Zhong, L.; Wang, C. M.
- Science, Vol. 330, Issue 6010, p. 1515-1520
Towards a Mathematical Theory of Super-resolution
journal, April 2013
- Candès, Emmanuel J.; Fernandez-Granda, Carlos
- Communications on Pure and Applied Mathematics, Vol. 67, Issue 6
Method for Compressive Sensing, Reconstruction, and Estimation of Ultra-Wideband Channels
patent-application, May 2014
- Muqaibel, Ali Hussein; Alkhodary, Mohammad Tamim
- US Patent Application 13/681340; 20140140375
Scanning Transmission Electron Microscope and Scanning Transmission Electron Microscopy
patent-application, October 2007
- Tsuneta, Ruriko; Koguchi, Masanari; Hashimoto, Takahito
- US Patent Application 11/806120; 20070228277
The restricted isometry property and its implications for compressed sensing
journal, May 2008
- Candès, Emmanuel J.
- Comptes Rendus Mathematique, Vol. 346, Issue 9-10, p. 589-592
Mathematical image assembly in a scanning-type microscope
patent, April 2017
- Poto{hacek over (c.)}ek, Pavel; Kooijman, Cornelis Sander; Slingerland, Hendrik Nicolaas
- US Patent Document 9,620,330
Probabilistic Principal Component Analysis
journal, August 1999
- Tipping, Michael E.; Bishop, Christopher M.
- Journal of the Royal Statistical Society: Series B (Statistical Methodology), Vol. 61, Issue 3, p. 611-622
Incoherent transmission electron microscopy
patent, June 2014
- Own, Christopher Su-Yan; Bleloch, Andrew; Andregg, William
- US Patent Document 8,748,818
Emergence of simple-cell receptive field properties by learning a sparse code for natural images
journal, June 1996
- Olshausen, Bruno A.; Field, David J.
- Nature, Vol. 381, Issue 6583
The potential for Bayesian compressive sensing to significantly reduce electron dose in high-resolution STEM images
journal, October 2013
- Stevens, Andrew; Yang, Hao; Carin, Lawrence
- Microscopy, Vol. 63, Issue 1
In Situ Transmission Electron Microscopy
journal, February 2008
- Ferreira, P. J.; Mitsuishi, K.; Stach, E. A.
- MRS Bulletin, Vol. 33, Issue 02, p. 83-90
TEM with Aberration Corrector and Phase Plate
patent-application, August 2009
- Tiemeijer, Peter Christian; De Jong, Alan Frank
- US Patent Application 12/370542; 20090200464
System for Improved Compressive Tomography and Method Therefor
patent-application, December 2015
- Brady, David Jones; Carin, Lawrence L.; Kaganovsky, Yan
- US Patent Application 14/764435; 20150351705
Detector system for transmission electron microscope
patent, December 2012
- Luecken, Uwe; Schoenmakers, Remco; Schuurmans, Frank Jeroen Pieter
- US Patent Document 8,338,782
Compressed Sensing and Electron Microscopy
book, January 2012
- Binev, Peter; Dahmen, Wolfgang; DeVore, Ronald
- Modeling Nanoscale Imaging in Electron Microscopy
Method and Apparatus for Observing, Detecting and Correcting Periodic Structures in a Moving Web
patent, January 1972
- Langenbeck, Peter H.
- US Patent Document 3633037
Methods and Devices for High Throughput Crystal Structure Analysis by Electron Diffraction
patent-application, September 2011
- Nicolopoulos, Stavros; Bultreys, Daniel; Rauch, Edgard
- US Patent Application 13/127455; 20110220796
Towards 0.1 nm resolution with the first spherically corrected transmission electron microscope
journal, January 1998
- Haider, M.; Rose, H.; Uhlemann, S.
- Journal of Electron Microscopy, Vol. 47, Issue 5, p. 395-405
Method of forming a semiconductor device utilizing lithographic mask and mask therefor
patent, September 2000
- Dauksher, William J.; Mangat, Pawitter; Huston, Roy Allen
- US Patent Document 6,124,063
Mixtures of Probabilistic Principal Component Analyzers
journal, February 1999
- Tipping, Michael E.; Bishop, Christopher M.
- Neural Computation, Vol. 11, Issue 2, p. 443-482
Temporal Compressive Sensing Systems
patent-application, May 2017
- Reed, Bryan
- US Patent Application 15/243235; 20170146787
Controlled Growth of Nanoparticles from Solution with In Situ Liquid Transmission Electron Microscopy
journal, July 2011
- Evans, James E.; Jungjohann, Katherine L.; Browning, Nigel D.
- Nano Letters, Vol. 11, Issue 7
A New TwIST: Two-Step Iterative Shrinkage/Thresholding Algorithms for Image Restoration
journal, December 2007
- Bioucas-Dias, J. M.; Figueiredo, M. A. T.
- IEEE Transactions on Image Processing, Vol. 16, Issue 12
Charging of a hole-free thin film phase plate
patent, July 2014
- Malac, Marek; Beleggia, Marco; Kawasaki, Masahiro
- US Patent Document 8,785,850
Compressive Sensing [Lecture Notes]
journal, August 2007
- Baraniuk, Richard G.
- IEEE Signal Processing Magazine, Vol. 24, Issue 4, p. 118-121
Nonparametric Bayesian Dictionary Learning for Analysis of Noisy and Incomplete Images
journal, January 2012
- Zhou, Mingyuan; Chen, Haojun; Paisley, John
- IEEE Transactions on Image Processing, Vol. 21, Issue 1, p. 130-144
Phase Plate And Electron Microscope
patent-application, August 2014
- Tamaki, Hirokazu; Takahashi, Yoshio; Kasai, Hiroto
- US Patent Application 14/129261; 20140224988
Electron beam drawing mask blank, electron beam drawing mask, and method of manufacturing the same
patent, November 2004
- Amemiya, Isao
- US Patent Document 6,812,473
TEM Phase Contrast Imaging With Image Plane Phase Grating
patent-application, January 2017
- Stevens, Andrew; Kovarik, Libor; Browning, Nigel
- US Patent Application 15/286502; 20170025247
A tutorial on Bayesian nonparametric models
journal, February 2012
- Gershman, Samuel J.; Blei, David M.
- Journal of Mathematical Psychology, Vol. 56, Issue 1, p. 1-12
A Simple Proof of the Restricted Isometry Property for Random Matrices
journal, January 2008
- Baraniuk, Richard; Davenport, Mark; DeVore, Ronald
- Constructive Approximation, Vol. 28, Issue 3, p. 253-263
Metrology Method and Inspection Apparatus, Lithographic System and Device Manufacturing Method
patent-application, May 2012
- Smilde, Hendrik; Bleeker, Arno; Warnaar, Patrick
- US Patent Application 13/294057; 20120123581
Lens system for phase plate for transmission electron microscope and transmission electron microscope
patent-application, October 2002
- Hosokawa, Fumio; Nagayama, Kuniaki; Danev, Radostin
- US Patent Application 10/071881; 20020148962
Apparatus and method for acquiring light field data using variable modulator
patent, February 2014
- Kang, Joo-young; Ok, Hyun-wook; Lee, Seong-deok
- US Patent Document 8,648,955
Robust uncertainty principles: exact signal reconstruction from highly incomplete frequency information
journal, February 2006
- Candes, E.J.; Romberg, J.; Tao, T.
- IEEE Transactions on Information Theory, Vol. 52, Issue 2, p. 489-509
Advances in the environmental transmission electron microscope (ETEM) for nanoscale in situ studies of gas–solid interactions
journal, January 2014
- Jinschek, J. R.
- Chemical Communications, Vol. 50, Issue 21, p. 2696-2706
ChemInform Abstract: In situ Observation of the Electrochemical Lithiation of a Single SnO2 Nanowire Electrode.
journal, February 2011
- Huang, Jian Yu; et al., et al.
- ChemInform, Vol. 42, Issue 10
Ponderomotive phase plate for transmission electron microscopes
patent, July 2012
- Reed, Bryan W.
- US Patent Document 8,217,352
Method of producing a stencil mask
patent, March 1995
- Hashimoto, Kazuhiko; Endo, Masayuki; Sasago, Masaru
- US Patent Document 5,401,932
Transmission Electron Microscope
patent-application, September 2011
- Benner, Gerd
- US Patent Application 13/036757; 20110210249
Method, Device and System for Measuring Nanoscale Deformations
patent-application, October 2010
- Hytch, Martin; Houdellier, Florent; Hue, Florian
- US Patent Application 12/680078; 20100252735
Visualizing Gas Molecules Interacting with Supported Nanoparticulate Catalysts at Reaction Conditions
journal, January 2012
- Yoshida, H.; Kuwauchi, Y.; Jinschek, J. R.
- Science, Vol. 335, Issue 6066
Color Centers in Alkali Halide Crystals
journal, July 1946
- Seitz, Frederick
- Reviews of Modern Physics, Vol. 18, Issue 3
Compressive sampling for multimedia coding
patent, October 2013
- Tian, Jun; Cao, Dong; Yu, Hong Heather
- US Patent Document 8,553,994
Detector System for Use with Transmission Electron Microscope Spectroscopy
patent-application, March 2012
- Luecken, Uwe; Kooijman, Cornelis; Schuurmans, Frank
- US Patent Application 13/217013; 20120049060
Apparatus and method of pattern detection based on a scanning transmission electron microscope
patent, September 1991
- Koshishiba, Hiroya; Fushimi, Satoru; Nakagawa, Yasuo
- US Patent Document 5,051,585
Dictionary Learning for Noisy and Incomplete Hyperspectral Images
journal, January 2012
- Xing, Zhengming; Zhou, Mingyuan; Castrodad, Alexey
- SIAM Journal on Imaging Sciences, Vol. 5, Issue 1, p. 33-56
Method for obtaining a scanning transmission image of a sample in a particle-optical apparatus
patent, November 2010
- Yakushevska, Alevtyna; Sourty, Erwan; Luecken, Uwe
- US Patent Document 7,825,378
High-speed multiframe dynamic transmission electron microscope image acquisition system with arbitrary timing
patent, October 2015
- Reed, Bryan W.; DeHope, William J.; Huete, Glenn
- US Patent Document 9,165,743
Phase Plate
patent-application, August 2013
- Blackburn, Arthur
- US Patent Application 13/726260; 20130193322
Reduced-dose and high-speed acquisition strategies for multi-dimensional electron microscopy
journal, May 2015
- Saghi, Zineb; Benning, Martin; Leary, Rowan
- Advanced Structural and Chemical Imaging, Vol. 1, Issue 1
$rm K$-SVD: An Algorithm for Designing Overcomplete Dictionaries for Sparse Representation
journal, November 2006
- Aharon, M.; Elad, M.; Bruckstein, A.
- IEEE Transactions on Signal Processing, Vol. 54, Issue 11
A (S)TEM Gas Cell Holder with Localized Laser Heating for In Situ Experiments
journal, March 2013
- Mehraeen, Shareghe; McKeown, Joseph T.; Deshmukh, Pushkarraj V.
- Microscopy and Microanalysis, Vol. 19, Issue 2
Phase contrast electron microscope
patent-application, December 2007
- Benner, Gerd; Matijevic, Marko
- US Patent Application 11/717201; 20070284528
Method Of Examining A Sample In A Charged-Particle Microscope
patent-application, August 2015
- Lazic, Ivan; Bosch, Eric; Boughorbel, Faysal
- US Patent Application 14/629387; 20150243474
In situ Transmission Electron Microscopy of catalyst sintering
journal, December 2013
- DeLaRiva, Andrew T.; Hansen, Thomas W.; Challa, Sivakumar R.
- Journal of Catalysis, Vol. 308, p. 291-305
Image resolution and sensitivity in an environmental transmission electron microscope
journal, November 2012
- Jinschek, J. R.; Helveg, S.
- Micron, Vol. 43, Issue 11
Method and apparatus for compressive domain filtering and interference cancellation
patent, May 2014
- Davenport, Mark A.; Boufounos, Petros; Baraniuk, Richard G.
- US Patent Document 8,725,784
Beam Sensing
patent-application, July 2011
- Kyele, Nicholas Roberts; Van Silfhout, Roelof Gozewijn
- US Patent Application 13/003072; 20110168903